Search Results - "Mahajan, Bikram Kishore"

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  1. 1

    Modeling of Spin Transport in Hybrid Magnetic Tunnel Junctions for Magnetic Recording Applications by Deb, Debajit, Mahajan, Bikram Kishore

    Published in Crystals (Basel) (01-10-2022)
    “…We have demonstrated modeling of phonon and defect-induced spin relaxation length (LS) in Fe3O4 and organic semiconductor (OSC) Alq3. LS of Alq3 decreases with…”
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    Journal Article
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    Enlarged broad band photodetection using Indium doped TiO2 alloy thin film by Sarkar, Mitra Barun, Mondal, Aniruddha, Choudhuri, Bijit, Mahajan, Bikram Kishore, Chakrabartty, Shubhro, Ngangbam, Chitralekha

    Published in Journal of alloys and compounds (05-12-2014)
    “…•An easy technique has been used to dope Indium (instantaneous source) into TiO2 TF.•An inhomogeneous layer of InxTiyO2 alloy was formed due to doping.•The…”
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    Journal Article
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    Unlocking the performance of next-generation non-volatile capacitive memory devices with Ti-doped ZnO nano wires via pulsed laser deposition by Nath, Amitabha, Mishra, Madhuri, Mahajan, Bikram Kishore, Chakrabarti, Subhananda

    Published in Journal of alloys and compounds (05-01-2025)
    “…This paper investigates the impact of titanium (Ti) doping on zinc oxide (ZnO) nano wires (NWs) in non-volatile capacitive memory devices (NVCMDs) through…”
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    Journal Article
  5. 5

    A Scalable Enhancement-Mode Junctionless SiC FET with Embedded P+ Pockets in the Oxide Layer for High-Temperature Applications by Baruah, Ratul Kumar, Mahajan, Bikram Kishore, Routh, Sujay

    Published in Journal of electronic materials (01-02-2023)
    “…Junctionless FETs exhibit better high-temperature performance than their traditional inversion-mode (IM) counterparts due to reduced scattering in the…”
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    Journal Article
  6. 6

    Ag Nanoparticles Sheltered In2O3 Nanowire as a Capacitive MOS Memory Device by Nath, Amitabha, Mahajan, Bikram Kishore, Sarkar, Mitra Barun

    “…A capacitive memory effect has been reported for Ag nanoparticles (NPs) sheltered In 2 O 3 nanowires (NWs) devices. To compare the performance with that of…”
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    Journal Article
  7. 7

    A Device-to-System Perspective Regarding Self-Heating Enhanced Hot Carrier Degradation in Modern Field-Effect Transistors: A Topical Review by Alam, Muhammad Ashraful, Mahajan, Bikram Kishore, Chen, Yen-Pu, Ahn, Woojin, Jiang, Hai, Shin, Sang Hoon

    Published in IEEE transactions on electron devices (01-11-2019)
    “…As foreseen by Keyes in the late 1960s, the self-heating effect has emerged as an important concern for device performance, output power density, run-time…”
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    Journal Article
  8. 8

    An Analytical Model of Hot Carrier Degradation in LDMOS Transistors: Rediscovery of Universal Scaling by Mahajan, Bikram Kishore, Chen, Yen-Pu, Alam, Muhammad Ashraful

    Published in IEEE transactions on electron devices (01-08-2021)
    “…It is well-known that regardless of the voltage/temperature/device structure, the hot carrier degradation (HCD) of classical logic transistors scales onto a…”
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    Journal Article
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    Positive Bias Temperature Instability and Hot Carrier Degradation of Back-End-of-Line, nm-Thick, In2O3 Thin-Film Transistors by Chen, Yen-Pu, Si, Mengwei, Mahajan, Bikram Kishore, Lin, Zehao, Ye, Peide D., Alam, Muhammad Ashraful

    Published in IEEE electron device letters (01-02-2022)
    “…Recently, back-end-of-line (BEOL) compatible indium oxide (In 2 O 3 ) thin-film transistors (TFTs), grown by atomic layer deposition (ALD) with channel…”
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    Journal Article
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    Enhancing Detectivity of Indium-Oxide-Based Photodetectors via Vertical Nanostructuring Through Glancing Angle Deposition by Nath, Amitabha, Mahajan, Bikram Kishore, Singh, Laishram Robindro, Vishwas, Shubhajit, Nanda, Rajib Kumar, Sarkar, Mitra Barun

    Published in Journal of electronic materials (01-06-2021)
    “…In 2 O 3 vertical nanostructures (VNS) are fabricated using a glancing angle deposition (GLAD) technique upon an In 2 O 3 thin film (TF) on a n-type silicon…”
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    Journal Article
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    Super Single Pulse Charge Pumping Technique for Profiling Interfacial Defects by Chen, Yen-Pu, Mahajan, Bikram Kishore, Varghese, Dhanoop, Krishnan, Srikanth, Reddy, Vijay, Alam, Muhammad Ashraful

    Published in IEEE transactions on electron devices (01-02-2021)
    “…Traditional charge pumping (CP) technique relies on trap-assisted recombination from the source/drain to the body contact to characterize interface trap…”
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    Journal Article
  14. 14

    Silver Nanoparticles Textured Oxide Thin Films for Surface Plasmon Enhanced Photovoltaic Properties by Nath, Amitabha, Bhati, Naveen, Mahajan, Bikram Kishore, Rakshit, Jayanta Kumar, Sarkar, Mitra Barun

    Published in Plasmonics (Norwell, Mass.) (01-02-2022)
    “…In this report, Ag nanoparticles were fabricated using the single-step glancing angle deposition (SS-GLAD) technique upon In 2 O 3 /TiO 2 thin film. Afterward,…”
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    Journal Article
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    Aerosol printing and photonic sintering of bioresorbable zinc nanoparticle ink for transient electronics manufacturing by Mahajan, Bikram Kishore, Ludwig, Brandon, Shou, Wan, Yu, Xiaowei, Fregene, Emmanuel, Xu, Hang, Pan, Heng, Huang, Xian

    Published in Science China. Information sciences (01-07-2018)
    “…Bioresorbable electronics technology can potentially lead to revolutionary applications in healthcare, consumer electronics, and data security. This technology…”
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    Journal Article
  16. 16

    Electro-Thermal and Radiation Reliability of Power Transistors: Silicon to Wide Bandgap Semiconductors by Mahajan, Bikram Kishore

    Published 01-01-2021
    “…We are in the midst of a technological revolution (popularly known as Industrie 4.0 or 4th Industrial Revolution) where our cars are being equipped with…”
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    Dissertation
  17. 17

    Correlated Effects of Radiation and Hot Carrier Degradation on the Performance of LDMOS Transistors by Mahajan, Bikram Kishore, Chen, Yen-Pu, Rivera, Ulisses Alberto Heredia, Rahimi, Rahim, Alam, Muhammad Ashraful

    “…Over the past few decades, power electronics devices have found numerous applications, including high energy physics, drones, space electronics, etc. It is…”
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    Conference Proceeding
  18. 18

    A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for LDMOS Transistors by Mahajan, Bikram Kishore, Chen, Yen-Pu, Alam, Muhammad Ashraful, Varghese, Dhanoop, Krishnan, Srikanth, Reddy, Vijay

    “…LDMOS is one of the most widely used power transistors and has a variety of applications across multiple sectors (automobile, photovoltaics, communication,…”
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    Conference Proceeding
  19. 19

    Quantifying Region-Specific Hot Carrier Degradation in LDMOS Transistors Using a Novel Charge Pumping Technique by Mahajan, Bikram Kishore, Chen, Yen-Pu, Varghese, Dhanoop, Reddy, Vijay, Krishnan, Srikanth, Alam, Muhammad Ashraful

    “…Since the 1970s, LDMOS transistors have been used in a variety of applications because of their versatility and monolithic integration with CMOS logic. Despite…”
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    Conference Proceeding
  20. 20

    A Novel 'I-V Spectroscopy' Technique to Deconvolve Threshold Voltage and Mobility Degradation in LDMOS Transistors by Chen, Yen-Pu, Mahajan, Bikram Kishore, Varghese, Dhanoop, Krishnan, Srikanth, Reddy, Vijay, Alam, Muhammad Ashraful

    “…Although the CMOS-compatible Laterally Diffused MOSFET (LDMOS) is widely used in various applications as a versatile and efficient power electronic device, its…”
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    Conference Proceeding