Search Results - "Mahajan, Bikram Kishore"
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1
Modeling of Spin Transport in Hybrid Magnetic Tunnel Junctions for Magnetic Recording Applications
Published in Crystals (Basel) (01-10-2022)“…We have demonstrated modeling of phonon and defect-induced spin relaxation length (LS) in Fe3O4 and organic semiconductor (OSC) Alq3. LS of Alq3 decreases with…”
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Journal Article -
2
Enlarged broad band photodetection using Indium doped TiO2 alloy thin film
Published in Journal of alloys and compounds (05-12-2014)“…•An easy technique has been used to dope Indium (instantaneous source) into TiO2 TF.•An inhomogeneous layer of InxTiyO2 alloy was formed due to doping.•The…”
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3
Enlarged broad band photodetection using Indium doped TiO 2 alloy thin film
Published in Journal of alloys and compounds (01-12-2014)Get full text
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4
Unlocking the performance of next-generation non-volatile capacitive memory devices with Ti-doped ZnO nano wires via pulsed laser deposition
Published in Journal of alloys and compounds (05-01-2025)“…This paper investigates the impact of titanium (Ti) doping on zinc oxide (ZnO) nano wires (NWs) in non-volatile capacitive memory devices (NVCMDs) through…”
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5
A Scalable Enhancement-Mode Junctionless SiC FET with Embedded P+ Pockets in the Oxide Layer for High-Temperature Applications
Published in Journal of electronic materials (01-02-2023)“…Junctionless FETs exhibit better high-temperature performance than their traditional inversion-mode (IM) counterparts due to reduced scattering in the…”
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Journal Article -
6
Ag Nanoparticles Sheltered In2O3 Nanowire as a Capacitive MOS Memory Device
Published in IEEE transactions on nanotechnology (2020)“…A capacitive memory effect has been reported for Ag nanoparticles (NPs) sheltered In 2 O 3 nanowires (NWs) devices. To compare the performance with that of…”
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7
A Device-to-System Perspective Regarding Self-Heating Enhanced Hot Carrier Degradation in Modern Field-Effect Transistors: A Topical Review
Published in IEEE transactions on electron devices (01-11-2019)“…As foreseen by Keyes in the late 1960s, the self-heating effect has emerged as an important concern for device performance, output power density, run-time…”
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8
An Analytical Model of Hot Carrier Degradation in LDMOS Transistors: Rediscovery of Universal Scaling
Published in IEEE transactions on electron devices (01-08-2021)“…It is well-known that regardless of the voltage/temperature/device structure, the hot carrier degradation (HCD) of classical logic transistors scales onto a…”
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9
Positive Bias Temperature Instability and Hot Carrier Degradation of Back-End-of-Line, nm-Thick, In 2 O 3 Thin-Film Transistors
Published in IEEE electron device letters (01-02-2022)Get full text
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10
Positive Bias Temperature Instability and Hot Carrier Degradation of Back-End-of-Line, nm-Thick, In2O3 Thin-Film Transistors
Published in IEEE electron device letters (01-02-2022)“…Recently, back-end-of-line (BEOL) compatible indium oxide (In 2 O 3 ) thin-film transistors (TFTs), grown by atomic layer deposition (ALD) with channel…”
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11
Enhancing Detectivity of Indium-Oxide-Based Photodetectors via Vertical Nanostructuring Through Glancing Angle Deposition
Published in Journal of electronic materials (01-06-2021)“…In 2 O 3 vertical nanostructures (VNS) are fabricated using a glancing angle deposition (GLAD) technique upon an In 2 O 3 thin film (TF) on a n-type silicon…”
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12
Ag Nanoparticles Sheltered In 2 O 3 Nanowire as a Capacitive MOS Memory Device
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13
Super Single Pulse Charge Pumping Technique for Profiling Interfacial Defects
Published in IEEE transactions on electron devices (01-02-2021)“…Traditional charge pumping (CP) technique relies on trap-assisted recombination from the source/drain to the body contact to characterize interface trap…”
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14
Silver Nanoparticles Textured Oxide Thin Films for Surface Plasmon Enhanced Photovoltaic Properties
Published in Plasmonics (Norwell, Mass.) (01-02-2022)“…In this report, Ag nanoparticles were fabricated using the single-step glancing angle deposition (SS-GLAD) technique upon In 2 O 3 /TiO 2 thin film. Afterward,…”
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15
Aerosol printing and photonic sintering of bioresorbable zinc nanoparticle ink for transient electronics manufacturing
Published in Science China. Information sciences (01-07-2018)“…Bioresorbable electronics technology can potentially lead to revolutionary applications in healthcare, consumer electronics, and data security. This technology…”
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Journal Article -
16
Electro-Thermal and Radiation Reliability of Power Transistors: Silicon to Wide Bandgap Semiconductors
Published 01-01-2021“…We are in the midst of a technological revolution (popularly known as Industrie 4.0 or 4th Industrial Revolution) where our cars are being equipped with…”
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Dissertation -
17
Correlated Effects of Radiation and Hot Carrier Degradation on the Performance of LDMOS Transistors
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01-03-2022)“…Over the past few decades, power electronics devices have found numerous applications, including high energy physics, drones, space electronics, etc. It is…”
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Conference Proceeding -
18
A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for LDMOS Transistors
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01-03-2022)“…LDMOS is one of the most widely used power transistors and has a variety of applications across multiple sectors (automobile, photovoltaics, communication,…”
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Conference Proceeding -
19
Quantifying Region-Specific Hot Carrier Degradation in LDMOS Transistors Using a Novel Charge Pumping Technique
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01-03-2021)“…Since the 1970s, LDMOS transistors have been used in a variety of applications because of their versatility and monolithic integration with CMOS logic. Despite…”
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Conference Proceeding -
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A Novel 'I-V Spectroscopy' Technique to Deconvolve Threshold Voltage and Mobility Degradation in LDMOS Transistors
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01-04-2020)“…Although the CMOS-compatible Laterally Diffused MOSFET (LDMOS) is widely used in various applications as a versatile and efficient power electronic device, its…”
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Conference Proceeding