Search Results - "MITSUOKA, Yasuyuki"
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Propagation loss measurement for surface plasmon-polariton modes at metal waveguides on semiconductor substrates
Published in Applied physics letters (09-02-2004)“…Propagation losses were measured for surface plasmon-polariton (SPP) modes at metal waveguides on semiconductor substrates. The waveguides are simple strips of…”
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Improvements in near-field optical performance using localized surface plasmon excitation by a scatterer-formed aperture
Published in Applied physics letters (11-08-2003)“…Near-field optical performance is greatly improved using our proposed near-field structure, in which a metal scatterer formed in an aperture enhances localized…”
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Numerical Simulation on Read-Out Characteristics of the Planar Aperture-Mounted Head with a Minute Scatterer
Published in Japanese Journal of Applied Physics (01-03-2001)“…Recently, various researches on optical recording based on near-field optical principles have been conducted for higher data storage density. However, there is…”
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Fabrication of void-free submillimeter-scale nickel component by bottom-up electrodeposition
Published in Journal of physics communications (01-02-2021)“…This study proposed and demonstrated the feasibility of adopting metallization method of bottom-up Damascene process (seed layer over entire patterned surface)…”
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Simulation of Simultaneous Tracking/Data Signal Detection Using Novel Aperture-Mounted Surface Recording Head
Published in Japanese Journal of Applied Physics (01-03-2002)Get full text
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Polarization effect in scanning near-field optic/atomic-force microscopy (SNOM/AFM)
Published in Ultramicroscopy (01-03-1998)“…The polarization effect is reported using a bent optical fiber probe for a scanning near-field optic/atomic-force microscope (SNOM/AFM). We have demonstrated…”
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Journal Article Conference Proceeding -
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Contact force detection on a minute aperture mounted optical contact slider using an acoustic emission sensor
Published in Microsystem technologies (01-08-2005)Get full text
Conference Proceeding Journal Article -
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Fabrication of optical micro-cantilever consisting of channel waveguide for scanning near-field optical microscopy controlled by atomic force
Published in Technical Digest. IEEE International MEMS 99 Conference. Twelfth IEEE International Conference on Micro Electro Mechanical Systems (Cat. No.99CH36291) (1999)“…We developed a novel optical micro-cantilever for scanning near-field optical microscopy (SNOM), evaluated its mechanical properties, and applied it for SNOM…”
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Conference Proceeding