Search Results - "MEIERAN, E. S."
-
1
Chemographic images of silicon surfaces
Published in Applied physics letters (01-01-1983)“…Images are obtained when freshly etched or abraded silicon wafers are placed in contact with photographic plates. Based on the study of the images it was…”
Get full text
Journal Article -
2
Analysis technology for VLSI fabrication
Published in Proceedings of the IEEE (1987)“…As a result of the rapid development of Very Large Scale Integrated circuit (VLSI) technology, procedures for the analysis of these devices are evolving…”
Get full text
Journal Article -
3
Chronic pregnenolone effects in normal humans: attenuation of benzodiazepine-induced sedation
Published in Psychoneuroendocrinology (01-05-2004)“…Pregnenolone is the major steroid precursor in humans. It is also a “neurosteroid” and possesses intrinsic behavioral and brain effects in animals, affecting…”
Get full text
Journal Article -
4
Some Anomalous Absorption Effects on the Shape of Single-Crystal Rocking Curves
Published in Physical review (01-01-1969)Get full text
Journal Article -
5
Direct Transmission Electron Microscope Observation of Electrotransport in Aluminum Thin Films
Published in 6th Annual Reliability Physics Symposium (IEEE) (01-11-1967)“…The process of electrotransport in Al thin films was directly observed by transmission electron microscopy. As expected, it was seen that hole formation…”
Get full text
Conference Proceeding -
6
Dynamic Fault Imaging of VLSI Random Logic Devices
Published in 22nd International Reliability Physics Symposium (01-04-1984)Get full text
Conference Proceeding -
7
Dynamic Fault Imaging of VLSI Random Logic Devices
Published in 22nd International Reliability Physics Symposium (01-04-1984)“…A technique is described for acquiring and imaging faults in random logic devices such as microprocessors and other VLSI chips. Logic states for both faulty…”
Get full text
Conference Proceeding -
8
Growth-related surface features on BeO crystals revealed by electron microscopy
Published in Journal of materials science (01-03-1967)Get full text
Journal Article -
9
DIRECT VIDEO IMAGING OF X-RAY TOPOGRAPHS
Published in Applied physics letters (15-06-1969)“…In this paper, a video display system for direct imaging of transmission and reflection x-ray topographs of Si and GaAs wafers is described. This system allows…”
Get full text
Journal Article