Search Results - "MCPHAIL, D.S."

Analysis of shot-peening and residual stress relaxation in the nickel-based superalloy RR1000 by Foss, B.J., Gray, S., Hardy, M.C., Stekovic, S., McPhail, D.S., Shollock, B.A.

“…This work assesses the residual stress relaxation of the nickel-based alloy RR1000 due to thermal exposure and dwell-fatigue loading. A number of different…”
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Cotton-wool-like bioactive glasses for bone regeneration by Poologasundarampillai, G., Wang, D., Li, S., Nakamura, J., Bradley, R., Lee, P.D., Stevens, M.M., McPhail, D.S., Kasuga, T., Jones, J.R.

“…This paper presents the production of a 3D cotton-wool-like structured inorganic fibrous material for bone regeneration electrospun from a sol–gel precursor…”
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Low energy SIMS characterization of passive oxide films formed on a low-nickel stainless steel in alkaline media by FAJARDO, S, BASTIDAS, D. M, RYAN, M. P, CRIADO, M, MCPHAIL, D. S, MORRIS, R. J. H, BASTIDAS, J. M

“…Low-energy secondary ion mass spectrometry (SIMS) was used to study the oxide films formed on a low-nickel austenitic stainless steel (SS), potential…”
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The oxidation of calcium implanted titanium in water: A depth profiling study by Armitage, D.A., Mihoc, R., Tate, T.J., McPhail, D.S., Chater, R., Hobkirk, J.A., Shinawi, L., Jones, F.H.

“…Ion implantation of calcium has been proposed previously as a route to bioactive titanium surfaces and has been shown to stimulate promising cell and tissue…”
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High resolution quantitative SIMS analysis of shallow boron implants in silicon using a bevel and image approach by Fearn, S., McPhail, D.S.

“…Secondary ion mass spectrometry (SIMS) is frequently used as the preferred tool for dopant profiling due to its sensitivity and depth resolution. However, as…”
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Application of SIMS to silver tarnish at the British Museum by Hallett, K., Thickett, D., McPhail, D.S., Chater, R.J.

“…The tarnishing of silver in a museum environment is a perennial problem. Silver reacts with atmospheric gases generating a thin disfiguring surface layer. In…”
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Extraction and microanalysis of cosmic dust captured during sample return missions: laboratory simulations by Graham, G.A., Kearsley, A.T., Butterworth, A.L., Bland, P.A., Burchell, M.J., McPhail, D.S., Chater, R., Grady, M.M., Wright, I.P.

“…Particles of cometary and asteroidal origin collected at source using dedicated capture cell technologies will be returned to Earth within the next 8 years…”
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Why stainless steel corrodes by Ryan, Mary P, Williams, David E, Chater, Richard J, Hutton, Bernie M, McPhail, David S

“…Stainless steels are used in countless diverse applications for their corrosion resistance. Although they have extremely good general resistance, they are…”
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Low-nickel stainless steel passive film in simulated concrete pore solution: A SIMS study by Fajardo, S., Bastidas, D.M., Ryan, M.P., Criado, M., McPhail, D.S., Bastidas, J.M.

“…Low-nickel and AISI 304 austenitic stainless steel (SS) passive films were studied using secondary ion mass spectrometry (SIMS). An alkaline Ca(OH) 2 saturated…”
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Some applications of SIMS in conservation science, archaeometry and cosmochemistry by McPhail, D.S.

“…Some applications of SIMS in conservation science, archaeometry and cosmochemistry are described. Ultra-low energy SIMS depth profiling and TOF-SIMS imaging…”
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Stainless-steel corrosion and MnS inclusions by Meng, Q., Frankel, G. S., Colijn, H. O., Goss, S. H.

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Evaluation of imperfections in silica and chalcogenide glass microspheres using focussed ion beam milling and imaging by KANE, D.M., CHATER, R.J., MCPHAIL, D.S.

“…Microspheres made from optical glasses such as silica and chalcogenide are used as both passive and active optical elements in micro‐optics systems and…”
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Implantation and diffusion of phosphorous in germanium by Chroneos, A., Skarlatos, D., Tsamis, C., Christofi, A., McPhail, D.S., Hung, R.

“…In this work, we investigate the implantation and diffusion of phosphorous (P) in germanium (Ge). Ge wafers were implanted at two different doses (5×10 13 and…”
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TOF-SIMS analysis of corroding museum glass by Fearn, S., McPhail, D.S., Hagenhoff, B., Tallarek, E.

“…Corrosion salts form on the surface of vulnerable low lime glass as it corrodes and if left to develop, reduce the clarity of the object and ultimately…”
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Multi-analytical study of patination methods on steel substrates: a full insight into surface chemistry and morphology by Téllez, H., Vadillo, J. M., Laserna, J. J., Chater, R. J., McPhail, D. S.

“…Patination of metals has been used for decorative or protective purposes, and several methods aimed to create coloured films on metal surfaces have been…”
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SIMS depth profiling and TEM imaging of the SIMS altered layer by Christofi, A., Walker, J.F., McPhail, D.S.

“…A reduction in the scale of semiconducting devices has created many challenges in SIMS depth profiling. With fewer and shallower dopant atoms, depth…”
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Sodium and hydrogen analysis of room temperature glass corrosion using low energy Cs SIMS by Fearn, S., McPhail, D.S., Morris, R.J.H., Dowsett, M.G.

“…Corrosion affects commercial float glass production and glasses used to contain high level nuclear waste. In order to prevent the corrosion it is necessary to…”
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Analysis of simulated hypervelocity impacts on a titanium fuel tank from the Salyut 7 space station by Jantou, V., McPhail, D.S., Chater, R.J., Kearsley, A.

“…The aim of this project was to gain a better understanding of the microstructural effects of hypervelocity impacts (HVI) in titanium alloys. We investigated a…”
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Low energy SIMS characterisation of ultra thin oxides on ferrous alloys by Rees, E.E., McPhail, D.S., Ryan, M.P., Kelly, J., Dowsett, M.G.

“…Ultra low energy SIMS was used to create chemical depth profiles of Fe–Cr alloys and stainless steels in order to assess the effect of alloying additions on…”
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Oxygen isotopic tracer measurements in ceramics and ceramic composites with a fine focus gallium primary ion gun by Chater, R.J, McPhail, D.S

“…The tracer oxygen technique has been applied to polycrystalline ceramic and ceramic composites developed for high temperature electrochemical devices with SIMS…”
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