Search Results - "Lyytinen, Jussi"

Aluminum oxide from trimethylaluminum and water by atomic layer deposition: The temperature dependence of residual stress, elastic modulus, hardness and adhesion by Ylivaara, Oili M.E., Liu, Xuwen, Kilpi, Lauri, Lyytinen, Jussi, Schneider, Dieter, Laitinen, Mikko, Julin, Jaakko, Ali, Saima, Sintonen, Sakari, Berdova, Maria, Haimi, Eero, Sajavaara, Timo, Ronkainen, Helena, Lipsanen, Harri, Koskinen, Jari, Hannula, Simo-Pekka, Puurunen, Riikka L.

“…Use of atomic layer deposition (ALD) in microelectromechanical systems (MEMS) has increased as ALD enables conformal growth on 3-dimensional structures at…”
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Durable superhydrophobicity in embossed CYTOP fluoropolymer micro and nanostructures by Jokinen, Ville, Suvanto, Pia, Garapaty, Anshul Rao, Lyytinen, Jussi, Koskinen, Jari, Franssila, Sami

“…•Abrasion resistant fluoropolymer surfaces.•Alumina slurry abrasion testing.•Single and dual scale CYTOP micro/nanostructures.•Cassie state retained after 4h…”
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Nanotribological, nanomechanical and interfacial characterization of atomic layer deposited TiO2 on a silicon substrate by Lyytinen, Jussi, Liu, Xuwen, Ylivaara, Oili M.E., Sintonen, Sakari, Iyer, Ajai, Ali, Saima, Julin, Jaakko, Lipsanen, Harri, Sajavaara, Timo, Puurunen, Riikka L., Koskinen, Jari

“…For every coating it is critical that the coatings are sufficiently durable to withstand practical applications and that the films adhere well enough to the…”
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Characterization of thin film adhesion by MEMS shaft-loading blister testing by Berdova, Maria, Lyytinen, Jussi, Grigoras, Kestutis, Baby, Anu, Kilpi, Lauri, Ronkainen, Helena, Franssila, Sami, Koskinen, Jari

“…A new microelectromechanical system shaft-loaded blister test was developed and demonstrated to provide stability, repeatability, and simultaneous quantitative…”
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Carbon thin films as electrode material in neural sensing by Kaivosoja, Emilia, Sainio, Sami, Lyytinen, Jussi, Palomäki, Tommi, Laurila, Tomi, Kim, Sung I., Han, Jeon G., Koskinen, Jari

“…For therapeutic purposes, an accurate measurement of dopamine levels in situ would be highly desirable. A novel strategy for the selective determination of…”
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Review Article: Recommended reading list of early publications on atomic layer deposition—Outcome of the “Virtual Project on the History of ALD” by Ahvenniemi, Esko, Akbashev, Andrew R., Ali, Saima, Bechelany, Mikhael, Berdova, Maria, Boyadjiev, Stefan, Cameron, David C., Chen, Rong, Chubarov, Mikhail, Cremers, Veronique, Devi, Anjana, Drozd, Viktor, Elnikova, Liliya, Gottardi, Gloria, Grigoras, Kestutis, Hausmann, Dennis M., Hwang, Cheol Seong, Jen, Shih-Hui, Kallio, Tanja, Kanervo, Jaana, Khmelnitskiy, Ivan, Kim, Do Han, Klibanov, Lev, Koshtyal, Yury, Krause, A. Outi I., Kuhs, Jakob, Kärkkänen, Irina, Kääriäinen, Marja-Leena, Kääriäinen, Tommi, Lamagna, Luca, Łapicki, Adam A., Leskelä, Markku, Lipsanen, Harri, Lyytinen, Jussi, Malkov, Anatoly, Malygin, Anatoly, Mennad, Abdelkader, Militzer, Christian, Molarius, Jyrki, Norek, Małgorzata, Özgit-Akgün, Çağla, Panov, Mikhail, Pedersen, Henrik, Piallat, Fabien, Popov, Georgi, Puurunen, Riikka L., Rampelberg, Geert, Ras, Robin H. A., Rauwel, Erwan, Roozeboom, Fred, Sajavaara, Timo, Salami, Hossein, Savin, Hele, Schneider, Nathanaelle, Seidel, Thomas E., Sundqvist, Jonas, Suyatin, Dmitry B., Törndahl, Tobias, van Ommen, J. Ruud, Wiemer, Claudia, Ylivaara, Oili M. E., Yurkevich, Oksana

“…Atomic layer deposition (ALD), a gas-phase thin film deposition technique based on repeated, self-terminating gas–solid reactions, has become the method of…”
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Recommended reading list of early publications on atomic layer deposition-Outcome of the "Virtual Project on the History of ALD" by Ahvenniemi, Esko, Akbashev, Andrew R., Ali, Saima, Bechelany, Mikhael, Berdova, Maria, Boyadjiev, Stefan, Cameron, David C., Chen, Rong, Chubarov, Mikhail, Cremers, Veronique, Devi, Anjana, Drozd, Viktor, Elnikova, Liliya, Gottardi, Gloria, Grigoras, Kestutis, Hausmann, Dennis M., Seong Hwang, Cheol, Jen, Shih-Hui, Kallio, Tanja, Kanervo, Jaana, Khmelnitskiy, Ivan, Han Kim, Do, Klibanov, Lev, Koshtyal, Yury, Krause, A. Outi I., Kuhs, Jakob, Kaerkkaenen, Irina, Kaariainen, Marja-Leena, Kaariainen, Tommi, Lamagna, Luca, Lapicki, Adam A., Leskela, Markku, Lipsanen, Harri, Lyytinen, Jussi, Malkov, Anatoly, Malygin, Anatoly, Mennad, Abdelkader, Militzer, Christian, Molarius, Jyrki, Norek, Malgorzata, Ozgit-Akgun, Cagla, Panov, Mikhail, Pedersen, Henrik, Piallat, Fabien, Popov, Georgi, Puurunen, Riikka L., Rampelberg, Geert, Ras, Robin H. A., Rauwel, Erwan, Roozeboom, Fred, Sajavaara, Timo, Salami, Hossein, Savin, Hele, Schneider, Nathanaelle, Seidel, Thomas E., Sundqvist, Jonas, Suyatin, Dmitry B., Torndahl, Tobias, van Ommen, J. Ruud, Wiemer, Claudia, Ylivaara, Oili M. E., Yurkevich, Oksana

“…Atomic layer deposition (ALD), a gas-phase thin film deposition technique based on repeated, self-terminating gas-solid reactions, has become the method of…”
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Adhesion testing of atomic layer deposited TiO2 on glass substrate by the use of embedded SiO2 microspheres by Lyytinen, Jussi, Berdova, Maria, Franssila, Sami, Koskinen, Jari

“…In this paper, the authors present a new adhesion test method, which is under development, to study the interfacial mechanical parameters of atomic layer…”
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Nanotribological, nanomechanical and interfacial characterization of atomic layer deposited TiO sub(2) on a silicon substrate by Lyytinen, Jussi, Liu, Xuwen, Ylivaara, Oili ME, Sintonen, Sakari, Iyer, Ajai, Ali, Saima, Julin, Jaakko, Lipsanen, Harri, Sajavaara, Timo, Puurunen, Riikka L, Koskinen, Jari

“…For every coating it is critical that the coatings are sufficiently durable to withstand practical applications and that the films adhere well enough to the…”
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Characterization of nano-coated micro- and nanostructures by pushing by Liimatainen, Ville, Venalainen, Janne, Koverola, Mikko, Quan Zhou, Lyytinen, Jussi, Koskinen, Jari, Rontu, Ville, Berdova, Maria, Franssila, Sami

“…In this paper, we present methodology for measuring mechanical properties of nano-coated micro- and nanostructures by pushing. The methods are demonstrated in…”
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