Design and Evaluation of Nonlinear Verification Device for Nonlinear Vector Network Analyzers

A simple diode-based nonlinear verification device (NVD) design for nonlinear vector network analyzers is presented together with an improved figure of merit (FOM) parameter that is insensitive to impedance match and isolates variation of the device's nonlinear parameters. The stability over 84...

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Bibliographic Details
Published in:	IEEE transactions on microwave theory and techniques Vol. 66; no. 2; pp. 1121 - 1130
Main Authors:	Rajabi, Mohammad, Humphreys, David A., Avolio, Gustavo, Barmuta, Pawel, Lukasik, Konstanty R., Nielsen, Troels S., Schreurs, Dominique M. M.-P.
Format:	Journal Article
Language:	English
Published:	New York IEEE 01-02-2018 The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects:	Analyzers Calibration Design analysis Design engineering Figure of merit Harmonic analysis Impedance Instrumentation and measurement measurement uncertainty microwave integrated circuits Nonlinear analysis nonlinear circuits nonlinear network analysis Semiconductor device measurement semiconductor diodes Sensitivity Transmission line measurements Uncertainty
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Summary:	A simple diode-based nonlinear verification device (NVD) design for nonlinear vector network analyzers is presented together with an improved figure of merit (FOM) parameter that is insensitive to impedance match and isolates variation of the device's nonlinear parameters. The stability over 84 h and load-pull performance of this new design have been evaluated.
ISSN:	0018-9480 1557-9670
DOI:	10.1109/TMTT.2017.2762659