Search Results - "Lucatorto, TB"

  • Showing 1 - 18 results of 18
Refine Results
  1. 1

    Spontaneous coherent microwave emission and the sawtooth instability in a compact storage ring by Arp, U., Fraser, G. T., Hight Walker, A. R., Lucatorto, T. B., Lehmann, K. K., Harkay, K., Sereno, N., Kim, K.-J.

    “…Strong evidence for self-excited emission of coherent synchrotron radiation in the microwave spectral region was observed at the Synchrotron Ultraviolet…”
    Get full text
    Journal Article
  2. 2

    Towards High Accuracy Reflectometry for Extreme-Ultraviolet Lithography by Tarrio, Charles, Grantham, Steven, Squires, Matthew B, Vest, Robert E, Lucatorto, Thomas B

    “…Currently the most demanding application of extreme ultraviolet optics is connected with the development of extreme ultraviolet lithography. Not only does each…”
    Get full text
    Journal Article
  3. 3
  4. 4
  5. 5

    Measurement of CO pressures in the ultrahigh vacuum regime using resonance‐enhanced multiphoton‐ionization time‐of‐flight mass spectroscopy by Looney, J. Patrick, Harrington, Joel E., Smyth, Kermit C., O’Brian, Thomas R., Lucatorto, Thomas B.

    “…An evaluation is made of measurements of CO pressures in the UHV regime using resonance‐enhanced multiphoton ionization coupled with time‐of‐flight mass…”
    Get full text
    Journal Article
  6. 6

    A novel approach to resonance ionization mass spectrometry employing a glow discharge atom source by Xiong, X., Hutchinson, J.M.R., Hess, K.R., Fassett, J.D., Lucatorto, T.B.

    “…This paper reports on preliminary efforts to design and implement a novel combination of a laser, a glow discharge atom source, and a magnetic sector mass…”
    Get full text
    Journal Article
  7. 7
  8. 8

    Accurate reflectometry for extreme-ultraviolet lithography at the National Institute of Standards and Technology by Grantham, S., Tarrio, C., Lucatorto, T. B.

    “…The most demanding application of extreme ultraviolet multilayer optics is in lithography. The optics in current alpha-class tools are large, and the…”
    Get full text
    Conference Proceeding
  9. 9
  10. 10
  11. 11
  12. 12

    Verification of the ponderomotive approximation for the ac Stark shift in Xe Rydberg levels by O'Brian, TR, Kim, J, Lan, G, McIlrath, TJ, Lucatorto, TB

    “…We report direct measurements of the ac Stark shifts of Xe Rydberg levels in high-intensity laser fields (up to 6 GW/cm[sup 2]), demonstrating the expected…”
    Get full text
    Journal Article
  13. 13
  14. 14
  15. 15
  16. 16
  17. 17

    Optics go to extremes in EUV lithography by Grantham, Steve, Tarrio, Charles, Hill, Shannon B, Lucatorto, Thomas B

    Published in Laser focus world (01-11-2005)
    “…The features on integrated circuits continue to shrink according to Moore's Law. Extreme-UV lithography is considered by many to be the "next-generation"…”
    Get full text
    Magazine Article
  18. 18