Search Results - "Lubenchenko, Olga I."

Website XPS.mpei.ru: a Tool for XPS Analysis of Solid Surface by Lubenchenko, Alexandr V., Lubenchenko, Olga I., Ivanov, Dmitry A., Lukyantsev, Denis S., Ivanova, Irina V.

“…This work presents the website XPS.mpei.ru. The website enables its users to create and control the experimental photoelectron spectra database, perform XPS…”
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Application of Distance Learning Technologies to Create Simulation Modeling Applications in Technical Physics by Lubenchenko, Alexandr V., Ivanov, Dmitry A., Ivanova, Irina V., Lubenchenko, Olga I.

“…A new course for distance learning in imitation modelling is presented. The course includes theoretical lessons and a set of practical tasks. To consolidate…”
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The Formation of nanosuboxide layers in the oxide of niobium in low-power ion beam of argon by Lukiantsev, Denis S., Lubenchenko, Alexandr V., Ivanov, Dmitry A., Lubenchenko, Olga I., Pavolotsky, Alexey B., Iachuk, Vladimir A., Pavlov, Oleg N.

“…This paper presents the results of chemical, quantitative, and layer-by-layer phase analysis of a 10 nm thick niobium thin film created by magnetron sputtering…”
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Acceleration of Monte Carlo Simulation of Electron Transport by Lubenchenko, Alexandr V., Lubenchenko, Olga I., Ivanov, Dmitry A., Ivanova, Irina V., Iachuk, Vladimir A., Lukiantsev, Denis S.

“…This work describes new acceleration for Monte Carlo modelling: elimination of the inelastic channel from direct modelling and matrix MC modelling. Efficiency…”
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XPS Study of Air-Oxidized Chrome Thin Films by Lubenchenko, Alexandr V., Iachuk, Vladimir A., Lubenchenko, Olga I., Ivanov, Dmitry A., Lukiantsev, Denis S., Lashkov, Ilia A.

“…This work reports on chemical and depth phase profiling of ultra-thin air-oxidized chrome films. By means of angle resolution X-ray photoelectron spectroscopy…”
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XPS study of multilayer multicomponent films by Lubenchenko, Alexander V., Batrakov, Alexander A., Pavolotsky, Alexey B., Lubenchenko, Olga I., Ivanov, Dmitriy A.

“…•Chemical and phase depth profiling analysis of niobium suboxide thin films.•Background subtraction accounting for depth non-uniformity of inelastic…”
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Influence of nano-sized horizontal inhomogeneities on surface profiling by means of XPS by Lukyantsev, D.S., Lubenchenko, A.V., Ivanov, D.A., Lubenchenko, O.I., Fedotov, A.S.

“…Quantitative analysis of thin films surface is performed by means of X-ray electron spectroscopy (XPS) according to a calculation model assuming surface layers…”
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