Search Results - "Lubarsky, G"

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  1. 1

    Protein adsorption onto polystyrene surfaces studied by XPS and AFM by Browne, M.M., Lubarsky, G.V., Davidson, M.R., Bradley, R.H.

    Published in Surface science (20-03-2004)
    “…Albumin has been adsorbed onto polystyrene substrates which have been prepared by controlled oxidation using an ultraviolet/ozone system. The composition and…”
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    Journal Article
  2. 2

    Hydration–dehydration of adsorbed protein films studied by AFM and QCM-D by Lubarsky, G.V., Davidson, M.R., Bradley, R.H.

    Published in Biosensors & bioelectronics (15-02-2007)
    “…The hydration–dehydration process of an adsorbed human serum albumin film has been studied using atomic force microscopy (AFM) and a quartz crystal…”
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  3. 3

    Elastic modulus, oxidation depth and adhesion force of surface modified polystyrene studied by AFM and XPS by Lubarsky, G.V., Davidson, M.R., Bradley, R.H.

    Published in Surface science (01-06-2004)
    “…AFM and XPS have been used to investigate the surface and near-surface properties of polystyrene (PS) substrates which have been subjected to one of three…”
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  4. 4

    The influence of electrostatic forces on protein adsorption by Lubarsky, G.V., Browne, M.M., Mitchell, S.A., Davidson, M.R., Bradley, R.H.

    Published in Colloids and surfaces, B, Biointerfaces (25-07-2005)
    “…In this paper we investigate the importance of electrostatic double layer forces on the adsorption of human serum albumin by UV–ozone modified polystyrene…”
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  5. 5

    Characterisation of polystyrene microspheres surface-modified using a novel UV-ozone/fluidised-bed reactor by Lubarsky, G.V, Davidson, M.R, Bradley, R.H

    Published in Applied surface science (15-04-2004)
    “…A fluidised-bed apparatus equipped with UV and oxygen sources has been developed and used for controlled surface oxidative modification of polystyrene…”
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  6. 6

    van der Waals interaction in systems involving oxidised polystyrene surfaces by Lubarsky, G.V., Mitchell, S.A., Davidson, M.R., Bradley, R.H.

    “…The forces between polystyrene surfaces and silicon nitride or spherical silica probes in nitrogen and water have been measured using an atomic force…”
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  7. 7

    Nano-scale potential profiles of silicon particle detectors measured by atomic force microscopy by Ruzin, A., Croitoru, N., Lubarsky, G., Rosenwaks, Y.

    “…This is a report of preliminary results of Atomic Force Microscopy and Kelvin Probe Force Microscopy measurements performed on high-resistivity silicon…”
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  8. 8

    Structural and electronic properties of optimized a-Si:H films by Lubianiker, Yoram, Cohen, J.David, Lubarsky, G, Rosenwaks, Y, Yang, Jeffrey, Guha, Subhendu

    Published in Journal of non-crystalline solids (01-05-2000)
    “…Intrinsic a-Si:H films grown using optimized larger hydrogen dilution conditions have been studied. Capacitance measurements show a decrease in defect density…”
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  9. 9

    Inversion phenomenon as a result of junction damages in neutron irradiated silicon detectors by Golan, G, Rabinovich, E, Inberg, A, Axelevitch, A, Lubarsky, G, Rancoita, P.G, Demarchi, M, Seidman, A, Croitoru, N

    Published in Microelectronics and reliability (2001)
    “…This paper concerns with integrated microscopic investigations of bipolar junction damages in silicon detectors following neutron irradiation. This phenomenon…”
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  10. 10

    Quantitative evaluation of local charge trapping in dielectric stacked gate structures using Kelvin probe force microscopy by Lubarsky, G., Shikler, R., Ashkenasy, N., Rosenwaks, Y.

    “…We present a quantitative study of local charge injection into silicon nitride films inside dielectric stack gate structures. The charge is injected using…”
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