Search Results - "Lubarsky, G"
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Protein adsorption onto polystyrene surfaces studied by XPS and AFM
Published in Surface science (20-03-2004)“…Albumin has been adsorbed onto polystyrene substrates which have been prepared by controlled oxidation using an ultraviolet/ozone system. The composition and…”
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Hydration–dehydration of adsorbed protein films studied by AFM and QCM-D
Published in Biosensors & bioelectronics (15-02-2007)“…The hydration–dehydration process of an adsorbed human serum albumin film has been studied using atomic force microscopy (AFM) and a quartz crystal…”
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Elastic modulus, oxidation depth and adhesion force of surface modified polystyrene studied by AFM and XPS
Published in Surface science (01-06-2004)“…AFM and XPS have been used to investigate the surface and near-surface properties of polystyrene (PS) substrates which have been subjected to one of three…”
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The influence of electrostatic forces on protein adsorption
Published in Colloids and surfaces, B, Biointerfaces (25-07-2005)“…In this paper we investigate the importance of electrostatic double layer forces on the adsorption of human serum albumin by UV–ozone modified polystyrene…”
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Characterisation of polystyrene microspheres surface-modified using a novel UV-ozone/fluidised-bed reactor
Published in Applied surface science (15-04-2004)“…A fluidised-bed apparatus equipped with UV and oxygen sources has been developed and used for controlled surface oxidative modification of polystyrene…”
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van der Waals interaction in systems involving oxidised polystyrene surfaces
Published in Colloids and surfaces. A, Physicochemical and engineering aspects (15-05-2006)“…The forces between polystyrene surfaces and silicon nitride or spherical silica probes in nitrogen and water have been measured using an atomic force…”
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Nano-scale potential profiles of silicon particle detectors measured by atomic force microscopy
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (01-04-2001)“…This is a report of preliminary results of Atomic Force Microscopy and Kelvin Probe Force Microscopy measurements performed on high-resistivity silicon…”
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Structural and electronic properties of optimized a-Si:H films
Published in Journal of non-crystalline solids (01-05-2000)“…Intrinsic a-Si:H films grown using optimized larger hydrogen dilution conditions have been studied. Capacitance measurements show a decrease in defect density…”
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Inversion phenomenon as a result of junction damages in neutron irradiated silicon detectors
Published in Microelectronics and reliability (2001)“…This paper concerns with integrated microscopic investigations of bipolar junction damages in silicon detectors following neutron irradiation. This phenomenon…”
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Quantitative evaluation of local charge trapping in dielectric stacked gate structures using Kelvin probe force microscopy
Published in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures (01-09-2002)“…We present a quantitative study of local charge injection into silicon nitride films inside dielectric stack gate structures. The charge is injected using…”
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The Intermediate Stages of Aldehyde Oxidation. II. Kinetics of the Interaction between Peracetic Acid and the Aldehydes
Published in The Journal of Physical Chemistry (01-06-1935)Get full text
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Structural and electronic properties of optimized a-Si:H films
Published in Journal of non-crystalline solids (2000)Get full text
Conference Proceeding -
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ber die titrimetrische Bestimmung des aktiven Sauerstoffes in Gemischen von Wasserstoffsuperoxyd und berschwefels ure
Published in Analytical and bioanalytical chemistry (01-12-1930)Get full text
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Plasma nonlinearity influence on HF oscillation excitation by the electron beam in hybrid plasma waveguides
Published in 12th International Conference on High-Power Particle Beams. BEAMS'98. Proceedings (Cat. No.98EX103) (1998)“…The tasks of increase of the HF power under excitation and the microwave energy extraction into the outer space are the key problems of microwave electronics…”
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Conference Proceeding