Search Results - "Loxton, C.M."

Surface roughness development during sputtering of GaAs and InP: Evidence for the role of surface diffusion in ripple formation and sputter cone development by MacLaren, S. W., Baker, J. E., Finnegan, N. L., Loxton, C. M.

“…Surface diffusion is shown to be the important factor in sputter–induced ripple and cone development on GaAs and InP surfaces for conditions typical of depth…”
Get full text

The relationship between mass transport and oxide chemistry in oxidation of Ni 3 Al alloys by Haasch, R.T., Venezia, A.M., Loxton, C.M.

“…Isotope diffusion and surface analysis has been used to investigate mass transport processes and oxide chemistry during oxidation of Ni 3 Al alloys in oxygen…”
Get full text

The Relationship Between Mass Transport and Oxide Chemistry in Oxidation of Ni sub 3 Al Alloys by Haasch, R T, Venezia, A M, Loxton, C M

“…Isotope diffusion and surface analysis have been used to investigate mass transport processes and oxide chemistry during oxidation of Ni sub 3 Al alloys in…”
Get full text

The relationship between mass transport and oxide chemistry in oxidation of Ni3Al alloys by Haasch, R.T., Venezia, A.M., Loxton, C.M.

“…Isotope diffusion and surface analysis has been used to investigate mass transport processes and oxide chemistry during oxidation of Ni3Al alloys in oxygen…”
Get full text

Comment on "Molecule Formation During Sputtering by Two-Body Associative Ionization with Diabatic Curve Crossing by Loxton, C. M., Tsong, I. S. T., Lin, S. H.

Get full text

High‐sensitivity plasma‐based sputtered neutral mass spectrometry depth profiling of zinc‐implanted GaAs by MacLaren, S. W., Loxton, C. M., Sammann, E., Kiely, C. J.

“…A commercial sputtered neutral mass spectrometer, using a rf‐generated plasma for both sputtering and postionization of sputtered particles, has been modified…”
Get full text

Comparison of glow discharge cleaning and ion‐impact desorption of stainless steel by Ruzic, D. N., Gerdin, G. A., Loxton, C. M.

“…The effects of glow discharge cleaning (GDC) and ion‐impact desorption (IID) of impurities on 302 stainless steel were compared using Auger electron…”
Get full text