Search Results - "Loisnard, Dominique"

PID Evaluation of Transparent Backsheet Modules by Dupuis, Julien, Bodeux, Romain, Abdel-Nour, Christine, Loisnard, Dominique, Tremblay, Julien, Lefillastre, Paul, Becker, Axel

“…This Work Deals with the Robustness of Transparent Backsheet Modules using Coating/PET/PVF (TPC) Polymer Layers when Exposed to an Extended Potential Induced…”
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Link between b.c.c.–f.c.c. orientation relationship and austenite morphology in CF8M stainless steel by Mollens, Maxime, Guery, Adrien, Loisnard, Dominique, Hild, François, Roux, Stéphane

“…Slow‐cooled CF8M duplex stainless steel is used for critical parts of the primary coolant pipes of nuclear reactors. This steel can endure severe service…”
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Towards measuring absolute residual stress by HR-EBSD with simulated reference patterns by Shi, Qiwei, Zhong, Hongru, Loisnard, Dominique, Nowell, Matthew, Mollens, Maxime, Chen, Zhe, Wang, Haowei, Roux, Stéphane

“…The High-Resolution Electron Backscatter Diffraction (HR-EBSD) technique has drawn attention in recent years, mainly thanks to its ability to assess the…”
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Enhanced EBSD calibration accuracy based on gradients of diffraction patterns by Shi, Qiwei, Zhong, Hongru, Loisnard, Dominique, Wang, Lei, Chen, Zhe, Wang, Haowei, Roux, Stéphane

“…•An integrated full pattern match method on the gradients of electron diffraction pattern is proposed.•The method enhances the calibration accuracy as it…”
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Improved EBSD indexation accuracy by considering energy distribution of diffraction patterns by Shi, Qiwei, Jiao, Liyao, Loisnard, Dominique, Dan, Chengyi, Chen, Zhe, Wang, Haowei, Roux, Stéphane

“…Registering experimental and simulated electron diffraction patterns is increasingly used for advanced electron backscatter diffraction indexation (EBSD)…”
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Improved high-resolution EBSD analyses by correcting radial distortion of electron diffraction patterns by Shi, Qiwei, Plancher, Emeric, Loisnard, Dominique, Karamched, Phani, Liu, Jun, Chen, Zhe, Wang, Haowei, Roux, Stéphane

“…•An integrated DIC method is proposed to measure the radial optical distortion of electron diffraction cameras.•The method has a comparable accuracy with…”
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Indexation of electron diffraction patterns at grain boundaries by Shi, Qiwei, Zhou, Ying, Zhong, Hongru, Loisnard, Dominique, Dan, Chengyi, Zhang, Fengguo, Chen, Zhe, Wang, Haowei, Roux, Stéphane

“…•EBSD indexation for overlapped patterns is performed using integrated DIC.•Angular resolution reduces to 0.03∘ for multiple orientations at grain…”
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Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation by Shi, Qiwei, Loisnard, Dominique, Dan, Chengyi, Zhang, Fengguo, Zhong, Hongru, Li, Han, Li, Yuda, Chen, Zhe, Wang, Haowei, Roux, Stéphane

“…The accuracy of electron backscatter diffraction indexation has long been limited by pattern center determination, and numerous hardware and software methods…”
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On the use of SEM correlative tools for in situ mechanical tests by SHI, Qiwei, Roux, Stéphane, Latourte, Félix, Hild, François, Loisnard, Dominique, Brynaert, Nicolas

“…Highlights•Uncertainties of various SEM measuring modalities are revealed and several correction methods are proposed.•A specific speckle ‘splitting’…”
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Measuring topographies from conventional SEM acquisitions by Shi, Qiwei, Roux, Stéphane, Latourte, Félix, Hild, François, Loisnard, Dominique, Brynaert, Nicolas

“…•The stereoscopic imaging principle for estimating the surface topography is extended to a grazing angle, namely, 70° as suited for EBSD analyses.•Another…”
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Validity of Crystal Plasticity Models Near Grain Boundaries: Contribution of Elastic Strain Measurements at Micron Scale by Plancher, Emeric, Tajdary, Pouya, Auger, Thierry, Castelnau, Olivier, Favier, Véronique, Loisnard, Dominique, Marijon, Jean-Baptiste, Maurice, Claire, Michel, Vincent, Robach, Odile, Stodolna, Julien

“…Synchrotron Laue microdiffraction and digital image correlation measurements were coupled to track the elastic strain field (or stress field) and the total…”
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Humidity‐Induced Degradation Processes of Halide Perovskites Unveiled by Correlative Analytical Electron Microscopy by Mejaouri, Salim, Cacovich, Stefania, Baranek, Philippe, Bérenguier, Baptiste, Zimmermann, Iwan, Yaiche, Armelle, Loisnard, Dominique, Rousset, Jean, Collin, Stéphane

“…Improving the stability of lead halide perovskite solar cells (PSCs) for industrialization is currently a major challenge. It is shown that moisture induces…”
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On the Accuracy of Elastic Strain Field Measurements by Laue Microdiffraction and High-Resolution EBSD: a Cross-Validation Experiment by Plancher, E., Petit, J., Maurice, C., Favier, V., Saintoyant, L., Loisnard, D., Rupin, N., Marijon, J.-B., Ulrich, O., Bornert, M., Micha, J.-S., Robach, O., Castelnau, O.

“…Determining the accuracy of elastic strain measurements in plastically deformed alloys is an experimental challenge. To develop a novel cross-validation…”
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One‐Step Slot‐Die Coating Deposition of Wide‐Bandgap Perovskite Absorber for Highly Efficient Solar Cells by Bernard, Sophie, Jutteau, Sébastien, Mejaouri, Salim, Cacovich, Stefania, Zimmermann, Iwan, Yaiche, Armelle, Gbegnon, Stéphanie, Loisnard, Dominique, Collin, Stéphane, Duchatelet, Aurélien, Sauvage, Frédéric, Rousset, Jean

“…Slot‐die coating is a promising technique paving the way for large‐area perovskite deposition and commercially relevant solar device fabrication with sharp…”
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Validity of crystal plasticity models near grain boundaries: a contribution of elastic strain measurements at the micron scale by Plancher, Emeric, Tajdary, Pouya, Auger, Thierry, Castelnau, Olivier, Favier, Véronique, Loisnard, Dominique, Marijon, Jean-Baptiste, Maurice, Claire, Michel, Vincent, Robach, Odile, Stodolna, Julien

“…Journal of Materials Science, Springer Verlag, 2019, 71 (10), pp.3543-3551 Synchrotron Laue microdiffraction and Digital Image Correlation measurements were…”
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