Search Results - "Lofrano, M"
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1
Towards Complete Recovery of Circuit Degradation by Annealing With On-Chip Heaters
Published in IEEE electron device letters (01-02-2023)“…This work reports an on-chip heater structure fabricated in the Front End of Line (FEOL) on a versatile ring-oscillator (RO) array utilized to conduct…”
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2
A multilevel sub-modeling approach to evaluate 3D IC packaging induced stress on hybrid interconnect structures
Published in Microelectronic engineering (25-05-2014)“…•Multilevel sub-modeling was used to investigate CPI for 3D stacks with hybrid BEOL.•Positions in the die at edge and the at center of Cu Pillar were…”
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Journal Article Conference Proceeding -
3
Thermomigration-induced void formation in Cu-interconnects - Assessment of main physical parameters
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01-03-2023)“…Using a dedicated test structure, the main physical parameters of void formation due to thermomigration (TM) were assessed. Based on physical and electrical…”
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Conference Proceeding -
4
Assessment of critical Co electromigration parameters
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01-03-2022)“…We perform a detailed assessment of the electromigration performance of Co interconnects. Package level EM measurements were performed during >11 months. Our…”
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Conference Proceeding -
5
Towards Chip-Package-System Co-optimization of Thermally-limited System-On-Chips (SOCs)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01-03-2023)“…Surge in compute-demand in consumer products, mobile phones, auto mobiles, datacenters for high performance computing (HPC) applications brings in major…”
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Conference Proceeding -
6
Reliability of a DME Ru Semidamascene scheme with 16 nm wide Airgaps
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01-03-2021)“…We evaluate the reliability of a semidamascene BEOL scheme with direct metal etched (DME) Ruthenium and 16 nm wide air gaps (AG). First, we show that Ru can be…”
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Conference Proceeding -
7
Anxiety related to dental care in children and adolescents in a low-income Brazilian community
Published in European archives of paediatric dentistry (01-04-2015)“…Aim The aims of this study were to determine the prevalence of anxiety related to dental care and analyse associated factors in children and adolescents in a…”
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8
Chip-Package Interaction in 3D stacked IC packages using Finite Element Modelling
Published in Microelectronics and reliability (01-06-2014)“…•Analytical modelling, FEM simulations and 4 point bending for BEOL strength analysis.•Reduced low-k stiffness results in exponential growth of stress in Cu…”
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9
Relationship between nonalcoholic fatty liver disease prevalence and visceral fat in obese adolescents
Published in Digestive and liver disease (01-02-2008)“…Abstract Background Visceral adiposity is the major risk factor for paediatric nonalcoholic fatty liver disease. Aims Determine the prevalence of nonalcoholic…”
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10
Influence of test structure design on stress-induced-voiding using an experimentally validated Finite Element Modeling approach
Published in Microelectronics and reliability (01-09-2011)“…The sensitivity of stress-induced-voiding to structural layouts is investigated using Finite Element Modeling and is validated experimentally. A method is…”
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11
IgA deficiency evidence after anti-TNF-α treatment in a psoriatic arthritis patient: case report
Published in Reumatismo (01-03-2012)“…It is known that the use of anti-TNF-α drugs is related to an increased incidence of infective diseases. This therapy can not be administered to patients…”
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12
Study of void formation kinetics in Cu interconnects using local sense structures
Published in 2011 International Reliability Physics Symposium (01-04-2011)“…A test structure that allows the study of void formation kinetics during electromigration is proposed and characterized. Compared to a standard single-via…”
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Conference Proceeding -
13
Power, Performance, Area and Thermal Analysis of 2D and 3D ICs at A14 Node Designed with Back-side Power Delivery Network
Published in 2022 International Electron Devices Meeting (IEDM) (03-12-2022)“…In this work, we comprehensively evaluate the impact of using backside power delivery network (BSPDN) for CPU of 2D and 3D designs at A14 node from the aspects…”
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Conference Proceeding -
14
Methotrexate in the treatment of peripheral arthritis in ulcerative colitis
Published in Reumatismo (24-06-2011)“…Objective: To evaluate efficacy of methotrexate treatment in peripheral arthritis of ulcerative colitis. Methods: We studied 18 patients (10/8 M/F; mean age:…”
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15
Macroenzyme investigation and monitoring in children with persistent increase of aspartate aminotransferase of unexplained origin
Published in The Journal of pediatrics (01-08-1998)“…Ten children with asymptomatic persistent cryptogenic increased serum levels of aspartate aminotransferase (AST) were screened for detection and monitoring of…”
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16
Differential diagnosis between hepatocellular carcinoma and cirrhosis through a discriminant function based on results for serum analytes
Published in Clinical chemistry (Baltimore, Md.) (01-08-1996)“…We applied a multivariate analysis to a large series of serum biochemical tests in an attempt to identify a function that could efficiently discriminate…”
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17
Methotrexate in the treatment of peripheral arthritis in ulcerative colitis
Published in Reumatismo (01-01-2009)“…To evaluate efficacy of methotrexate treatment in peripheral arthritis of ulcerative colitis. We studied 18 patients (10/8 M/F; mean age: 38.90 yrs; range:…”
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18
Electromigration and stress-induced-voiding in dual damascene Cu/low-k interconnects: a complex balance between vacancy and stress gradients
Published in 2010 IEEE International Reliability Physics Symposium (01-05-2010)“…The influence of residual vacancy concentrations and stress gradients on electromigration both in the metal layer below and above copper via's with a diameter…”
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Conference Proceeding -
19
Thermal, Mechanical and Reliability assessment of Hybrid bonded wafers, bonded at 2.5μm pitch
Published in 2020 IEEE 70th Electronic Components and Technology Conference (ECTC) (01-06-2020)“…In this paper we address the thermal, mechanical and reliability performance of wafer-to-wafer hybrid bonded CMOS wafers manufactured using standard 65nm…”
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Conference Proceeding -
20
A combined modelling approach to design test structures to study thermomigration in Cu interconnects
Published in Microelectronics and reliability (01-11-2022)“…With the downscaling of microelectronic devices, thermal gradients become increasingly important, making thermomigration (TM) an important mass transport…”
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