Search Results - "Loertscher, E."
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1
Lower Kinetic Chain, Meet the Thinking Brain: A Scoping Review of Cognitive Function and Lower Extremity Injury Risk
Published in International journal of sports physical therapy (01-08-2022)“…The classic model of non-contact ACL injury includes environmental, anatomical, hormonal and biomechanical risk factors which directly impact either the amount…”
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2
1335P Phase Ib study to evaluate the safety and tolerability of osimertinib with ipilimumab in EGFRm NSCLC
Published in Annals of oncology (01-10-2023)Get full text
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3
Inducing a direct-to-pseudodirect bandgap transition in wurtzite GaAs nanowires with uniaxial stress
Published in Nature communications (10-04-2014)“…Many efficient light-emitting devices and photodetectors are based on semiconductors with, respectively, a direct or indirect bandgap configuration. The less…”
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4
Direct electrode-electrode tunneling in break-junction measurements of molecular conductance
Published in Physical review. B, Condensed matter and materials physics (10-11-2011)Get full text
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5
Direct experimental observation of stacking fault scattering in highly oriented pyrolytic graphite meso-structures
Published in Nature communications (16-12-2014)“…Stacking fault defects are thought to be the root cause for many of the anomalous transport phenomena seen in high-quality graphite samples. In stark contrast…”
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6
Meso-scale measurement of the electrical spreading resistance in highly anisotropic media
Published in Applied physics letters (22-09-2014)“…The spreading resistance of circular contacts with a radius in the range from 60 nm to 500 nm has been measured in highly oriented pyrolytic graphite which is…”
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7
Silicon Nanowire Tunnel FETs: Low-Temperature Operation and Influence of High- k Gate Dielectric
Published in IEEE transactions on electron devices (01-09-2011)“…In this paper, we demonstrate p-channel tunnel FETs based on silicon nanowires grown with an in situ p-i-n doping profile. The tunnel FETs were fabricated with…”
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8
Suppression of ambipolar behavior in metallic source/drain metal-oxide-semiconductor field-effect transistors
Published in Applied physics letters (23-11-2009)“…We present a study on suppressing the ambipolar behavior of Schottky barrier metal-oxide-semiconductor field-effect transistors (MOSFET). Inserting a silicon…”
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9
Mortality from neurodegenerative disease and exposure to extremely low-frequency magnetic fields: 31 years of observations on Swiss railway employees
Published in Neuroepidemiology (01-01-2007)“…The objective of the present study was to investigate the relationship between extremely low-frequency magnetic field (ELF-MF) exposure and mortality from…”
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10
Internet of the Body - Wearable Monitoring and Coaching
Published in 2019 Global IoT Summit (GIoTS) (01-06-2019)“…Wearables that acquire relevant vital and contextual parameters improve work safety as well as quality of life of elderly citizens or patients with chronic…”
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Conference Proceeding -
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Internet of the body and cognitive companion: Enabling high-quality monitoring of patients at home
Published in 2017 IEEE 19th International Conference on e-Health Networking, Applications and Services (Healthcom) (01-10-2017)“…Wearables that continuously acquire vital and other medically relevant parameters facilitate treatment optimizations for individual patients and reduce the…”
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Conference Proceeding -
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Internet of the Body and Cognitive Hypervisor
Published in 2017 IEEE/ACM International Conference on Connected Health: Applications, Systems and Engineering Technologies (CHASE) (01-07-2017)“…Wearables that continuously acquire medically relevant parameters can reduce duration of hospitalizations and derive treatment optimizations for individual…”
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Conference Proceeding -
13
Interface engineering for the suppression of ambipolar behavior in Schottky-barrier MOSFETs
Published in 2009 10th International Conference on Ultimate Integration of Silicon (01-03-2009)“…We study the suppression of ambipolar behavior of Schottky-barrier MOSFETs using an interface engineering approach. Inserting a thin silicon nitride layer…”
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Conference Proceeding