Search Results - "Lodha, G.S."

Study of structural and optical properties of zirconium carbide (ZrC) thin-films deposited by ion beam sputtering for soft x-ray optical applications by Singh, Amol, Modi, Mohammed H., Sinha, A.K., Dhawan, Rajnish, Lodha, G.S.

“…Compound materials have shown stable and enhanced optical performance in soft x-ray energy region. However, the growth related change in structural and…”
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Thermally induced interface changes in W/B4C multilayers by Rao, P.N., Rai, S.K., Sinha, A.K., Singh, M.N., Lodha, G.S.

“…Multilayer period thickness changes for various thickness ratios, Γ (ratio of W layer thickness to period thickness) as a function of annealing temperatures…”
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Multilayer mirror as a substrate for total reflection X-ray fluorescence spectrometry by Tiwari, M.K., Sawhney, K.J.S., Lodha, G.S.

“…X-ray field intensity generated over a multilayer surface during a strong Bragg reflection condition has been used to analyze the particulate matter deposited…”
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Smoothening of tungsten–carbon interfaces and change in interface asymmetry on heat treatment by Modi, Mohammed H., Lodha, G.S., Naik, S.R., Srivastava, A.K., Nandedkar, R.V.

“…In the present study, interface modifications in tungsten carbon multilayer are analyzed by performing isochronal annealing experiments in the range of 200–800…”
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Determination of layer structure in Mo/Si multilayers using soft X-ray reflectivity by Modi, M.H., Lodha, G.S., Nayak, M., Sinha, A.K., Nandedkar, R.V.

“…The soft X-ray reflectivity characterization of Mo/Si multilayer deposited by electron beam evaporation is discussed. The measurements are performed on Indus-1…”
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Investigations of structural defects, crystalline perfection, metallic impurity concentration and optical quality of flat-top KDP crystal by Sharma, S.K., Verma, Sunil, Singh, Yeshpal, Bartwal, K.S., Tiwari, M.K., Lodha, G.S., Bhagavannarayana, G.

“…Rocking curves showing the crystalline perfection (a), X-ray fluorescence spectra showing metallic impurities (b) and transmission spectra showing the optical…”
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Chemical sensitivity of K-L vacancy transfer probability in compounds of 3d atoms using synchrotron radiation by Mirji, Santosh, Bennal, A.S., Badiger, N.M., Tiwari, M.K., Lodha, G.S.

“…[Display omitted] •The K-L vacancy transfer probabilities of 3d compounds have been measured for the first time using synchrotron source.•Synchrotron energy is…”
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Cleaning of carbon layer from the gold films using a pulsed Nd:YAG laser by Singh, Amol, Choubey, Ambar, Modi, Mohammed H., Upadhyaya, B.N., Oak, S.M., Lodha, G.S., Deb, S.K.

“…Hydrocarbon cracking and carbon contamination of optical elements in soft X-ray spectrometers and synchrotron radiation beamlines is a severe problem. Carbon…”
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Structural modification of poly (methyl methacrylate) due to electron irradiation by Tiwari, Pragya, Srivastava, A.K., Khattak, B.Q., Verma, Suveer, Upadhyay, Anuj, Sinha, A.K., Ganguli, Tapas, Lodha, G.S., Deb, S.K.

“…•E-beam irradiated PMMA was studied for correlated changes in material properties.•Changes in chemical properties were studied using FTIR.•Structure was…”
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Thermoluminescence studies on single crystal, polycrystalline and glass lithium tetraborate samples irradiated by X-rays from Indus-2 by Kar, S., Debnath, C., Verma, S., Dhamgaye, V.P., Lodha, G.S., Bartwal, K.S.

“…Undoped, Mn doped and Cu doped samples of lithium tetraborate (LTB) were prepared in single crystal, polycrystalline and glass forms. These samples were…”
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RF plasma MOCVD of Y2O3 thin films: Effect of RF self-bias on the substrates during deposition by Chopade, S.S., Barve, S.A., Thulasi Raman, K.H., Chand, N., Deo, M.N., Biswas, A., Rai, Sanjay, Lodha, G.S., Rao, G.M., Patil, D.S.

“…•Yttrium oxide thin films are deposited by RF Plasma MOCVD Process using Y(thd)3 precursor.•Films are deposited under varying influence of RF self-bias on the…”
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Thermal stablity of nickel-carbon XUV multilayers by Lodha, G.S., Pandita, S., Gupta, A., Nandedkar, R.V., Yamashita, Koujun

“…Thermal stability of Nickel-Carbon (Ni/C) multilayer fabricated in an electron beam deposition system, is studied under vacuum annealing using x-ray…”
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Experimental validation of XRF inversion code for Chandrayaan-1 by Athiray, P.S., Sudhakar, M., Tiwari, M.K., Narendranath, S., Lodha, G.S., Deb, S.K., Sreekumar, P., Dash, S.K.

“…We have developed an algorithm (x2abundance) to derive the lunar surface chemistry from X-ray fluorescence (XRF) data for the Chandrayaan-1 X-ray Spectrometer…”
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Oxidation studies of niobium thin films at room temperature by X-ray reflectivity by Sokhey, K.J.S., Rai, S.K., Lodha, G.S.

“…We report the results of growth kinetics of oxidation process on niobium thin film surfaces exposed to air at room temperature by using a surface sensitive…”
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Room temperature ferromagnetism down to 10nanometer Ni–Fe–Mo alloy films by Banerjee, Mitali, Majumdar, A.K., Rai, S., Tiwari, Pragya, Lodha, G.S., Banerjee, A., Nair, K.G.M, Sarkar, Jayanta, Choudhary, R.J., Phase, D.M.

“…Magnetic behavior of a few pulsed laser deposited soft ferromagnetic thin films of Ni–Fe–Mo alloys of different thickness on sapphire single crystals is…”
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Beam position measurements of Indus-2 using X-Ray beam position monitor by Dhamgaye, V.P., Lodha, G.S., Kane, S.R.

“…A staggered pair metal blade X-ray beam position monitor (XBPM) is designed, fabricated and commissioned on Indus-2 bending magnet front end. Calibration of…”
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Room temperature ferromagnetism down to 10 nanometer Ni―Fe―Mo alloy films by BANERJEE, Mitali, MAJUMDAR, A. K, RAI, S, TIWARI, Pragya, LODHA, G. S, BANERJEE, A, NAIR, K. G. M, SARKAR, Jayanta, CHOUDHARY, R. J, PHASE, D. M

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The effect of misalignment errors in optical elements of VUV polarimeter by Naik, S.R., Lodha, G.S.

“…We have designed a Vacuum Ultra Violet polarimeter for Indian Synchrotron Radiation Source Indus-1. This polarimeter will be installed on a toroidal grating…”
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Thermal stability studies of ion beam sputter deposited C/B4C X-ray multilayer mirror by Rao, P.N., Modi, M.H., Rai, S.K., Sathe, V.G., Deb, S.K., Lodha, G.S.

“…We report the results of thermal stability study carried out on C/B4C multilayer structure. We have analyzed the structure of as-deposited and vacuum annealed…”
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Ion beam sputter deposited W/Si multilayers: Influence of re-sputtering on the interface structure and structure modification at ultra short periods by Rai, S.K., Das, Arijeet, Srivastava, A.K., Lodha, G.S., Dhawan, Rajnish

“…► W/Si multilayers of periods ranging from 1.7 nm to 9.6 nm have been examined for changes in structure with period thickness. ► Loss of Si due to…”
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