Search Results - "Llido, R."

Effects of 1064 nm laser on MOS capacitor by Llido, R., Masson, P., Regnier, A., Goubier, V., Haller, G., Pouget, V., Lewis, D.

“…► We would like to predict complex circuit’s behavior under photoelectric stimulation. ► For that, it is mandatory to understand first the behavior of…”
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Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory by Llido, R., Gomez, J., Goubier, V., Froidevaux, N., Dufayard, L., Haller, G., Pouget, V., Lewis, D.

“…► The proposed methodology is based on pseudo-Dynamic Photoelectric Laser Stimulation. ► We present a new flow to deal with Latch-Up phenomenon issues. ► For…”
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Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90nm technology by Sarafianos, A., Llido, R., Dutertre, J.M., Gagliano, O., Serradeil, V., Lisart, M., Goubier, V., Tria, A., Pouget, V., Lewis, D.

“…This paper presents the electrical model of a PMOS transistor in 90nm technology under 1064nm Photoelectric Laser Stimulation. The model was built and tuned…”
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Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology by SARAFIANOS, A, LLIDOA, R, DUTERTRE, J. M, GAGLIANO, O, SERRADEIL, V, LISART, M, GOUBIER, V, TRIA, A, POUGET, V, LEWIS, D

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Improving defect localization techniques with laser beam with specific analysis and set-up modules by Llido, R., Gomez, J., Goubier, V., Haller, G., Pouget, V., Lewis, D.

“…This paper describes a way to improve commonly used static laser stimulation techniques. Several analysis and set-up modules are presented to enrich them…”
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Characterization and TCAD simulation of 90 nm technology transistors under continous photoelectric laser stimulation for failure analysis improvement by Llido, R., Sarafianos, A., Gagliano, O., Serradeil, V., Goubier, V., Lisart, M., Haller, G., Pouget, V., Lewis, D., Dutertre, J. M., Tria, A.

“…This study is driven by the need to optimize failure analysis methodologies based on laser/silicon interactions, using the functional response of an integrated…”
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