Search Results - "Ling, Man Ho"
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Optimal Constant-Stress Accelerated Life Test Plans for One-Shot Devices with Components Having Exponential Lifetimes under Gamma Frailty Models
Published in Mathematics (Basel) (01-03-2022)“…Optimal designs of constant-stress accelerated life test plans is one of the important topics in reliability studies. Many devices produced have very high…”
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The human primary visual cortex (V1) encodes the perceived position of static but not moving objects
Published in Communications biology (01-03-2022)“…Brain activity in retinotopic cortex reflects illusory changes in stimulus position. Is this neural signature a general code for apparent position? Here we…”
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Inference for One-Shot Devices with Dependent k-Out-of-M Structured Components under Gamma Frailty
Published in Mathematics (Basel) (01-12-2021)“…A device that performs its intended function only once is referred to as a one-shot device. Actual lifetimes of such kind of devices under test cannot be…”
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Career Preferences among Nursing Students: A Cross-Sessional Study
Published in SAGE open nursing (2022)“…Introduction It is estimated that mores nurses are needed in the future, nursing students’ career preferences are important to contribute the shortage of…”
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Impact of early phase COVID-19 precautionary behaviors on seasonal influenza in Hong Kong: A time-series modeling approach
Published in Frontiers in public health (14-11-2022)“…Before major non-pharmaceutical interventions were implemented, seasonal incidence of influenza in Hong Kong showed a rapid and unexpected reduction…”
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Battery state of health modeling and remaining useful life prediction through time series model
Published in Applied energy (01-10-2020)“…•A model considering stochasticity instead of deterministic degradation shape.•Predict degradation by constructing segments iteratively with autoregressive…”
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Confidence intervals for a difference between proportions based on paired data
Published in Statistics in medicine (15-01-2010)“…We construct several explicit asymptotic two‐sided confidence intervals (CIs) for the difference between two correlated proportions using the method of…”
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Optimal designs of constant‐stress accelerated life‐tests for one‐shot devices with model misspecification analysis
Published in Quality and reliability engineering international (01-03-2022)“…The design of constant‐stress accelerated life‐test (CSALT) is important in reliability estimation. In reliability studies, practitioners usually rely on…”
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A random‐effect gamma process model with random initial degradation for accelerated destructive degradation testing data
Published in Quality and reliability engineering international (01-02-2024)“…An accelerated degradation test (ADT) hastens degradation mechanisms of products by loading higher stresses than normal use conditions to shorten testing time…”
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Accelerated Degradation Analysis for the Quality of a System Based on the Gamma Process
Published in IEEE transactions on reliability (01-03-2015)“…As most systems these days are highly reliable with long lifetimes, failures of systems become rare; consequently, traditional failure time analysis may not be…”
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Exact and approximate unconditional confidence intervals for proportion difference in the presence of incomplete data
Published in Statistics in medicine (20-02-2009)“…Confidence interval (CI) construction with respect to proportion/rate difference for paired binary data has become a standard procedure in many clinical trials…”
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Model Mis-Specification Analyses of Weibull and Gamma Models Based on One-Shot Device Test Data
Published in IEEE transactions on reliability (01-09-2017)“…Model mis-specification is of great importance in reliability assessment. Different choices of probability models for fitting data may result in substantially…”
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Best Constant-Stress Accelerated Life-Test Plans With Multiple Stress Factors for One-Shot Device Testing Under a Weibull Distribution
Published in IEEE transactions on reliability (01-12-2014)“…We discuss here the design of constant-stress accelerated life-tests for one-shot device testing by assuming a Weibull distribution as a lifetime model…”
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14
On reliability analysis of one-shot devices with manufacturing defects
Published in Quality engineering (02-01-2023)“…One-shot device test data have attracted increased attention. The working condition of a one-shot device is unknown until testing the device. In this paper, we…”
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Imputing Missing Data in One-Shot Devices Using Unsupervised Learning Approach
Published in Mathematics (Basel) (01-09-2024)“…One-shot devices are products that can only be used once. Typical one-shot devices include airbags, fire extinguishers, inflatable life vests, ammo, and…”
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EM Algorithm for One-Shot Device Testing With Competing Risks Under Weibull Distribution
Published in IEEE transactions on reliability (01-06-2016)“…This paper provides an extension of the work of Balakrishnan and Ling by introducing a competing risks model into a one-shot device testing analysis under an…”
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OTL web interface: outlier testing in lifetime data
Published in Communications in statistics. Simulation and computation (02-08-2024)“…A web interface, named OTL, is developed to perform outlier analysis in exponential, Weibull, lognormal, and log-Laplace samples online over the Internet…”
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Multiple-Stress Model for One-Shot Device Testing Data Under Exponential Distribution
Published in IEEE transactions on reliability (01-09-2012)“…Left- and right-censored life time data arise naturally in one-shot device testing. An experimenter is often interested in identifying the effects of several…”
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Sexual Orientation-Related Differences in Virtual Spatial Navigation and Spatial Search Strategies
Published in Archives of sexual behavior (01-07-2017)“…Spatial abilities are generally hypothesized to differ between men and women, and people with different sexual orientations. According to the cross-sex shift…”
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Exact tests for outliers in Laplace samples
Published in Communications in statistics. Simulation and computation (03-10-2022)“…The exact null distributions of test statistics used for testing up to upper outliers in a two-parameter Laplace sample are investigated. Two types of test…”
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