Search Results - "Lindholm, F.A."

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  1. 1

    Theory of grain-boundary and intragrain recombination currents in polysilicon p-n-junction solar cells by Fossum, J.G., Lindholm, F.A.

    Published in IEEE transactions on electron devices (01-04-1980)
    “…The physics controlling recombination in polysilicon p-n-junction solar cells is described. Analytic models characterizing this recombination, whose parameters…”
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  2. 2

    Application of the superposition principle to solar-cell analysis by Lindholm, F.A., Fossum, J.G., Burgess, E.L.

    Published in IEEE transactions on electron devices (01-03-1979)
    “…The principle of superposition is used to derive from fundamentals the widely used shifting approximation that the current-voltage characteristic of an…”
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  3. 3

    Dember effect in fast photoconductive circuit elements by Bor-Yuan Hwang, Lindholm, F.A.

    Published in IEEE transactions on electron devices (01-01-1984)
    “…The observed independence of mobility on surface conditions in InP:Fe fast photoconductivity devices is explained by inclusion of the Dember electric field…”
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  4. 4

    Effects on the open-circuit voltage of grain boundaries within the junction space-charge region of polycrystalline solar cells by Fossum, J.G., Lindholm, F.A.

    Published in IEEE electron device letters (01-12-1980)
    “…A physical explanation is given for the observed dependence of open-circuit voltage on grain size in polycrystalline solar cells when no such dependence is…”
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  5. 5

    Rigid band analysis of heavily doped semiconductor devices by Marshak, A.H., Shibib, M.A., Fossum, J.G., Lindholm, F.A.

    Published in IEEE transactions on electron devices (01-03-1981)
    “…The conventional carrier transport equations used in device analysis must be modified for heavily doped semiconductor regions. The modifications to Shoekley's…”
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  6. 6

    A methodology for experimentally based determination of gap shrinkage and effective lifetimes in the emitter and base of p-n junction solar cells and other p-n junction devices by Lindholm, F.A., Neugroschel, A., Chih-Tang Sah, Godlewski, M.P., Brandhorst, H.W.

    Published in IEEE transactions on electron devices (01-04-1977)
    “…An experimentally based methodology is described that determines the effective gap shrinkage and lifetime in the emitter of a p-n junction solar cell. It…”
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  7. 7

    A new charge-control model for single- and double-heterojunction bipolar transistors by Parikh, C.D., Lindholm, F.A.

    Published in IEEE transactions on electron devices (01-06-1992)
    “…A new charge-control relation is derived for heterojunction bipolar transistors. The relation is valid for arbitrary doping density profiles and for all levels…”
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  8. 8

    Reply to "comments on 'a method for determining energy gap narrowing in highly doped semiconductors'" by Neugroschel, A., Lindholm, F.A.

    Published in IEEE transactions on electron devices (01-01-1984)
    “…The interpretation by del Alamo and Swanson of recombination-current data in highly doped silicon is clarified by making explicit their key assumptions. This…”
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  9. 9

    Space-charge region recombination in heterojunction bipolar transistors by Parikh, C.D., Lindholm, F.A.

    Published in IEEE transactions on electron devices (01-10-1992)
    “…A new comprehensive model for space-charge region (SCR) recombination current in abrupt and graded energy gap heterojunction bipolar transistors (HBTs) is…”
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    Systematic analytical solutions for minority-carrier transport in semiconductors with position-dependent composition, with application to heavily doped silicon by Jong-Sik Park, Neugroschel, A., Lindholm, F.A.

    Published in IEEE transactions on electron devices (01-02-1986)
    “…For quasi-neutral regions of semiconductor devices with position-dependent composition, we have derived expressions for the position dependence of the excess…”
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  13. 13

    One-dimensional non-quasi-static models for arbitrarily and heavily doped quasi-neutral layers in bipolar transistors by Wu, B.S., Lindholm, F.A.

    Published in IEEE transactions on electron devices (01-04-1989)
    “…A systematic method is presented for deriving non-quasi-static equivalent-circuit models for arbitrarily doped and heavily doped quasi-neutral layers in…”
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  14. 14

    Forward-voltage capacitance and thickness of p-n junction space-charge regions by Liou, J.J., Lindholm, F.A., Park, J.S.

    Published in IEEE transactions on electron devices (01-07-1987)
    “…A comprehensive analytical model for the quasi-static capacitance of the space-charge region of p-n junction devices is presented. It describes the capacitance…”
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  15. 15

    One-dimensional all injection nonquasi-static models for arbitrarily doped quasi-neutral layers in bipolar junction transistors including plasma-induced energy-gap narrowing by Wu, B.S., Lindholm, F.A.

    Published in IEEE transactions on electron devices (01-01-1990)
    “…Nonquasi-static circuit models accounting for carrier propagation delay in quasi-neutral layers are presented for bipolar junction transistors operating at all…”
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  16. 16

    Heavily doped polysilicon-contact solar cells by Lindholm, F.A., Neugroschel, A., Arienzo, M., Iles, P.A.

    Published in IEEE electron device letters (01-07-1985)
    “…We report the first use of a (silicon)/(heavily doped polysilicon)/(metal) structure to replace the conventional high-low junction or back-surface-field (BSF)…”
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  17. 17

    Evidence for low diffusivity and mobility of minority carriers in highly doped Si and interpretation by Neugroschel, A, Lindholm, F A

    Published in Applied physics letters (15-01-1983)
    “…Experimental evidence for low minority-carrier diffusivity and mobility in highly doped Si:As is presented and explained by a simple model. The model…”
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  18. 18

    Capacitance of semiconductor p-n junction space-charge layers: an overview by Liou, J.J., Lindholm, F.A.

    Published in Proceedings of the IEEE (01-11-1988)
    “…The modeling of capacitance of p-n junction space-charge layers in semiconductor devices is discussed. First, previously developed models and methods are…”
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  19. 19

    Large-signal and small-signal models for arbitrarily-doped four-terminal field-effect transistors by Lindholm, F.A., Gray, P.R.

    Published in IEEE transactions on electron devices (01-12-1966)
    “…Models are derived for a four-terminal field-effect transistor (FTFET) with an arbitrary (one-dimensional) impurity distribution. The models apply for both…”
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  20. 20

    Measurement circuits for silicon-diode and solar-cell lifetime and surface recombination velocity by electrical short-circuit current decay by Zondervan, A., Verhoef, L.A., Lindholm, F.A.

    Published in IEEE transactions on electron devices (01-01-1988)
    “…Two improved switching circuits for transient electrical short-circuit decay are presented that allow more accurate determination of base-region…”
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