Search Results - "Lindholm, F.A."
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1
Theory of grain-boundary and intragrain recombination currents in polysilicon p-n-junction solar cells
Published in IEEE transactions on electron devices (01-04-1980)“…The physics controlling recombination in polysilicon p-n-junction solar cells is described. Analytic models characterizing this recombination, whose parameters…”
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2
Application of the superposition principle to solar-cell analysis
Published in IEEE transactions on electron devices (01-03-1979)“…The principle of superposition is used to derive from fundamentals the widely used shifting approximation that the current-voltage characteristic of an…”
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3
Dember effect in fast photoconductive circuit elements
Published in IEEE transactions on electron devices (01-01-1984)“…The observed independence of mobility on surface conditions in InP:Fe fast photoconductivity devices is explained by inclusion of the Dember electric field…”
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4
Effects on the open-circuit voltage of grain boundaries within the junction space-charge region of polycrystalline solar cells
Published in IEEE electron device letters (01-12-1980)“…A physical explanation is given for the observed dependence of open-circuit voltage on grain size in polycrystalline solar cells when no such dependence is…”
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5
Rigid band analysis of heavily doped semiconductor devices
Published in IEEE transactions on electron devices (01-03-1981)“…The conventional carrier transport equations used in device analysis must be modified for heavily doped semiconductor regions. The modifications to Shoekley's…”
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6
A methodology for experimentally based determination of gap shrinkage and effective lifetimes in the emitter and base of p-n junction solar cells and other p-n junction devices
Published in IEEE transactions on electron devices (01-04-1977)“…An experimentally based methodology is described that determines the effective gap shrinkage and lifetime in the emitter of a p-n junction solar cell. It…”
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7
A new charge-control model for single- and double-heterojunction bipolar transistors
Published in IEEE transactions on electron devices (01-06-1992)“…A new charge-control relation is derived for heterojunction bipolar transistors. The relation is valid for arbitrary doping density profiles and for all levels…”
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8
Reply to "comments on 'a method for determining energy gap narrowing in highly doped semiconductors'"
Published in IEEE transactions on electron devices (01-01-1984)“…The interpretation by del Alamo and Swanson of recombination-current data in highly doped silicon is clarified by making explicit their key assumptions. This…”
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9
Space-charge region recombination in heterojunction bipolar transistors
Published in IEEE transactions on electron devices (01-10-1992)“…A new comprehensive model for space-charge region (SCR) recombination current in abrupt and graded energy gap heterojunction bipolar transistors (HBTs) is…”
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10
Foreword
Published in IEEE transactions on electron devices (01-04-1980)Get full text
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11
Foreword
Published in IEEE transactions on electron devices (01-04-1980)Get full text
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12
Systematic analytical solutions for minority-carrier transport in semiconductors with position-dependent composition, with application to heavily doped silicon
Published in IEEE transactions on electron devices (01-02-1986)“…For quasi-neutral regions of semiconductor devices with position-dependent composition, we have derived expressions for the position dependence of the excess…”
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13
One-dimensional non-quasi-static models for arbitrarily and heavily doped quasi-neutral layers in bipolar transistors
Published in IEEE transactions on electron devices (01-04-1989)“…A systematic method is presented for deriving non-quasi-static equivalent-circuit models for arbitrarily doped and heavily doped quasi-neutral layers in…”
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14
Forward-voltage capacitance and thickness of p-n junction space-charge regions
Published in IEEE transactions on electron devices (01-07-1987)“…A comprehensive analytical model for the quasi-static capacitance of the space-charge region of p-n junction devices is presented. It describes the capacitance…”
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15
One-dimensional all injection nonquasi-static models for arbitrarily doped quasi-neutral layers in bipolar junction transistors including plasma-induced energy-gap narrowing
Published in IEEE transactions on electron devices (01-01-1990)“…Nonquasi-static circuit models accounting for carrier propagation delay in quasi-neutral layers are presented for bipolar junction transistors operating at all…”
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16
Heavily doped polysilicon-contact solar cells
Published in IEEE electron device letters (01-07-1985)“…We report the first use of a (silicon)/(heavily doped polysilicon)/(metal) structure to replace the conventional high-low junction or back-surface-field (BSF)…”
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17
Evidence for low diffusivity and mobility of minority carriers in highly doped Si and interpretation
Published in Applied physics letters (15-01-1983)“…Experimental evidence for low minority-carrier diffusivity and mobility in highly doped Si:As is presented and explained by a simple model. The model…”
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18
Capacitance of semiconductor p-n junction space-charge layers: an overview
Published in Proceedings of the IEEE (01-11-1988)“…The modeling of capacitance of p-n junction space-charge layers in semiconductor devices is discussed. First, previously developed models and methods are…”
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19
Large-signal and small-signal models for arbitrarily-doped four-terminal field-effect transistors
Published in IEEE transactions on electron devices (01-12-1966)“…Models are derived for a four-terminal field-effect transistor (FTFET) with an arbitrary (one-dimensional) impurity distribution. The models apply for both…”
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20
Measurement circuits for silicon-diode and solar-cell lifetime and surface recombination velocity by electrical short-circuit current decay
Published in IEEE transactions on electron devices (01-01-1988)“…Two improved switching circuits for transient electrical short-circuit decay are presented that allow more accurate determination of base-region…”
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