Search Results - "Lindholm, F A"
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1
Heavily doped polysilicon-contact solar cells
Published in IEEE electron device letters (01-07-1985)“…We report the first use of a (silicon)/(heavily doped polysilicon)/(metal) structure to replace the conventional high-low junction or back-surface-field (BSF)…”
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2
Space-charge region recombination in heterojunction bipolar transistors
Published in IEEE transactions on electron devices (01-10-1992)“…A new comprehensive model for space-charge region (SCR) recombination current in abrupt and graded energy gap heterojunction bipolar transistors (HBTs) is…”
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3
Systematic analytical solutions for minority-carrier transport in semiconductors with position-dependent composition, with application to heavily doped silicon
Published in IEEE transactions on electron devices (01-02-1986)“…For quasi-neutral regions of semiconductor devices with position-dependent composition, we have derived expressions for the position dependence of the excess…”
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4
One-dimensional non-quasi-static models for arbitrarily and heavily doped quasi-neutral layers in bipolar transistors
Published in IEEE transactions on electron devices (01-04-1989)“…A systematic method is presented for deriving non-quasi-static equivalent-circuit models for arbitrarily doped and heavily doped quasi-neutral layers in…”
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5
Evidence for excess carrier storage in electron-hole plasma in silicon transistors
Published in IEEE electron device letters (01-05-1985)“…This work presents experimental evidence for significantly greater charge storage in highly excited silicon near room temperature than conventional theory…”
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6
One-dimensional all injection nonquasi-static models for arbitrarily doped quasi-neutral layers in bipolar junction transistors including plasma-induced energy-gap narrowing
Published in IEEE transactions on electron devices (01-01-1990)“…Nonquasi-static circuit models accounting for carrier propagation delay in quasi-neutral layers are presented for bipolar junction transistors operating at all…”
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7
Evidence for low diffusivity and mobility of minority carriers in highly doped Si and interpretation
Published in Applied physics letters (15-01-1983)“…Experimental evidence for low minority-carrier diffusivity and mobility in highly doped Si:As is presented and explained by a simple model. The model…”
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8
Influence of heavily doped contacts on photoconductive switch properties
Published in IEEE transactions on electron devices (01-12-1990)“…To help analyze a photoconductive semiconductor switch where heavily doped regions about the metal electrodes assure low-resistance ohmic contacts, switch…”
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9
Non-quasi-static models including all injection levels and DC, AC, and transient emitter crowding in bipolar transistors
Published in IEEE transactions on electron devices (01-01-1991)“…Two-dimensional equivalent-circuit models for bipolar junction transistors are systematically derived by solving the continuity equations for DC, AC, and…”
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10
Comments on determination of bandgap narrowing from activation plots
Published in IEEE transactions on electron devices (01-07-1986)“…We study the temperature dependence of the emitter saturation current for bipolar devices by varying the surface recombination velocity at the emitter surface…”
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11
Unifying view of transient responses for determining lifetime and surface recombination velocity in silicon diodes and back-surface-field solar cells, with application to experimental short-circuit-current decay
Published in IEEE transactions on electron devices (01-05-1984)“…Two main results are presented. The first deals with a simple method that determines the minority-carrier lifetime and the effective surface recombination…”
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12
Comparison and extension of recent one-dimensional bipolar transistor models
Published in IEEE transactions on electron devices (01-07-1988)“…Various nonquasistatic (NQS) improvements of the Gummel-Pooh integral charge-control model are considered for both small-signal and large-signal excitations…”
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13
Numerical analysis and interpretation of the small-signal minority-carrier transport in bipolar devices
Published in IEEE transactions on electron devices (01-02-1988)“…A simple and efficient one-dimensional numerical technique is presented that determines the small-signal minority-carrier transport in the quasineutral regions…”
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14
Photoconductive switches for AC circuit protection
Published in IEEE transactions on electron devices (01-12-1990)“…The basic suitability of the photoconductive circuit element (PCE) for protective switching applications in AC power transmission and distribution circuits is…”
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15
Determination of lifetime and surface recombination velocity of p-n junction solar cells and diodes by observing transients
Published in IEEE transactions on electron devices (01-02-1987)“…The unified view of transient methods for the determination of recombination lifetime τ and back surface recombination velocity S presented here for silicon…”
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16
A new charge-control model for single- and double-heterojunction bipolar transistors
Published in IEEE transactions on electron devices (01-06-1992)“…A new charge-control relation is derived for heterojunction bipolar transistors. The relation is valid for arbitrary doping density profiles and for all levels…”
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17
Pictorial derivation of the influence of degeneracy and disorder on nondegenerate minority-carrier concentration and recombination current in heavily doped silicon
Published in IEEE electron device letters (01-09-1981)“…Fermi-Dirac statistics strongly influence minority-carrier recombination in highly doped silicon even though the minority-carrier concentration is…”
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18
Transient establishment of the Dember field in fast photoconductive circuit elements
Published in IEEE transactions on electron devices (01-11-1985)“…The time τ eef required to establish the Dember electric field E_{D}(t) following the sudden application or removal of incident light or other radiation is…”
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19
Analytical solution for two-dimensional current injection from shallow p-n junctions
Published in IEEE transactions on electron devices (01-01-1985)“…An accurate analytical solution for the two-dimensional minority-carrier current spreading from a forward-biased p-n junction is presented. The structure…”
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20
Auger recombination in heavily doped shallow-emitter silicon p-n-junction solar cells, diodes, and transistors
Published in IEEE transactions on electron devices (01-07-1979)“…A rigorous analytic evaluation of an emitter model that includes Auger recombination but excludes bandgap narrowing is presented. It is shown that such a model…”
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