Search Results - "Lime, Francois"

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  1. 1

    Unified Charge Control Model for Back-Gated 2-D Field Effect Transistors by Mounir, Ahmed, Iniguez, Benjamin, Lime, Francois, Kloes, Alexander, Knobloch, Theresia, Grasser, Tibor

    Published in IEEE transactions on electron devices (01-01-2024)
    “…A physics-based analytical dc compact model for single back-gated MoS2 field effect transistors (FETs) is presented. The model is developed by calculating the…”
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    Journal Article
  2. 2

    Compact I-V model for back-gated and double-gated TMD FETs by Mounir, Ahmed, Iñiguez, Benjamin, Lime, François, Kloes, Alexander, Knobloch, Theresia, Grasser, Tibor

    Published in Solid-state electronics (01-09-2023)
    “…•A physics-based analytical DC compact model for double and single gate TMD FETs is presented.•The charge density inside the 2D layer is expressed in terms of…”
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    Journal Article
  3. 3

    A Complete Charge-Based Capacitance Model for IGZO TFTs by Moldovan, Oana, Castro-Carranza, Alejandra, Estrada, Magali, Cerdeira, Antonio, Lime, Francois, Iniguez, Benjamin

    Published in IEEE electron device letters (01-05-2019)
    “…We present a new complete capacitance model for the amorphous indium-gallium-zinc-oxide (IGZO) thin-film-transistor (TFT), valid in the above-threshold and…”
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    Journal Article
  4. 4

    A simple compact model for long-channel junctionless Double Gate MOSFETs by Lime, François, Santana, Ernesto, Iñiguez, Benjamin

    Published in Solid-state electronics (01-02-2013)
    “…► We developed an analytical compact model for the drain current of long channel junctionless Double Gate MOSFETs. ► The model is much simpler and covers…”
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    Journal Article
  5. 5

    Analytical modeling of capacitances in tunnel-FETs including the effect of Schottky barrier contacts by Farokhnejad, Atieh, Schwarz, Mike, Horst, Fabian, Iñíguez, Benjamín, Lime, François, Kloes, Alexander

    Published in Solid-state electronics (01-09-2019)
    “…In this paper, a charge-based analytical model for intrinsic capacitances in tunnel field-effect transistors (TFETs) is presented. The model is derived for a…”
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    Journal Article
  6. 6

    A compact explicit DC model for short channel Gate-All-Around junctionless MOSFETs by Lime, François, Ávila-Herrera, Fernando, Cerdeira, Antonio, Iñiguez, Benjamín

    Published in Solid-state electronics (01-05-2017)
    “…•A DC compact model for the cylindrical GAA MOSFET is proposed.•Short channel effects are taken into accounted.•The model is explicit with relatively simple…”
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    Journal Article
  7. 7

    A quantum wave based compact modeling approach for the current in ultra-short DG MOSFETs suitable for rapid multi-scale simulations by Hosenfeld, Fabian, Horst, Fabian, Iñíguez, Benjamín, Lime, François, Kloes, Alexander

    Published in Solid-state electronics (01-11-2017)
    “…•The presented model is based on an non-iterative NEGF formalism.•Channel length from 6nm to 30nm of DG MOSFETs are considered.•Source-to-drain tunneling and…”
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    Journal Article
  8. 8

    A Quasi-Two-Dimensional Compact Drain-Current Model for Undoped Symmetric Double-Gate MOSFETs Including Short-Channel Effects by Lime, F., Iniguez, B., Moldovan, O.

    Published in IEEE transactions on electron devices (01-06-2008)
    “…A drain-current model for undoped symmetric double-gate MOSFETs is proposed. Channel-length modulation and drain-induced barrier lowering are modeled by using…”
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    Journal Article
  9. 9

    3D analytical modelling of subthreshold characteristics in vertical Multiple-gate FinFET transistors by Ritzenthaler, Romain, Lime, François, Faynot, Olivier, Cristoloveanu, Sorin, Iñiguez, Benjamin

    Published in Solid-state electronics (01-11-2011)
    “…In this work, a model is developed in order to obtain analytical expressions of the subthreshold characteristics of advanced Pi-gate FET transistors. Based on…”
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    Journal Article Conference Proceeding
  10. 10

    Gate leakage current partitioning in nanoscale double gate MOSFETs, using compact analytical model by Darbandy, Ghader, Lime, François, Cerdeira, Antonio, Estrada, Magali, Garduño, Salvador Ivan, Iñiguez, Benjamin

    Published in Solid-state electronics (01-09-2012)
    “…► We presented a model of the gate current partitioning into the source and drain for a DG MOSFETs structure. ► Model based on a compact analytical gate…”
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    Journal Article
  11. 11
  12. 12

    A complete and Verilog-A compatible Gate-All-Around long-channel junctionless MOSFET model implemented in CMOS inverters by Moldovan, Oana, Lime, François, Iñiguez, Benjamin

    Published in Microelectronics (01-11-2015)
    “…In this paper, we present the results of the implementation of a complete DC and AC Gate-All-Around (GAA) long-channel junctionless MOSFET model in Verilog-A…”
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    Journal Article
  13. 13

    Cryogenic Temperature and Doping Analysis of Source-to-Drain Tunneling Current in Ultrashort-Channel Nanosheet MOSFETs by Yilmaz, Kerim, Iniguez, Benjamin, Lime, Francois, Kloes, Alexander

    Published in IEEE transactions on electron devices (01-03-2022)
    “…This work analyzes the impact of doping concentration on the temperature-dependent subthreshold current and swing saturation due to direct source-to-drain…”
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    Journal Article
  14. 14

    Quasi-Compact Model of Direct Source-to-Drain Tunneling Current in Ultrashort-Channel Nanosheet MOSFETs by Wavelet Transform by Yilmaz, Kerim, Iniguez, Benjamin, Lime, Francois, Kloes, Alexander

    Published in IEEE transactions on electron devices (01-01-2022)
    “…We present an analytical approach for the calculation of direct source-to-drain tunneling (DSDT) probability of electrons in gate-all-around (GAA) silicon…”
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    Journal Article
  15. 15

    A Compact Explicit Model for Long-Channel Gate-All-Around Junctionless MOSFETs. Part I: DC Characteristics by Lime, Francois, Moldovan, Oana, Iniguez, Benjamin

    Published in IEEE transactions on electron devices (01-09-2014)
    “…In this paper, we solved Poisson equation in cylindrical coordinates using approximations to obtain a compact model for the drain current of long-channel…”
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    Journal Article
  16. 16

    Compact DC and Quasi-Static Capacitances Modeling of a-Si:H TFTs, Including Parasitic Capacitances by Lime, Francois, Cerdeira, Antonio, Estrada, Magali, Pashkovich, Andrei, Iniguez, Benjamin

    Published in IEEE transactions on electron devices (01-07-2021)
    “…This article presents a compact model for the drain current and capacitances of hydrogenated amorphous silicon (a-Si:H) thin-film transistors (TFTs). The model…”
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    Journal Article
  17. 17

    Electrical studies of semiconductor–dielectric interfaces by Jamal Deen, M., Iñiguez, Benjamin, Marinov, Ognian, Lime, François

    “…Issue Title: Oxides in Electronics, Dedicated to Cyril Hogarth In this paper, a review of the physical properties and characterization techniques of…”
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    Journal Article
  18. 18

    Impact of On-Current on the Static and Dynamic Performance of TFET Inverters by Farokhnejad, Atieh, Horst, Fabian, Kloes, Alexander, Iniguez, Benjamin, Lime, Francois

    “…Concerning the innovations in architecture of tunnel-field effect transistor (TFET), the potential to achieve higher on-current increases. In respect thereof,…”
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    Conference Proceeding
  19. 19

    A Compact Explicit Model for Long-Channel Gate-All-Around Junctionless MOSFETs. Part II: Total Charges and Intrinsic Capacitance Characteristics by Moldovan, Oana, Lime, Francois, Iniguez, Benjamin

    Published in IEEE transactions on electron devices (01-09-2014)
    “…Analytical and explicit expressions are derived for intrinsic capacitances of the junctionless gate-all-around transistor, from the charge-control model, valid…”
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    Journal Article
  20. 20

    Equivalent DG Dimensions Concept for Compact Modeling of Short-Channel and Thin Body GAA MOSFETs Including Quantum Confinement by Yilmaz, Kerim, Darbandy, Ghader, Reimbold, Gilles, Iniguez, Benjamin, Lime, Francois, Kloes, Alexander

    Published in IEEE transactions on electron devices (01-12-2020)
    “…In this work, short-channel effects (SCEs) in cylindrical gate-all-around (GAA) MOSFETs with intrinsic or lightly doped channels are analytically described by…”
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    Journal Article