Search Results - "Lewalter, H."
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Formation of tantalum nitride films by rapid thermal processing
Published in Thin solid films (01-08-2003)“…As part of an investigation of transition metal nitrides formed by means of rapid thermal processing, the reactivity of 200/500-nm thick tantalum films…”
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Journal Article -
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Formation and nitridation of vanadium-aluminum intermetallic compounds
Published in Analytical and bioanalytical chemistry (01-10-2002)“…V(5)Al(8) and V(3)Al intermetallics have been formed by interdiffusion, by annealing of sputtered V/Al-multilayers at 700 degrees C in vacuo; sapphire (102)…”
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Journal Article -
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Formation of niobium nitride by rapid thermal processing
Published in Spectrochimica acta. Part A, Molecular and biomolecular spectroscopy (01-09-2001)“…The formation of group V transition metal nitride films by means of rapid thermal processing (RTP) has been investigated. Here we focus on the nitridation of…”
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Journal Article -
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Nitridation of V5Al8 films with NH3 by Rapid Thermal Processing (RTP)
Published in Zeitschrift für anorganische und allgemeine Chemie (1950) (01-09-2003)“…V5Al8 films (thickness about 100 nm) were deposited on sapphire substrates by RF‐sputtering and nitridated with NH3 at 600‐1250 °C (1 min) in a RTP system. The…”
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Nitridation of vanadium in molecular nitrogen: a comparison of rapid thermal processing (RTP) and conventional furnace annealing
Published in Vacuum (14-05-2001)“…The nitridation processes of thin V films in molecular nitrogen at atmospheric pressure in a RTP-system, a conventional tube furnace and a high temperature in…”
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Journal Article Conference Proceeding -
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Formation of Transition Metal Nitrides by Rapid Thermal Processing (RTP)
Published in Physica status solidi. A, Applied research (01-01-2000)“…Rapid thermal processing (RTP) was used to prepare group‐5 transition metal (V, Nb, Ta) nitride films and to study the early stages of nitrogen incorporation…”
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Journal Article -
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Nitridation of V 5 Al 8 films with NH 3 by Rapid Thermal Processing (RTP)
Published in Zeitschrift für anorganische und allgemeine Chemie (1950) (01-09-2003)“…V 5 Al 8 films (thickness about 100 nm) were deposited on sapphire substrates by RF‐sputtering and nitridated with NH 3 at 600‐1250 °C (1 min) in a RTP system…”
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