Search Results - "Levin, M.N"

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  1. 1

    Aerosol deposition of thin-film solid electrolyte membranes for anode-supported solid oxide fuel cells by Erilin, I.S., Agarkov, D.A., Burmistrov, I.N., Pukha, V.E., Yalovenko, D.V., Lyskov, N.V., Levin, M.N., Bredikhin, S.I.

    Published in Materials letters (01-05-2020)
    “…•Fabrication routine of SOFCs with thin-film aerosol deposited solid electrolyte.•Annealed electrolyte shows dense structure without gas leaks and conductive…”
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    Journal Article
  2. 2

    Relationships between mechanical stability of the anode supports and electrochemical performance of intermediate-temperature SOFCs by Agarkova, E.A., Zadorozhnaya, O.Yu, Burmistrov, I.N., Yalovenko, D.V., Agarkov, D.A., Rabotkin, S.V., Solovyev, A.A., Nepochatov, Yu.K., Levin, M.N., Bredikhin, S.I.

    Published in Materials letters (15-11-2021)
    “…[Display omitted] •Anode supports for solid oxide fuel cells were fabricated by tape casting.•Anode supports were fabricated without pore-former.•Absence of…”
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    Journal Article
  3. 3

    Identification of volatile organic compounds by retention times and ion mobility spectra by Levin, M. N., Lantsuzskaya (Krisilova), E. V.

    “…Retention times are determined and ion mobility spectra are recorded for reference substances belonging to the homologous series of saturated aldehydes,…”
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    Journal Article
  4. 4
  5. 5

    Structural Synthesis of System of Remote Interrogation of Metering Devices by Repkina, N.G., Repkin, D.A., Levin, M.N.

    “…The relevance of the article is determined by the development of measuring instrument production, the expansion of their nomenclature and modernization, as…”
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    Conference Proceeding
  6. 6

    Magnetic-field induced generation of A-like centers in Cz-Si crystals by Levin, M.N., Zon, B.A.

    Published in Physics letters. A (1999)
    “…The effect of the constant magnetic-field induced generation of oxygen–vacancy defects in Czochralski-grown silicon crystals was detected for the first time…”
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    Journal Article
  7. 7

    X-ray and UV controlled adjustment of MOS VLSI circuits threshold voltages by Levin, M.N, Gitlin, V.R, Kadmensky, S.G, Ostrouhov, S.S, Pershenkov, V.S

    Published in Microelectronics and reliability (2001)
    “…Soft X-ray (∼10 keV) and near ultra-violet radiation based technique for precise adjustment of MOS devices and integrated circuit thresholds has been…”
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    Journal Article
  8. 8

    Use of preliminary ultraviolet and infrared illumination for diagnostics of MOS and bipolar devices radiation response by Pershenkov, V.S., Avdeev, S.V., Tsimbalov, A.S., Levin, M.N., Belyakov, V.V., Ivashin, D.V., Slesarev, A.Y., Bashin, A.Y., Zebrev, G.I., Ulimov, V.N., Emelianov, V.V.

    Published in Microelectronics and reliability (01-04-2002)
    “…The experimental results on the influence of UV and IR illumination and hydrogen ambient on the radiation response of metal-oxide-semiconductor (MOS) and…”
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    Journal Article
  9. 9

    The X-ray and UV controlled adjustment of MOSFET threshold voltage by Levin, M.N., Kadmensky, S.G., Pershenkov, V.S.

    “…The technique for precise adjustment of MOS-devices threshold voltages using X-ray and UV irradiation is presented. The adjustment is based on formation of…”
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    Conference Proceeding