Search Results - "Lentz, J.L."

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    Effects of oxide interface traps and transient enhanced diffusion on the process modeling of PMOS devices by Vuong, H.-H., Rafferty, C.S., Eshraghi, S.A., Lentz, J.L., Zeitzoff, P.M., Pinto, M.R., Hillenius, S.J.

    Published in IEEE transactions on electron devices (01-07-1996)
    “…We present a model which simulates the trapping of arsenic and boron dopants at the silicon-silicon dioxide interface, and demonstrate that this model gives…”
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    Journal Article
  2. 2

    An improved electron and hole mobility model for general purpose device simulation by Darwish, M.N., Lentz, J.L., Pinto, M.R., Zeitzoff, P.M., Krutsick, T.J., Hong Ha Vuong

    Published in IEEE transactions on electron devices (01-09-1997)
    “…A new, comprehensive, physically-based, semiempirical, local model for transverse-field dependent electron and hole mobility in MOS transistors is presented…”
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    Journal Article
  3. 3

    A 40Gb/s CWDM-TDM PON with a cyclic CWDM multiplexer/demultiplexer by Iannone, P.P., Reichmann, K.C., Doerr, C.R., Buhl, L.L., Cappuzzo, M.A., Chen, E.Y., Gomez, L.T., Johnson, J.E., Kanan, A.M., Lentz, J.L., McDonough, R.

    “…We demonstrate a 40-Gb/s hybrid CWDM-TDM PON with a novel remote node including a cyclic CWDM multiplexer/demultiplexer. The system uses commercially available…”
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    Conference Proceeding
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