Search Results - "Lentz, J.L."
-
1
Effects of oxide interface traps and transient enhanced diffusion on the process modeling of PMOS devices
Published in IEEE transactions on electron devices (01-07-1996)“…We present a model which simulates the trapping of arsenic and boron dopants at the silicon-silicon dioxide interface, and demonstrate that this model gives…”
Get full text
Journal Article -
2
An improved electron and hole mobility model for general purpose device simulation
Published in IEEE transactions on electron devices (01-09-1997)“…A new, comprehensive, physically-based, semiempirical, local model for transverse-field dependent electron and hole mobility in MOS transistors is presented…”
Get full text
Journal Article -
3
A 40Gb/s CWDM-TDM PON with a cyclic CWDM multiplexer/demultiplexer
Published in 2009 35th European Conference on Optical Communication (01-09-2009)“…We demonstrate a 40-Gb/s hybrid CWDM-TDM PON with a novel remote node including a cyclic CWDM multiplexer/demultiplexer. The system uses commercially available…”
Get full text
Conference Proceeding -
4
Spot-size-converted 1.3 /spl mu/m directly-modulated Fabry-Perot and distributed feedback lasers suitable for passive alignment and 2.5 gb/s operation at 85/spl deg/C
Published in International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) (2000)“…Fabry-Perot and distributed feedback spot size converted 1.3 /spl mu/m lasers are demonstrated with competitive performance (/spl sim/10 mA threshold, >0.30…”
Get full text
Conference Proceeding