Search Results - "Lenoir, Clément"

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    Near-Field Scanning Millimeter-Wave Microscope Operating Inside a Scanning Electron Microscope: Towards Quantitative Electrical Nanocharacterization by Polovodov, Petr, Théron, Didier, Lenoir, Clément, Deresmes, Dominique, Eliet, Sophie, Boyaval, Christophe, Dambrine, Gilles, Haddadi, Kamel

    Published in Applied sciences (01-03-2021)
    “…The main objectives of this work are the development of fundamental extensions to existing scanning microwave microscopy (SMM) technology to achieve…”
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    Journal Article
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    Automated and Robotic On-Wafer Probing Station by Mokhtari, Cerine, Lenoir, Clement, Sebbache, Mohamed, Haddadi, Kamel

    “…Emergent microwave and millimetre-wave technologies call for new and more accurate characterization techniques. In particular, repeatability of on-wafer…”
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    Conference Proceeding
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    Nanorobotic Integration with Millimeter-Waves: Advancing Precise Free-Space Sensing by Alsaleh, Nawal, Pomorski, Denis, Sebbache, Mohamed, Lenoir, Clement, Haddadi, Kamel

    “…This work proposes a novel approach to advance non-contact millimeter-wave sensing capabilities through the fusion of microwave characterization techniques…”
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    Conference Proceeding
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    Exploring Nanorobotics Integration with Microwave and Millimeter-Wave Techniques for Advanced On-wafer Measurement by Mokthari, Cerine, Lenoir, Clement, Sebbache, Mohamed, Boyaval, Christophe, Berthe, Maxime, Dambrine, Gilles, Haddadi, Kamel

    “…In the broader context of the electronics industry, the development of new on-wafer characterization techniques and instruments is imperative for precise…”
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    Conference Proceeding
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    Nanorobotics and Automatic On-Wafer Probe Station with Nanometer Positionning Accuracy by Mokhtari, Cerine, Seck, Daouda, Allal, Djamel, Lenoir, Clement, Sebbache, Mohamed, Berthe, Maxime, Haddadi, Kamel

    “…Precise and repeatable radiofrequency (RF) measurements call for innovative characterization techniques. In particular, the use of nanorobotics for on-wafer…”
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    Conference Proceeding
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    Nano-Positioning Test platform for Free-Space Six-Port Interferometric Distance Measurements by Alsaleh, Nawal, Pomorski, Denis, Sebbache, Mohamed, Lenoir, Clement, Haddadi, Kamel

    “…Continuous wave (CW) millimeter-wave radars have gained the interest from industry for accurate subwavelength distance measurements. In particular, the…”
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    Conference Proceeding
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    New Generation of On-Wafer Microwave Probe Station for Precision GSG Probing by Mokhtari, Cerine, Sebbache, Mohamed, Lenoir, CleMent, Boyaval, Christophe, Avramovic, Vanessa, Dambrine, Gilles, Haddadi, Kamel

    “…Accurate characterization of emergent RF extreme impedance micro-and nanoelectronic devices requires novel probing techniques to ensure the probe-to-pad…”
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    Conference Proceeding