Measuring the Size Dependence of Young's Modulus Using Force Modulation Atomic Force Microscopy
The dependence of the local Young's modulus of organic thin films on the size of the domains at the nanometer scale is systematically investigated. Using atomic force microscopy (AFM) based imaging and lithography, nanostructures with designed size, shape, and functionality are preengineered, e...
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| Published in: | The journal of physical chemistry. A, Molecules, spectroscopy, kinetics, environment, & general theory Vol. 110; no. 4; pp. 1382 - 1388 |
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| Main Authors: | , , , , |
| Format: | Journal Article |
| Language: | English |
| Published: |
United States
American Chemical Society
02-02-2006
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| Online Access: | Get full text |
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| Summary: | The dependence of the local Young's modulus of organic thin films on the size of the domains at the nanometer scale is systematically investigated. Using atomic force microscopy (AFM) based imaging and lithography, nanostructures with designed size, shape, and functionality are preengineered, e.g., nanostructures of octadecanethiols inlaid in decanethiol self-assembled monolayers (SAMs). These nanostructures are characterized using AFM, followed by force modulation spectroscopy and microscopy measurements. Young's modulus is then extracted from these measurements using a continuum mechanics model. The apparent Young's modulus is found to decrease nonlinearly with the decreasing size of these nanostructures. This systematic study presents conclusive evidence of the size dependence of elasticity in the nanoregime. The approach utilized may be applied to study the size-dependent behavior of various materials and other mechanical properties. |
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| Bibliography: | istex:974D8F27AFD6FF95C1E4E1DA26BC4CEA06C78FC0 Part of the special issue “William Hase Festschrift”. ark:/67375/TPS-LXB4LS62-3 ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
| ISSN: | 1089-5639 1520-5215 |
| DOI: | 10.1021/jp0544540 |