Search Results - "Lee, Zhongbo"

Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV by Linck, Martin, Hartel, Peter, Uhlemann, Stephan, Kahl, Frank, Müller, Heiko, Zach, Joachim, Haider, Max, Niestadt, Marcel, Bischoff, Maarten, Biskupek, Johannes, Lee, Zhongbo, Lehnert, Tibor, Börrnert, Felix, Rose, Harald, Kaiser, Ute

“…Atomic resolution in transmission electron microscopy of thin and light-atom materials requires a rigorous reduction of the beam energy to reduce knockon…”
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Towards quantitative treatment of electron pair distribution function by Gorelik, Tatiana E., Neder, Reinhard, Terban, Maxwell W., Lee, Zhongbo, Mu, Xiaoke, Jung, Christoph, Jacob, Timo, Kaiser, Ute

“…The pair distribution function (PDF) is a versatile tool to describe the structure of disordered and amorphous materials. Electron PDF (ePDF) uses the…”
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Numerical correction of anti-symmetric aberrations in single HRTEM images of weakly scattering 2D-objects by Lehtinen, Ossi, Geiger, Dorin, Lee, Zhongbo, Whitwick, Michael Brian, Chen, Ming-Wei, Kis, Andras, Kaiser, Ute

“…Here, we present a numerical post-processing method for removing the effect of anti-symmetric residual aberrations in high-resolution transmission electron…”
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Lattice contrast in the core-loss EFTEM signal of graphene by Mohn, Michael J., Biskupek, Johannes, Lee, Zhongbo, Rose, Harald, Kaiser, Ute

“…•Cc/Cs correction enables lattice contrast in ionization-edge EFTEM of graphene•C-K-edge EFTEM images of graphene can show bright-atom and dark-atom…”
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Efficient first principles simulation of electron scattering factors for transmission electron microscopy by Susi, Toma, Madsen, Jacob, Ludacka, Ursula, Mortensen, Jens Jørgen, Pennycook, Timothy J., Lee, Zhongbo, Kotakoski, Jani, Kaiser, Ute, Meyer, Jannik C.

“…•A new method to generate ab initio electrostatic potentials when describing the core electrons by projector functions.•Efficient quantitative image…”
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Electron-Beam-Driven Structure Evolution of Single-Layer MoTe2 for Quantum Devices by Lehnert, Tibor, Ghorbani-Asl, Mahdi, Köster, Janis, Lee, Zhongbo, Krasheninnikov, Arkady V, Kaiser, Ute

“…The 40 kV high-resolution transmission electron microscopy (TEM) experiments are performed to understand defect formation and evolution of their atomic…”
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Electron-Beam-Driven Structure Evolution of Single-Layer MoTe 2 for Quantum Devices by Lehnert, Tibor, Ghorbani-Asl, Mahdi, Köster, Janis, Lee, Zhongbo, Krasheninnikov, Arkady V., Kaiser, Ute

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Efficient first principles simulation of electron scattering factors for transmission electron microscopy by Susi, Toma, Madsen, Jacob, Ludacka, Ursula, Mortensen, Jens Jørgen, Pennycook, Timothy J, Lee, Zhongbo, Kotakoski, Jani, Kaiser, Ute, Meyer, Jannik C

“…Electron microscopy is a powerful tool for studying the properties of materials down to their atomic structure. In many cases, the quantitative interpretation…”
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Numerical correction of anti-symmetric aberrations in single HRTEM images of weakly scattering 2D-objects by Lehtinen, Ossi, Geiger, Dorin, Lee, Zhongbo, Whitwick, Michale B, Chen, Ming-Wei, Kis, Andras, Kaiser, Ute

“…Here, we present a numerical post-processing method for removing the effect of anti-symmetric residual aberrations in high-resolution transmission electron…”
Get full text