Control levels of Sin3 histone deacetylase for spontaneous and UV-induced mutagenesis in yeasts Saccharomyces cerevisiae

SIN3 gene product operates as a repressor for a huge amount of genes in Saccharomyces cerevisiae. Sin3 protein with a mass of about 175 kDa is a member of the RPD3 protein complex with an assessed mass of greater than 2 million Da. It was previously shownthat RPD3 gene mutations influence recombinat...

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Bibliographic Details
Published in:	Genetika Vol. 50; no. 1; p. 5
Main Authors:	Lebovka, I Iu, Kozhina, T N, Fedorova, I V, Peshekhonov, V T, Evstiukhina, T A, Chernenkov, A Iu, Korolev, V G
Format:	Journal Article
Language:	Russian
Published:	Russia (Federation) 01-01-2014
Subjects:	DNA Repair DNA Replication - genetics DNA Replication - radiation effects Gene Expression Regulation, Fungal - radiation effects Histone Deacetylases - genetics Mutagenesis - genetics Mutagenesis - radiation effects Mutation Repressor Proteins - genetics Saccharomyces cerevisiae - genetics Saccharomyces cerevisiae Proteins - genetics Transcription, Genetic Ultraviolet Rays
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Summary:	SIN3 gene product operates as a repressor for a huge amount of genes in Saccharomyces cerevisiae. Sin3 protein with a mass of about 175 kDa is a member of the RPD3 protein complex with an assessed mass of greater than 2 million Da. It was previously shownthat RPD3 gene mutations influence recombination and repair processes in S. cerevisiae yeasts. We studied the impacts of the sin3 mutation on UV-light sensitivity and UV-induced mutagenesis in budding yeast cells. The deletion ofthe SIN3 gene causes weak UV-sensitivity of mutant budding cells as compared to the wild-type strain. These results show that the sin3 mutation decreases both spontaneous and UV-induced levels of levels. This fact is hypothetically related to themalfunction of ribonucleotide reductase activity regulation, which leads to a decrease in the dNTP pool and the inaccurate error-prone damage bypass postreplication repair pathway, which in turn provokes a reduction in the incidence of mutations.
ISSN:	0016-6758