Search Results - "Le Rhun, G."

In-situ X-ray diffraction on functional thin films using a laboratory source during electrical biasing by Allouche, B., Gueye, I., Rhun, G. Le, Gergaud, P., Vaxelaire, N.

“…A methodology that allows the quantification of structural changes in functional thin films during the application of external electrical field is reported…”
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Biaxial Piezoelectric MEMS Mirrors with Low Absorption Coating for 1550 nm Long-Range LIDAR by Mollard, L, Riu, J, Royo, S, Dieppedale, C, Hamelin, A, Koumela, A, Verdot, T, Frey, L, Le Rhun, G, Castellan, G, Licitra, C

“…This paper presents the fabrication and characterization of a biaxial MEMS (MicroElectroMechanical System) scanner based on PZT (Lead Zirconate Titanate) which…”
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Correlation between electric-field-induced phase transition and piezoelectricity in lead zirconate titanate films by Kovacova, V., Vaxelaire, N., Le Rhun, G., Gergaud, P., Schmitz-Kempen, T., Defay, E.

“…We observed that electric field induces phase transition from tetragonal to rhombohedral in polycrystalline morphotropic lead zirconate titanate (PZT) films,…”
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Chemistry of surface nanostructures in lead precursor-rich PbZr0.52Ti0.48O3 sol–gel films by Gueye, I., Le Rhun, G., Gergaud, P., Renault, O., Defay, E., Barrett, N.

“…[Display omitted] •We have studied the effect of lead excess on the surface of PZT sol–gel films.•For low lead excess (10%) nanostructured surface phase is…”
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Pyroelectricity of Pb(Zr0.52Ti0.48)O3 films grown by sol–gel process on silicon by Moalla, R., Le Rhun, G., Defay, E., Baboux, N., Sebald, G., Bachelet, R.

“…Pyroelectric Pb(Zr0.52Ti0.48)O3 films have been grown by sol–gel process on Si(001). Intrinsic pyroelectric coefficient has been measured through ferroelectric…”
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Piezoelectric nanoelectromechanical resonators based on aluminum nitride thin films by Karabalin, R. B., Matheny, M. H., Feng, X. L., Defaÿ, E., Le Rhun, G., Marcoux, C., Hentz, S., Andreucci, P., Roukes, M. L.

“…We demonstrate piezoelectrically actuated, electrically tunable nanomechanical resonators based on multilayers containing a 100-nm-thin aluminum nitride (AlN)…”
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Chemistry of surface nanostructures in lead precursor-rich PbZr 0.52 Ti 0.48 O 3 sol-gel films by Gueye, I, Le Rhun, G, Gergaud, P, Renault, O, Defay, E, Barrett, N

“…We present a study of the chemistry of the nanostructured phase at the surface of lead zirconium titanate PbZr 0.52 Ti 0.48 O 3 (PZT) films synthesized by…”
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Ferroelastic relaxation at 20 GHz evidenced by large frequency range picosecond acoustics by Devos, A., Casset, F., Le Rhun, G., Emery, P., Fanget, S., Defay, E.

“…We present a method to perform elastic measurements on a thin-film as a function of frequency between a few GHz and a few hundred GHz. The technique is mainly…”
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Fatigue properties of oriented PZT ferroelectric thin films by Rhun, G. Le, Poullain, G., Bouregba, R., Leclerc, G.

“…Oriented PZT thin films with Zr/Ti ratio of 60/40 were prepared using a multi-target R.F. sputtering system. The films were (1 0 0) or (1 1 1) oriented when…”
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Intrinsic Ferroelectric Properties of Strained Tetragonal PbZr0.2Ti0.8O3 Obtained on Layer-by-Layer Grown, Defect-Free Single-Crystalline Films by Vrejoiu, I., Le Rhun, G., Pintilie, L., Hesse, D., Alexe, M., Gösele, U.

“…Ferroelectric single–crystalline PbZr0.2Ti0.8O3 thin films, free from extended defects, are grown by pulsed laser deposition onto vicinal SrTiO3(001) single…”
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Piezoelectric response hysteresis in the presence of ferroelastic 90° domain walls by Le Rhun, G., Vrejoiu, I., Alexe, M.

“…Piezoelectric response hysteresis curves of Pb(Zr0.2Ti0.8)O3-based capacitors have been measured by piezoresponse force microscopy. The piezoelectric…”
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Influence of Orientation and Oxygen Content on Electrical Properties of In Situ Deposited PZT Thin Films by Rhun, G. Le, Poullain, G., Bouregba, R., Vilquin, B.

“…(100) and (001) oriented Pb(Zr x Ti 1 m x )O 3 films with x = 0.5 and 0.7 have been grown in situ at 500°C on Pt electrode by RF sputtering. The influence of…”
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Polarization Offsets of Non Graded and Graded Ferroelectric Films by Bouregba, R., Rhun, G. Le, Poullain, G.

“…Shifts of hysteresis loops along polarization axis are observed on non graded Pb(Zr x ,Ti 1-x )O 3 ferroelectric films using a Sawyer-Tower circuit. The…”
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Stress optic modulator using thin-film PZT for LIDAR applications by Casset, F., Colin, M., Fowler, D., Desloges, B., Malhouitre, S., Hilt, T., Le Rhun, G., Dieppedale, C., Pollet, O., Rabaud, W.

“…This paper presents the development of a stress optic modulator which can be implemented in an optical sensor system such as LIDAR. In LIDAR, an Optical Phased…”
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Integrated metallic gauge in a piezoelectric cantilever by Cueff, M., Defaÿ, E., Le Rhun, G., Rey, P., Perruchot, F., Suhm, A., Aïd, M.

“…In this study, a self-sensitive piezoelectric cantilever with a new design for sensing is presented. Micro-cantilevers were actuated by a 120nm-thick Lead…”
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Epitaxial growth and electrical measurement of single crystalline Pb(Zr0.52Ti0.48)O3 thin film on Si(001) for micro-electromechanical systems by Yin, S., Niu, G., Vilquin, B., Gautier, B., Le Rhun, G., Defay, E., Robach, Y.

“…We report in this work the epitaxial growth and the electrical characteristics of single crystalline Pb(Zr0.52Ti0.48)O3 (PZT) thin film on SrTiO3(STO)-buffered…”
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Graded ferroelectric thin films: Possible origin of the shift along the polarization axis by Poullain, G., Bouregba, R., Vilquin, B., Le Rhun, G., Murray, H.

“…Hysteresis measurements performed on graded Pt/lead zirconate titanate (PZT)/Pt structures with well oxygenated PZT films do not display any shift along the…”
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Effect of in situ Pt bottom electrode deposition and of Pt top electrode preparation on PZT thin films properties by Vilquin, B, Le Rhun, G, Bouregba, R, Poullain, G, Murray, H

“…Highly (1 0 0) oriented Pb(Zr, Ti)O 3 (PZT) thin films have been grown in situ at 500 °C on Pt electrode by rf magnetron sputtering. The Pt bottom electrode…”
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Threading dislocations in epitaxial ferroelectric PbZr0.2Ti0.8O3 films and their effect on polarization backswitching by Vrejoiu, I., Le Rhun, G., Zakharov, N. D., Hesse, D., Pintilie, L., Alexe, M.

“…The existence of threading dislocations in ferroelectric heterostructures has been frequently reported. However, their origin and impact on the ferroelectric…”
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Response to “Comment on ‘Graded ferroelectric thin films: Possible origin of the shift along the polarization axis’ ” [Appl. Phys. Lett. 83 , 809 (2003)] by Poullain, G., Bouregba, R., Vilquin, B., Le Rhun, G., Murray, H.

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