Search Results - "Lavrentjev, K. V."
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The study of the sensitivity of CMOS integrated circuits to single event latchup using pulsed bremsstrahlung
Published in 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01-09-2016)“…The features of latchup triggering in CMOS integrated circuits (ICs) induced by high-intensity pulsed bremsstrahlung (PB) and heavy charged particles (HCP) are…”
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Conference Proceeding -
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The use of high-energy ion synchrotron at the ITEP for SEE testing of modern electronic components
Published in 2011 12th European Conference on Radiation and Its Effects on Components and Systems (01-09-2011)“…The possibilities of using of high-energy heavy ion synchrotron at the Institute of Theoretical and Experimental Physics, Moscow, for single event effects…”
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Conference Proceeding