Search Results - "Laraba, Asma"
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A 65nm CMOS Ramp Generator Design and its Application Towards a BIST Implementation of the Reduced-Code Static Linearity Test Technique for Pipeline ADCs
Published in Journal of electronic testing (01-08-2016)“…This work presents an efficient on-chip ramp generator targeting to facilitate the deployment of Built-In Self-Test (BIST) techniques for ADC static linearity…”
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Journal Article -
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A 1.24-pJ/b 112-Gb/s (870 Gb/s/Mm) Transceiver for In-Package Links in 7-nm FinFET
Published in IEEE journal of solid-state circuits (01-04-2022)“…This article describes the design of a 1.24-pJ/b 112-Gb/s PAM4 transceiver test chip in 7-nm FinFET for in-package die-to-die communication. The receiver…”
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Journal Article -
3
Exploiting Pipeline ADC Properties for a Reduced-Code Linearity Test Technique
Published in IEEE transactions on circuits and systems. I, Regular papers (01-10-2015)“…Testing the static performances of high-resolution analog-to-digital converters (ADCs) consumes long test times that are disproportionately high with respect…”
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Journal Article -
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A 112-134-Gb/s PAM4 Receiver Using a 36-Way Dual-Comparator TI-SAR ADC in 7-nm FinFET
Published in IEEE solid-state circuits letters (2020)“…This letter describes a 112-134-Gb/s PAM-4 wireline receiver (Rx) designed and fabricated in 7-nm CMOS FinFET technology. The Rx includes a T-Coil-assisted…”
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Journal Article -
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16.1 A 13b 4GS/s digitally assisted dynamic 3-stage asynchronous pipelined-SAR ADC
Published in 2017 IEEE International Solid-State Circuits Conference (ISSCC) (01-02-2017)“…In recent years, the need for high performance RF sampling ADCs has driven impressive developments of pipelined-SAR and pipelined ADCs, all supported by…”
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Conference Proceeding -
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Reduced code linearity testing of pipeline adcs in the presence of noise
Published in 2013 IEEE 31st VLSI Test Symposium (VTS) (01-01-2013)“…Reduced code testing of a pipeline analog-to-digital converter (ADC) consists of inferring the complete static transfer function by measuring the width of a…”
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Conference Proceeding -
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A 1.24pJ/b 112Gb/s (870Gbps/mm) Transceiver for In-package Links in 7nm FinFET
Published in 2021 Symposium on VLSI Circuits (13-06-2021)“…This paper describes the design of a 1.24pJ/b 112Gb/s PAM4 transceiver testchip in 7nm FinFET for in-package die-to-die communication. The receiver supports…”
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Conference Proceeding -
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A 112GB/S PAM4 Wireline Receiver Using a 64-Way Time-Interleaved SAR ADC in 16NM FinFET
Published in 2018 IEEE Symposium on VLSI Circuits (01-06-2018)“…A 112Gb/s PAM4 wireline receiver testchip is implemented in 16nm FinFET. The receiver consists of continuous-time linear equalizers, a peaking capacitance…”
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Conference Proceeding -
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Enhanced reduced code linearity test technique for multi-bit/stage pipeline ADCs
Published in 2012 17th IEEE European Test Symposium (ETS) (01-05-2012)“…The reduced code linearity test technique for pipeline ADCs consists in measuring some judiciously selected codes which contain the information about the…”
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Conference Proceeding -
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Reduced-Code Linearity Testing of Pipeline ADCs
Published in IEEE design and test (01-12-2013)“…Pipeline analog-to-digital converters have a repetitive structure, which allows analyzing their static performances by targeting only a small subset of codes…”
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Magazine Article