Search Results - "Laraba, Asma"

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  1. 1

    A 65nm CMOS Ramp Generator Design and its Application Towards a BIST Implementation of the Reduced-Code Static Linearity Test Technique for Pipeline ADCs by Renaud, Guillaume, Barragan, Manuel J., Laraba, Asma, Stratigopoulos, Haralampos-G., Mir, Salvador, Le-Gall, Hervé, Naudet, Hervé

    Published in Journal of electronic testing (01-08-2016)
    “…This work presents an efficient on-chip ramp generator targeting to facilitate the deployment of Built-In Self-Test (BIST) techniques for ADC static linearity…”
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    Journal Article
  2. 2

    A 1.24-pJ/b 112-Gb/s (870 Gb/s/Mm) Transceiver for In-Package Links in 7-nm FinFET by Poon, Chi Fung, Zhang, Wenfeng, Cho, Junho, Ma, Shaojun, Wang, Yipeng, Cao, Ying, Laraba, Asma, Ho, Eugene, Lin, Winson, Wu, Daniel Zhaoyin, Tan, Kee Hian, Upadhyaya, Parag, Frans, Yohan

    Published in IEEE journal of solid-state circuits (01-04-2022)
    “…This article describes the design of a 1.24-pJ/b 112-Gb/s PAM4 transceiver test chip in 7-nm FinFET for in-package die-to-die communication. The receiver…”
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    Journal Article
  3. 3

    Exploiting Pipeline ADC Properties for a Reduced-Code Linearity Test Technique by Laraba, Asma, Stratigopoulos, Haralampos-G, Mir, Salvador, Naudet, Herve

    “…Testing the static performances of high-resolution analog-to-digital converters (ADCs) consumes long test times that are disproportionately high with respect…”
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    Journal Article
  4. 4
  5. 5

    16.1 A 13b 4GS/s digitally assisted dynamic 3-stage asynchronous pipelined-SAR ADC by Vaz, Bruno, Lynam, Adrian, Verbruggen, Bob, Laraba, Asma, Mesadri, Conrado, Boumaalif, Ali, Mcgrath, John, Kamath, Umanath, De Le Torre, Ronnie, Manlapat, Alvin, Breathnach, Daire, Erdmann, Christophe, Farley, Brendan

    “…In recent years, the need for high performance RF sampling ADCs has driven impressive developments of pipelined-SAR and pipelined ADCs, all supported by…”
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    Conference Proceeding
  6. 6

    Reduced code linearity testing of pipeline adcs in the presence of noise by Laraba, A., Stratigopoulos, H., Mir, S., Naudet, H., Bret, G.

    Published in 2013 IEEE 31st VLSI Test Symposium (VTS) (01-01-2013)
    “…Reduced code testing of a pipeline analog-to-digital converter (ADC) consists of inferring the complete static transfer function by measuring the width of a…”
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    Conference Proceeding
  7. 7

    A 1.24pJ/b 112Gb/s (870Gbps/mm) Transceiver for In-package Links in 7nm FinFET by Poon, Chi Fung, Zhang, Wenfeng, Cho, Junho, Ma, Shaojun, Wang, Yipeng, Cao, Ying, Laraba, Asma, Ho, Eugene, Lin, Winson, Wu, Daniel, Tan, Kee Hian, Upadhyaya, Parag, Frans, Yohan

    Published in 2021 Symposium on VLSI Circuits (13-06-2021)
    “…This paper describes the design of a 1.24pJ/b 112Gb/s PAM4 transceiver testchip in 7nm FinFET for in-package die-to-die communication. The receiver supports…”
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    Conference Proceeding
  8. 8

    A 112GB/S PAM4 Wireline Receiver Using a 64-Way Time-Interleaved SAR ADC in 16NM FinFET by Hudner, James, Carey, Declan, Casey, Ronan, Hearne, Kay, de Abreu Farias Neto, Pedro Wilson, Chlis, Ilias, Erett, Marc, Chi Fung Poon, Laraba, Asma, Hongtao Zhang, Chaitanya Ambatipudi, Sai Lalith, Mahashin, David, Upadhyaya, Parag, Frans, Yohan, Chang, Ken

    Published in 2018 IEEE Symposium on VLSI Circuits (01-06-2018)
    “…A 112Gb/s PAM4 wireline receiver testchip is implemented in 16nm FinFET. The receiver consists of continuous-time linear equalizers, a peaking capacitance…”
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    Conference Proceeding
  9. 9

    Enhanced reduced code linearity test technique for multi-bit/stage pipeline ADCs by Laraba, A., Stratigopoulos, H-G, Mir, S., Naudet, H., Forel, C.

    “…The reduced code linearity test technique for pipeline ADCs consists in measuring some judiciously selected codes which contain the information about the…”
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    Conference Proceeding
  10. 10

    Reduced-Code Linearity Testing of Pipeline ADCs by Laraba, Asma, Stratigopoulos, Haralampos-G, Mir, Salvador, Naudet, Herve, Bret, Gerard

    Published in IEEE design and test (01-12-2013)
    “…Pipeline analog-to-digital converters have a repetitive structure, which allows analyzing their static performances by targeting only a small subset of codes…”
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    Magazine Article