Search Results - "Lanford, WA"

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  1. 1

    Fourier transform infrared spectroscopy investigation of chemical bonding in low-k a-SiC:H thin films by King, S.W., French, M., Bielefeld, J., Lanford, W.A.

    Published in Journal of non-crystalline solids (15-07-2011)
    “…Fourier Transform Infrared (FTIR) Spectroscopy has long been utilized as an analytical technique for qualitatively determining the presence of various…”
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    Mass and bond density measurements for PECVD a-SiCx:H thin films using Fourier transform-infrared spectroscopy by King, S W, Bielefeld, J, French, M, Lanford, WA

    Published in Journal of non-crystalline solids (01-11-2011)
    “…The absolute concentration of chemical bonds in Plasma Enhanced Chemically Vapor Deposited (PECVD) a-SiCx:H thin films have been determined via combining…”
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    Increased osteoblast adhesion on titanium-coated hydroxylapatite that forms CaTiO3 by Webster, Thomas J., Ergun, Celaletdin, Doremus, Robert H., Lanford, William A.

    “…CaTiO3 is a strong candidate to form at the interface between hydroxylapatite (HA) and titanium implants during many coating procedures. However, few studies…”
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  5. 5

    Interface reaction/diffusion in hydroxylapatite-coated SS316L and CoCrMo alloys by Ergun, C., Doremus, R.H., Lanford, W.A.

    Published in Acta materialia (20-09-2004)
    “…Hydroxylapatite is generally used as a coating material on the metallic substrates, such as titanium alloys, stainless steels and CoCrMo alloys to take the…”
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    Low-temperature passivation of copper by doping with Al or Mg by Lanford, W.A., Ding, P.J., Wang, W., Hymes, S., Muraka, S.P.

    Published in Thin solid films (15-06-1995)
    “…The doping of copper with Al and Mg is discussed as a method of passivating the exposed surface of copper films proposed for use as a conductor in…”
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  7. 7

    Rutherford Backscattering to Study the Near-Surface Region of Volatile Liquids and Solids by Krieger, Ulrich K., Huthwelker, Thomas, Daniel, Christian, Weers, Uwe, Peter, Thomas, Lanford, William A.

    “…Here we describe the use of Rutherford backscattering spectrometry (RBS) to measure quantitative in situ elemental profiles with high depth resolution, online…”
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    Oxidation resistant high conductivity copper films by Ding, P. J., Lanford, W. A., Hymes, S., Murarka, S. P.

    Published in Applied physics letters (23-05-1994)
    “…The properties of thin films of Cu-doped with different percentages of Mg were investigated. It was found that as-deposited films of Cu (2 at. % Mg) oxidize…”
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  10. 10

    Weathering of glass in moist and polluted air by Cummings, K., Lanford, W.A., Feldmann, M.

    “…During the present century, stained glass windows in European cathedrals have shown a rapid deterioration due to weathering. It is widely believed that this…”
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    Use of reference samples for more accurate RBS analyses by Lanford, W.A., Pelicon, P., Zorko, B., Budnar, M.

    “…While one of the primary assets of RBS analysis is that it is quantitative without use of reference samples, for certain types of analyses the precision of the…”
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  12. 12

    Capacitance–voltage, current–voltage, and thermal stability of copper alloyed with aluminium or magnesium by Suwwan de Felipe, T, Murarka, S.P, Bedell, S, Lanford, W.A

    Published in Thin solid films (14-12-1998)
    “…Copper alloyed with small amounts of aluminium or magnesium has recently been suggested as a promising material for interconnect applications in silicon…”
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  13. 13

    Effects of process variables on properties and composition of a-Si:C:H films by Moskowitz, I. L., Lanford, W. A., Babu, S. V.

    Published in Journal of materials research (01-01-2003)
    “…Physical properties of a-Si:C:H films, including composition, optical constants, microhardness, and surface energy, were investigated. A factorial experimental…”
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  14. 14

    RBS analysis of trace gas uptake on ice by Huthwelker, T., Krieger, U.K., Weers, U., Peter, Th, Lanford, W.A.

    “…Uptake and reaction of acidic trace gases (HCl, HBr, SO 2,…) on atmospheric aerosols is of key interest to environmental problems such as ozone depletion and…”
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    Compact broad range magnetic spectrometer for use in ion beam analysis by Lanford, WA, Anderberg, B, Enge, H, Hjorvarsson, B

    “…A compact magnetic spectrometer for high resolution He RBS and other types of ion beam analysis (IBA) has been designed and is currently under construction…”
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    Compact broad range magnetic spectrometer for use in ion beam analysis by Lanford, W.A., Anderberg, B., Enge, H., Hjorvarsson, B.

    “…A compact magnetic spectrometer for high resolution He RBS and other types of ion beam analysis (IBA) has been designed and is currently under construction…”
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    Adsorption of hydrogen on the Pt(111) surface from low-energy recoil scattering by Umezawa, K., Ito, T., Asada, M., Nakanishi, S., Ding, P., Lanford, W.A., Hjörvarsson, B.

    Published in Surface science (08-10-1997)
    “…We have shown that low-energy recoil scattering (LERS) can be used to detect hydrogen on a Pt(111) surface at 150 K and that this method provides a direct…”
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    Characteristics of Albany’s compact high resolution magnetic spectrometer by Lanford, W.A., Bedell, S., Amadon, S., Haberl, A., Skala, W., Hjorvarsson, B.

    “…The performance of the Albany high-resolution magnetic spectrometer is described. This spectrometer is seen to be capable of an energy resolution of…”
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    Alloying of copper for use in microelectronic metallization by Lanford, W.A., Ding, P.J., Wang, Wei, Hymes, S., Murarka, S.P.

    Published in Materials chemistry and physics (01-08-1995)
    “…Although copper offers low resistivity and high electromigration resistance, its diffusion (under electrical bias) into surrounding dielectric layers, poor…”
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    Techniques for measuring the composition of hydrogenated amorphous silicon–germanium alloys by Nelson, Brent P, Xu, Yueqin, Webb, John D, Mason, Alice, Reedy, Robert C, Gedvilas, Lynn M, Lanford, William A

    Published in Journal of non-crystalline solids (01-05-2000)
    “…We grow hydrogenated amorphous silicon–germanium alloys by the hot-wire chemical vapor deposition (HWCVD) technique at deposition rates between 0.5 and 1.4 nm…”
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