Search Results - "Ladani, Leila J."
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Numerical analysis of thermo-mechanical reliability of through silicon vias (TSVs) and solder interconnects in 3-dimensional integrated circuits
Published in Microelectronic engineering (01-02-2010)“…Three-dimensional integrated circuit (3D IC) is a promising technology in today’s IC packaging industry. Since the technology is in infancy stages, many…”
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Journal Article -
2
Stress analysis of 3-dimensional IC package as function of structural design parameters
Published in Microelectronic engineering (01-10-2010)“…Solid Liquid Inter-Diffusion (SLID) is a technology that has recently been utilized to fabricate 3D ICs. Since application of this technology is in its infancy…”
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Journal Article -
3
A meso-scale damage evolution model for cyclic fatigue of viscoplastic materials
Published in International journal of fatigue (01-04-2009)“…This study presents an approach to predict the degree of material degradation and the resulting changes in elastic, plastic and creep constitutive properties…”
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Journal Article -
4
Microstructure and mechanical strength of snag-based solid liquid inter-diffusion bonds for 3 dimensional integrated circuits
Published in Thin solid films (30-06-2010)“…Solid liquid inter-diffusion is a bonding technology that has been proposed at microscale for fabrication of ultrafine interconnects in high density and 3…”
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Journal Article -
5
An anisotropic mechanical fatigue damage evolution model for Pb-free solder materials
Published in Mechanics of materials (01-07-2009)“…Evaluating state of damage in a ductile material as it experiences mechanical fatigue and cyclic loading poses much complexity, and has been the subject of…”
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Journal Article -
6
Effect of Selected Process Parameters on Durability and Defects in Surface-Mount Assemblies for Portable Electronics
Published in IEEE transactions on electronics packaging manufacturing (01-01-2008)“…This paper presents a systematic approach to study the effect of manufacturing variables on the creation of defects and the effect of those defects on the…”
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Journal Article -
7
Damage initiation and propagation modeling using Energy Partitioning Damage Evolution model for Pb-free solder materials
Published in 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (01-06-2010)“…Thermo-mechanical fatigue and damage has always been an issue for solder joint materials used in micro-electronic devices. Accurate prediction of the damage…”
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Conference Proceeding -
8
Probabilistic Design Approach for Cyclic Fatigue Life Prediction of Microelectronic Interconnects
Published in IEEE transactions on advanced packaging (01-05-2010)“…Deterministic approaches may predict the life of solder joint interconnects used in microelectronic devices far different from the test results and field…”
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Journal Article -
9
IMC growth in solid-liquid interdifussion bonds
Published in 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (01-06-2010)“…3D ICs is a promising new technology that has many advantages over traditional planar packages. To take advantage of this technology, new bonding techniques…”
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Conference Proceeding -
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Stochastic finite element modeling of fatigue damage evolution for visco-plastic materials in micro-electronics
Published in 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (01-06-2010)“…Thermo-mechanical fatigue is one of the main failure mechanisms of solder joints in electronic devices. Deterministic approaches that are typically used to…”
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Conference Proceeding -
11
Reliability estimation for large-area solder joints using explicit modeling of damage
Published in IEEE transactions on device and materials reliability (01-06-2008)“…The issues of available cyclic fatigue models in life prediction of large-area solder joints using finite-element analysis (FEA) are discussed. In this paper,…”
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Magazine Article -
12
Interaction Effect of Voids and Standoff Height on Thermomechanical Durability of BGA Solder Joints
Published in IEEE transactions on device and materials reliability (01-09-2009)“…This paper documents simulation studies on the interactive effect of standoff height and void volume on the thermomechanical durability of ball-grid-array…”
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Magazine Article