Search Results - "Lachal, L"

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  1. 1

    Influence of dual Ge/C pre-amorphization implantation on the Ni1−xPtxSi phase nucleation and growth mechanisms by Guillemin, S., Gergaud, P., Bernier, N., Lachal, L., Mazen, F., Jannaud, A., Nemouchi, F., Rodriguez, Ph

    Published in Microelectronic engineering (01-05-2021)
    “…The impact of dual Ge/C pre-amorphization implantation (PAI) processes on the Ni0.9Pt0.1(7 nm)/Si system phase sequence has been investigated by advanced X-ray…”
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    Journal Article
  2. 2

    Mobility impairment is associated with urge but not stress urinary incontinence in community‐dwelling older women: results from the Ossébo study by Fritel, X, Lachal, L, Cassou, B, Fauconnier, A, Dargent‐Molina, P

    “…Objective To assess the association between functional limitations related to mobility and urinary incontinence (UI) in elderly women. Design An observational…”
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    Journal Article
  3. 3

    Impact of the pre amorphization by Ge implantation on Ni0.9Pt0.1 silicide by Delwail, C., Joblot, S., Mazen, F., Abbate, F., Lachal, L., Milesi, F., Bertoglio, M., Papon, A.M., Gregoire, M., Rodriguez, P.H., Mangelinck, D.

    Published in Microelectronic engineering (01-02-2022)
    “…The impact of the Pre Amorphization by Ge Implantation (PAI) on Ni0.9Pt0.1 silicide is studied. Reactions between a 10 nm thick Ni0.9Pt0.1 film and Si (100)…”
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    Journal Article
  4. 4

    A comparative study of C, N and Xe pre-amorphization implantation processes for improving the thermal stability of NiSi films by Guillemin, S., Lachal, L., Gergaud, P., Grenier, A., Nemouchi, F., Mazen, F., Rodriguez, Ph

    Published in Microelectronic engineering (01-08-2024)
    “…In this paper, a comparative study of C-, N- and Xe-based pre-amorphization implantation (PAI) processes is proposed. The impact of the use of such processes…”
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    Journal Article
  5. 5
  6. 6

    Impact of the pre amorphization by Ge implantation on Ni$_{0.9}$Pt$_{0.1}$ silicide by Delwail, C., Joblot, S., Mazen, F., Abbate, F., Lachal, L., Milesi, F., Bertoglio, M., Papon, A.M., Gregoire, M., Rodriguez, P.H., Mangelinck, D., Mangelinck, Dominique

    Published in Microelectronic engineering (01-02-2022)
    “…The impact of the Pre Amorphization by Ge Implantation (PAI) on Ni0.9Pt0.1 silicide is studied. Reactions between a 10 nm thick Ni0.9Pt0.1 film and Si (100)…”
    Get full text
    Journal Article
  7. 7

    Mobility impairment is associated with urge but not stress urinary incontinence in community‐dwelling older women: results from the O ssébo study by Fritel, X, Lachal, L, Cassou, B, Fauconnier, A, Dargent‐Molina, P

    “…Objective To assess the association between functional limitations related to mobility and urinary incontinence ( UI ) in elderly women. Design An…”
    Get full text
    Journal Article
  8. 8

    Improvement of HfO2 based RRAM array performances by local Si implantation by Barlas, M., Grossi, A., Grenouillet, L., Vianello, E., Nolot, E., Vaxelaire, N., Blaise, P., Traore, B., Coignus, J., Perrin, F., Crochemore, R., Mazen, F., Lachal, L., Pauliac, S., Pellissier, C., Bernasconi, S., Chevalliez, S., Nodin, J. F., Perniola, L., Nowak, E.

    “…A thorough insight of Si implantation in HfÜ2-based OXRAM is presented, from a material standpoint up to a 4 kbit 1T-1R array. We demonstrate for the first…”
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    Conference Proceeding
  9. 9
  10. 10

    Ultra-fine pitch redistribution for 3D interposer by Segaud, R., Aumont, C., Eleouet, R., Allouti, N., Mourier, T., Gabette, L., Minoret, S., Magis, T., Roman, A., Hida, R., Ratin, C., Lachal, L., Delachanal, S., Cordini, M. L., Nardi, P., Feldis, H., Charpentier, A., Chausse, P., Laviron, C., Cheramy, S.

    “…This study focuses on the development of a low cost and very fine pitch (8 μm space/8 μm line width) Redistribution Layer (RDL) for a 3D silicon interposer…”
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    Conference Proceeding
  11. 11

    Sub-100nm high-K metal gate GeOI pMOSFETs performance: Impact of the Ge channel orientation and of the source injection velocity by Le Royer, C., Tabone, C., Previtali, B., Truche, R., Allain, F., Pouydebasque, A., Romanjek, K., Barral, V., Vinet, M., Hartmann, J.-M., Augendre, E., Grampeix, H., Lachal, L.

    “…We report here experimental investigations on GeOI pMOSFET: Besides the +65% mobility enhancement in narrow channel GeOI pMOSFETs as compared to wide channels,…”
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    Conference Proceeding