Search Results - "La Macchia, M"

  • Showing 1 - 20 results of 20
Refine Results
  1. 1
  2. 2
  3. 3
  4. 4
  5. 5
  6. 6
  7. 7
  8. 8
  9. 9
  10. 10
  11. 11
  12. 12

    Single Event Upset cross sections at various data rates by Reed, R.A., Carts, M.A., Marshall, P.W., Marshall, C.J., Buchner, S., La Macchia, M., Mathes, B., McMorrow, D.

    Published in IEEE transactions on nuclear science (01-12-1996)
    “…We present data which show that Single Event Upset (SEU) cross section varies linearly with frequency for most devices tested. We show that the SEU cross…”
    Get full text
    Journal Article
  13. 13
  14. 14
  15. 15
  16. 16
  17. 17

    Particle-induced mitigation of SEU sensitivity in high data rate GaAs HIGFET technologies by Marshall, P.W., Dale, C.J., Weatherford, T.R., La Macchia, M., LaBel, K.A.

    Published in IEEE transactions on nuclear science (01-12-1995)
    “…Proton and heavy ion data on two GaAs HIGFET logic families, one source coupled (SCFL) and the other complementary (C-HIGFET), show the importance of dynamic…”
    Get full text
    Journal Article
  18. 18

    195. Electronic Brachytherapy in clinical practice: Implementation and comparison against conventional techniques and electron montecarlo algorithm by Ciarmatori, A., Palleri, F., Mariselli, M., Argazzi, E., Lappi, S., Polisca, F., Maurizi, F., Capezzali, G., La Macchia, M., Bunkheila, F., Bono, M.

    Published in Physica medica (01-12-2018)
    “…Electronic Brachytherapy (EBX), a technique that utilizes miniaturized X-Rays source, is gaining ground in radiotherapy treatment in presence of small…”
    Get full text
    Journal Article
  19. 19
  20. 20