Search Results - "LOPPACHER, C"

Photochemistry Highlights on On‐Surface Synthesis by Palmino, F., Loppacher, C., Chérioux, F.

“…On‐surface chemistry is a promising way to achieve the bottom‐up construction of covalently‐bonded molecular precursors into extended atomically‐precise…”
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Growth-Mode-Induced Narrowing of Optical Spectra of an Organic Adlayer by Dienel, T., Loppacher, C., Mannsfeld, S. C. B., Forker, R., Fritz, T.

“…Sharpening of optical spectra caused by commensurate growth of an organic adlayer on salt single crystals is reported. The structure is elucidated by atomic…”
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Ultrathin films of NaCl on Cu(111): a LEED and dynamic force microscopy study by Bennewitz, R., Barwich, V., Bammerlin, M., Loppacher, C., Guggisberg, M., Baratoff, A., Meyer, E., Güntherodt, H.-J.

“…Ultrathin films of NaCl on Cu(111) have been studied with low-energy electron diffraction (LEED) and Dynamic force microscopy (DFM). The orientation and the…”
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Assembly, structure, and performance of an ultra-thin film organic field-effect transistor (OFET) based on substituted oligothiophenes by Haubner, K., Jaehne, E., Adler, H.-J. P., Koehler, D., Loppacher, C., Eng, L. M., Grenzer, J., Herasimovich, A., Scheinert, S.

“…We report on the improved assembly and characterization of a small molecule organic field‐effect transistor (OFET). Novel α,ω‐dicyano substituted…”
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Fast digital electronics for application in dynamic force microscopy using high-Q cantilevers by Loppacher, C., Bammerlin, M., Battiston, F., Guggisberg, M., Müller, D., Hidber, H.R., Lüthi, R., Meyer, E., Güntherodt, H.J.

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Using higher flexural modes in non-contact force microscopy by Pfeiffer, O, Loppacher, C, Wattinger, C, Bammerlin, M, Gysin, U, Guggisberg, M, Rast, S, Bennewitz, R, Meyer, E, Güntherodt, H.-J

“…The oscillation characteristics of higher flexural modes of a rectangular microfabricated silicon cantilever have been studied in ultra-high vacuum (UHV) for a…”
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Dynamic SFM with true atomic resolution on alkali halide surfaces by Bammerlin, M., Lüthi, R., Meyer, E., Baratoff, A., Lü, J., Guggisberg, M., Loppacher, C., Gerber, C., Güntherodt, H.-J.

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Aspects of dynamic force microscopy on NaCl/Cu(111): resolution, tip-sample interactions and cantilever oscillation characteristics by Bennewitz, R., Bammerlin, M., Guggisberg, M., Loppacher, C., Baratoff, A., Meyer, E., Güntherodt, H.-J.

“…Ultrathin films of NaCl on Cu(111) have been studied using a dynamic force microscope. We present images with atomic resolution at step sites on the NaCl…”
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Polymorphism in ferroic functional elements: Bridging length and time scales by Gemming, S., Luschtinetz, R., Chaplygin, I., Seifert, G., Loppacher, C., Eng, L. M., Kunze, T., Olbrich, C.

“…The present study describes an approach for the scale-bridging modeling of ferroic materials as functional elements in micro- and nanoelectronic devices…”
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Carbon nanotubes as tips in non-contact SFM by Barwich, V, Bammerlin, M, Baratoff, A, Bennewitz, R, Guggisberg, M, Loppacher, C, Pfeiffer, O, Meyer, E, Güntherodt, H.-J, Salvetat, J.-P, Bonard, J.-M, Forró, L

“…The demand for sharp and stable tips suggests the use of carbon nanotubes as probing tips in scanning force microscopy. Here, we report a comparison of the…”
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Comparison of dynamic lever STM and noncontact AFM by Guggisberg, M., Bammerlin, M., Lüthi, R., Loppacher, C., Battiston, F., Lü, J., Baratoff, A., Meyer, E., Güntherodt, H.-J.

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Contrast inversion in nc-AFM on Si(111)7×7 due to short-range electrostatic interactions by Guggisberg, M., Pfeiffer, O., Schär, S., Barwich, V., Bammerlin, M., Loppacher, C., Bennewitz, R., Baratoff, A., Meyer, E.

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Accuracy and resolution limits of Kelvin probe force microscopy by ZERWECK, Ulrich, LOPPACHER, Christian, OTTO, Tobias, GRAFSTRÖM, Stefan, ENG, Lukas M

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Fuzzy controlled feedback applied to a combined scanning tunneling and force microscope by Battiston, F. M., Bammerlin, M., Loppacher, C., Lüthi, R., Meyer, E., Güntherodt, H.-J., Eggimann, F.

“…A feedback mechanism based on fuzzy logic has been applied to operate a combined atomic force microscope (AFM)/scanning tunneling microscope (STM), which is…”
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Local Dielectric and Polarization Properties of Inner and Outer Interfaces in PZT Thin Films by ENG, L. M., GRAFSTRÖM, S., LOPPACHER, C., LU, X. M., SCHLAPHOF, F., FRANKE, K., SUCHANECK, G., GERLACH, G.

“…We report on novel approaches using scanning force methods [i.e. piezoresponse force microscopy (PFM), Kelvin probe force microscopy (KPFM) and pull-off force…”
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Velocity dependence of atomic friction by Gnecco, E, Bennewitz, R, Gyalog, T, Loppacher, C, Bammerlin, M, Meyer, E, Guntherodt, H

“…Sliding friction between the tip of a friction force microscope and NaCl(100) was studied to deduce the velocity dependence of friction forces on the atomic…”
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Direct determination of the energy required to operate a single molecule switch by Loppacher, Ch, Guggisberg, M, Pfeiffer, O, Meyer, E, Bammerlin, M, Lüthi, R, Schlittler, R, Gimzewski, J K, Tang, H, Joachim, C

“…Using a noncontact atomic-force and scanning-tunneling microscope in ultrahigh vacuum, we have measured the switching energy of a single molecule switch based…”
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Scanning force microscopy investigation of the Pb(Zr0.25Ti0.75)O3/Pt interface by Lu, X. M., Schlaphof, F., Grafström, S., Loppacher, C., Eng, L. M., Suchaneck, G., Gerlach, G.

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All digital control system for a novel high frequency force sensor in non contact atomic force microscopy by Bouloc, J., Nony, L., Loppacher, C., Rahajandraibe, W., Bocquet, F., Zaid, L.

“…A new tunable control system for frequency modulation atomic force microscope (FM-AFM) using novel high frequency force sensors is presented. It is based on a…”
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Friction on the atomic scale: An ultrahigh vacuum atomic force microscopy study on ionic crystals by Lüthi, R., Meyer, E., Bammerlin, M., Howald, L., Haefke, H., Lehmann, T., Loppacher, C., Güntherodt, H.‐J., Gyalog, T., Thomas, H.

“…We performed atomic force microscopy in ultrahigh vacuum on the ionic crystal of KBr(001). The morphology and the tribological properties of this cleavage face…”
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