Search Results - "LOO, Roger"

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  1. 1

    Germanium-on-silicon planar concave grating wavelength (de)multiplexers in the mid-infrared by Malik, Aditya, Muneeb, Muhammad, Shimura, Yosuke, Van Campenhout, Joris, Loo, Roger, Roelkens, Gunther

    Published in Applied physics letters (14-10-2013)
    “…Mid-infrared wavelength (de)multiplexers based on planar concave gratings (PCGs) fabricated on a germanium-on-silicon waveguide platform are presented. PCGs…”
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    Journal Article
  2. 2

    Ge-on-Si and Ge-on-SOI thermo-optic phase shifters for the mid-infrared by Malik, Aditya, Dwivedi, Sarvagya, Van Landschoot, Liesbet, Muneeb, Muhammad, Shimura, Yosuke, Lepage, Guy, Van Campenhout, Joris, Vanherle, Wendy, Van Opstal, Tinneke, Loo, Roger, Roelkens, Gunther

    Published in Optics express (17-11-2014)
    “…Germanium-on-silicon thermo-optic phase shifters are demonstrated in the 5 μm wavelength range. Basic phase shifters require 700 mW of power for a 2π phase…”
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    Journal Article
  3. 3

    Site Selective Integration of III–V Materials on Si for Nanoscale Logic and Photonic Devices by Paladugu, Mohanchand, Merckling, Clement, Loo, Roger, Richard, Olivier, Bender, Hugo, Dekoster, Johan, Vandervorst, Wilfried, Caymax, Matty, Heyns, Marc

    Published in Crystal growth & design (03-10-2012)
    “…Integrating high electron mobility III–V materials on an existing Si based CMOS processing platform is considered as a main stepping stone to increase the CMOS…”
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    Journal Article
  4. 4

    Electrical properties of extended defects in strain relaxed GeSn by Gupta, Somya, Simoen, Eddy, Loo, Roger, Shimura, Yosuke, Porret, Clement, Gencarelli, Federica, Paredis, Kristof, Bender, Hugo, Lauwaert, Johan, Vrielinck, Henk, Heyns, Marc

    Published in Applied physics letters (09-07-2018)
    “…We report the electrical properties of 60° dislocations originating from the +1.2% lattice mismatch between an unintentionally doped, 315 nm thick…”
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    Journal Article
  5. 5

    High 5.2 peak-to-valley current ratio in Si/SiGe resonant interband tunnel diodes grown by chemical vapor deposition by Ramesh, Anisha, Berger, Paul R., Loo, Roger

    Published in Applied physics letters (27-02-2012)
    “…Si/SiGe resonant interband tunnel diodes were fabricated using chemical vapor deposition (CVD) on 200-mm diameter p-doped silicon wafers. The resonant…”
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    Journal Article
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    Enhanced active P doping by using high order Ge precursors leading to intense photoluminescence by Shimura, Yosuke, Srinivasan, Srinivasan Ashwyn, Van Thourhout, Dries, Van Deun, Rik, Pantouvaki, Marianna, Van Campenhout, Joris, Loo, Roger

    Published in Thin solid films (01-03-2016)
    “…The impact of the growth temperature on the in-situ phosphorus doped Ge layer grown by chemical vapor deposition is studied to achieve a sufficiently high…”
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    Journal Article
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    Density and Capture Cross-Section of Interface Traps in GeSnO2 and GeO2 Grown on Heteroepitaxial GeSn by Gupta, Somya, Simoen, Eddy, Loo, Roger, Madia, Oreste, Lin, Dennis, Merckling, Clement, Shimura, Yosuke, Conard, Thierry, Lauwaert, Johan, Vrielinck, Henk, Heyns, Marc

    Published in ACS applied materials & interfaces (01-06-2016)
    “…An imperative factor in adapting GeSn as the channel material in CMOS technology, is the gate-oxide stack. The performance of GeSn transistors is degraded due…”
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    Journal Article
  10. 10

    Chemical vapor deposition of Si:C and Si:C:P films—Evaluation of material quality as a function of C content, carrier gas and doping by Dhayalan, Sathish Kumar, Loo, Roger, Hikavyy, Andriy, Rosseel, Erik, Bender, Hugo, Richard, Olivier, Vandervorst, Wilfried

    Published in Journal of crystal growth (15-09-2015)
    “…Incorporation of source–drain stressors (S/D) for FinFETs to boost the channel mobility is a promising scaling approach. Typically SiGe:B S/D stressors are…”
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    Journal Article
  11. 11

    Influence of precursor gas on SiGe epitaxial material quality in terms of structural and electrical defects by Ike, Shinichi, Simoen, Eddy, Shimura, Yosuke, Hikavyy, Andriy, Vandervorst, Wilfried, Loo, Roger, Takeuchi, Wakana, Nakatsuka, Osamu, Zaima, Shigeaki

    Published in Japanese Journal of Applied Physics (01-04-2016)
    “…We have investigated the structural and electrical properties of n-type doped Si1−xGex epitaxial layers (x = 24-26%) grown by chemical vapor deposition with…”
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    Journal Article
  12. 12

    Optimized design of Si-cap layer in strained-SiGe channel p-MOSFETs based on computational and experimental approaches by Sato-Iwanaga, Junko, Inoue, Akira, Sorada, Haruyuki, Takagi, Takeshi, Rothschild, Aude, Loo, Roger, Biesemans, Serge, Ito, Choshu, Liu, Yang, Dutton, Robert W., Tsuchiya, Hideaki

    Published in Solid-state electronics (01-01-2014)
    “…•Strainde-SiGe channel p-MOSFETs with a Si-cap layer are studied.•The roles of Si-cap layer are clarified by using simulation and experiment.•2D hole…”
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    Journal Article
  13. 13

    The implant-free quantum well field-effect transistor: Harnessing the power of heterostructures by Hellings, Geert, Hikavyy, Andriy, Mitard, Jerome, Witters, Liesbeth, Benbakhti, Brahim, Alian, AliReza, Waldron, Niamh, Bender, Hugo, Eneman, Geert, Krom, Raymond, Schulze, Andreas, Vandervorst, Wilfried, Loo, Roger, Heyns, Marc, Meuris, Marc, Hoffmann, Thomas, De Meyer, Kristin

    Published in Thin solid films (01-02-2012)
    “…The Implant-Free Quantum Well Field-Effect Transistor (FET) offers enhanced scalability in a planar architecture through the integration of heterostructures…”
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    Journal Article Conference Proceeding
  14. 14

    Fabrication and Analysis of a / Heterojunction Line Tunnel FET by Walke, Amey M., Vandooren, Anne, Rooyackers, Rita, Leonelli, Daniele, Hikavyy, Andriy, Loo, Roger, Verhulst, Anne S., Kuo-Hsing Kao, Huyghebaert, Cedric, Groeseneken, Guido, Rao, Valipe Ramgopal, Bhuwalka, Krishna K., Heyns, Marc M., Collaert, Nadine, Thean, Aaron Voon-Yew

    Published in IEEE transactions on electron devices (01-03-2014)
    “…This paper presents a new integration scheme to fabricate a Si/Si 0.55 Ge 0.45 heterojunction line tunnel field effect transistor (TFET). The device shows an…”
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    Journal Article
  15. 15

    Influence of dislocations in strained Si∕relaxed SiGe layers on n+∕p-junctions in a metal-oxide-semiconductor field-effect transistor technology by Eneman, Geert, Simoen, Eddy, Delhougne, Romain, Verheyen, Peter, Loo, Roger, De Meyer, Kristin

    Published in Applied physics letters (07-11-2005)
    “…We present an investigation of junction leakage in highly doped n+∕p-junctions, fabricated in strained silicon/relaxed SiGe substrates. The leakage is shown to…”
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    Journal Article
  16. 16

    Si1-yGey or Ge1-zSnz Source/Drain Stressors on Strained Si1-xGex-Channel P-Type Field-Effect Transistors: A Technology Computer-Aided Design Study by Eneman, Geert, De Keersgieter, An, Witters, Liesbeth, Mitard, Jerome, Vincent, Benjamin, Hikavyy, Andriy, Loo, Roger, Horiguchi, Naoto, Collaert, Nadine, Thean, Aaron

    Published in Jpn J Appl Phys (25-04-2013)
    “…The interaction between two stress techniques, strain-relaxed buffers (SRBs) and epitaxial source/drain stressors, is studied on short, Si 1-x Ge x - and…”
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    Journal Article
  17. 17

    Layout Scaling of \hbox\hbox \hbox pFETs by Eneman, G., Yamaguchi, S., Ortolland, C., Takeoka, S., Kobayashi, M., Witters, L., Hikavyy, A., Mitard, J., Loo, R., Hoffmann, T.

    Published in IEEE transactions on electron devices (01-08-2011)
    “…Through a combination of electrical measurements, technology computer-aided design simulations, and wafer bending experiments, the effect of elastic stress…”
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    Journal Article
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    Effects of Strain on Diborane Dissociative Adsorption and Boron Incorporation on Si0.5Ge0.5(001)‑2 × 1 Surfaces by Rengo, Gianluca, Pourtois, Geoffrey, Porret, Clement, Loo, Roger, Vantomme, André

    Published in Journal of physical chemistry. C (01-08-2024)
    “…This study investigates the surface reaction pathway of the diborane dissociative adsorption on the Si0.5Ge0.5(001)-2 × 1 surface by using density functional…”
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    Journal Article
  20. 20

    Germanium-on-Silicon Mid-Infrared Arrayed Waveguide Grating Multiplexers by Malik, Aditya, Muneeb, Muhammad, Pathak, Shibnath, Shimura, Yosuke, Van Campenhout, Joris, Loo, Roger, Roelkens, Gunther

    Published in IEEE photonics technology letters (15-09-2013)
    “…In this letter, we describe the use of a germanium-on-silicon waveguide platform to realize an arrayed waveguide grating (AWG) operating in the 5 μm wavelength…”
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    Journal Article