Search Results - "LIU, Chuan H"

Forensic Identification and Evaluation of 25 Obstetric Brachial Plexus Palsy Medical Damage Cases by Yu, Yong, Wang, Ying-Jie, Jia, Yun-Fei, Huang, Bao-Jing, He, Song-Yue, Liu, Chuan-Chuan

“…To analyze the high risk factors of obstetric brachial plexus palsy (OBPP), and to explore how to evaluate the relationship between fault medical behavior and…”
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Temperature dependence of surface plasmon and breakdown for thin and thick silicon-dioxide by Kim, Jong-Hyun, Sanchez, Julian J., DeMassa, Thomas A., Quddus, Mohammed T., Grondin, Robert O., Liu, Chuan H.

“…The anode hole injection oxide breakdown model based upon surface plasmons is presented. The increase in conductance at bias voltages near the surface plasmon…”
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Low-Carbon Economic Dispatch of Multi-Energy Park Considering High Proportion of Renewable Energy by LÜ Xiangmei, LIU Tianqi, LIU Xuan, HE Chuan, NAN Lu, ZENG Hong

“…To improve the utilization rate of clean energy, reduce carbon emissions, and alleviate the global energy crisis and greenhouse effect, a low-carbon economic…”
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Mechanism and process dependence of negative bias temperature instability (NBTI) for pMOSFETs with ultrathin gate dielectrics by Liu, C.H., Lee, M.T., Chih-Yung Lin, Chen, J., Schruefer, K., Brighten, J., Rovedo, N., Hook, T.B., Khare, M.V., Shih-Fen Huang, Wann, C., Tze-Chiang Chen, Ning, T.H.

“…This work mainly focuses on the NBTI (Negative Bias Temperature Instability) mechanism and investigates the degree of degradation caused by NBTI stress for…”
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Extending the reliability scaling limit of gate dielectrics through remote plasma nitridation of N2O-Grown oxides and NO RTA treatment by LIU, Chuan H, LIN, Hsiu-Shan, LEE, J. H, HUANG, M, HSIUNG, Chiung-Sheng, HUANG-LU, S, HSU, Chen-Chung, LIANG, Alan Y, JENKON CHEN, HSIEH, W. Y, YEN, P. W, CHIEN, S. C, LIN, Yu-Yin, LOH, Y. T, CHANG, Yih J, LIOU, Fu-Tai, CHEN, M. G, PAN, T. M, KAO, C. J, HUANG, K. T, LIN, S. H, SHENG, Y. C, CHANGE, Wen-Tung

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High performance 50 nm CMOS devices for microprocessor and embedded processor core applications by Shih-Fen Huang, Chih-Yung Lin, Yu-Shyang Huang, Schafbauer, T., Eller, M., Yao-Ching Cheng, Shui-Ming Cheng, Sportouch, S., Wei Jin, Rovedo, N., Grassmann, A., Yimin Huang, Brighten, J., Liu, C.H., von Ehrenwall, B., Chen, N., Jia Chen, Park, O.S., Commons, M., Thomas, A., Ming-Tsan Lee, Rauch, S., Clevenger, L., Kaltalioglu, E., Pak Leung, Jenkon Chen, Schiml, T., Wann, C.

“…50 nm CMOS transistors for high performance and low active power applications are presented. Good short-channel effect control is achieved down to 35 nm gate…”
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A breakdown model and lifetime projection for thin gate oxide MOS devices by Liu, C.H., Grondin, R.O., DeMassa, T.A., Sanchez, J.J.

“…An analytical breakdown model based upon a physical understanding of thin gate oxide has been developed. With the help of this model, which automatically…”
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