Search Results - "LIANG, Alan Y"

The Influence of NBL Layout and LOCOS Space on Component ESD and System Level ESD for HV-LDMOS by Jian-Hsing Lee, Chen, S.H., Tsai, Y.T., Lee, D.B., Chen, F.H., Liu, W.C., Chung, C.M., Hsu, S.L., Shih, J.R., Liang, A.Y., Wu, K.

“…This paper investigates the influence of the N-type buried layer (NBL) layout and LOCOS space on the ESD performance and trigger voltage of the lateral DMOS…”
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Improved protection for alarm communications systems by Jaeger, C.D., Liang, A.Y.

“…The alarm communications system can be thought of as consisting of five major components: alarm transmission, alarm displays and stations, alarm processing and…”
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Extending the reliability scaling limit of gate dielectrics through remote plasma nitridation of N2O-Grown oxides and NO RTA treatment by LIU, Chuan H, LIN, Hsiu-Shan, LEE, J. H, HUANG, M, HSIUNG, Chiung-Sheng, HUANG-LU, S, HSU, Chen-Chung, LIANG, Alan Y, JENKON CHEN, HSIEH, W. Y, YEN, P. W, CHIEN, S. C, LIN, Yu-Yin, LOH, Y. T, CHANG, Yih J, LIOU, Fu-Tai, CHEN, M. G, PAN, T. M, KAO, C. J, HUANG, K. T, LIN, S. H, SHENG, Y. C, CHANGE, Wen-Tung

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