Search Results - "LEBEAU, J.M."

A deep convolutional neural network to analyze position averaged convergent beam electron diffraction patterns by Xu, W., LeBeau, J.M.

“…•A deep convolutional neural network is established to measure PACBED parameters including size, center, rotation, thickness and tilt.•The convolutional neural…”
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Carbon stoichiometry and mechanical properties of high entropy carbides by Hossain, M.D., Borman, T., Kumar, A., Chen, X., Khosravani, A., Kalidindi, S.R., Paisley, E.A., Esters, M., Oses, C., Toher, C., Curtarolo, S., LeBeau, J.M., Brenner, D., Maria, J-P

“…The search for new materials via compositional exploration has recently led to the discovery of entropy stabilized and high entropy ceramics. The chemical…”
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Detector non-uniformity in scanning transmission electron microscopy by Findlay, S.D., LeBeau, J.M.

“…A non-uniform response across scanning transmission electron microscope annular detectors has been found experimentally, but is seldom incorporated into…”
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Quantitative atomic resolution elemental mapping via absolute-scale energy dispersive X-ray spectroscopy by Chen, Z., Weyland, M., Sang, X., Xu, W., Dycus, J.H., LeBeau, J.M., D'Alfonso, A.J., Allen, L.J., Findlay, S.D.

“…Quantitative agreement on an absolute scale is demonstrated between experiment and simulation for two-dimensional, atomic-resolution elemental mapping via…”
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A reliable approach to prepare brittle semiconducting materials for cross‐sectional transmission electron microscopy by DYCUS, J.H., LEBEAU, J.M.

“…Summary Here, we present a sample preparation approach that simplifies the thinning of very brittle wide bandgap semiconducting materials in cross‐section…”
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Influence of experimental conditions on atom column visibility in energy dispersive X-ray spectroscopy by Dycus, J.H., Xu, W., Sang, X., D'Alfonso, A.J., Chen, Z., Weyland, M., Allen, L.J., Findlay, S.D., LeBeau, J.M.

“…Here we report the influence of key experimental parameters on atomically resolved energy dispersive X-ray spectroscopy (EDX). In particular, we examine the…”
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Atom site preference and γ′/γ mismatch strain in Ni Al Co Ti superalloys by Oni, A.A., Broderick, S.R., Rajan, K., LeBeau, J.M.

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Atom site preference and γ′/γ mismatch strain in NiAlCoTi superalloys by Oni, A.A., Broderick, S.R., Rajan, K., LeBeau, J.M.

“…The structure and chemistry of NiCoAlTi quaternary superalloys are investigated at the microstructural and atomic scale. Atom probe tomograghy (APT) is used to…”
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Numerical modeling of specimen geometry for quantitative energy dispersive X-ray spectroscopy by Xu, W., Dycus, J.H., LeBeau, J.M.

“…•3D approach to model complex specimen shapes for EDS quantification when using multiple detectors.•Sample geometry can greatly impact the accuracy of EDS…”
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A numerical model for multiple detector energy dispersive X-ray spectroscopy in the transmission electron microscope by Xu, W., Dycus, J.H., Sang, X., LeBeau, J.M.

“…Here we report a numerical approach to model a four quadrant energy dispersive X-ray spectrometer in the transmission electron microscope. The model includes…”
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Structure and magnetic properties of a multi-principal element Ni–Fe–Cr–Co–Zn–Mn alloy by Zaddach, A.J., Niu, C., Oni, A.A., Fan, M., LeBeau, J.M., Irving, D.L., Koch, C.C.

“…A nanocrystalline alloy with a nominal composition of Ni20Fe20Cr20Co20Zn15Mn5 was produced by mechanical alloying and processed using annealing treatments…”
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Effect of B and Cr on elastic strength and crystal structure of Ni3Al alloys under high pressure by Raju, S.V., Oni, A.A., Godwal, B.K., Yan, J., Drozd, V., Srinivasan, S., LeBeau, J.M., Rajan, K., Saxena, S.K.

“…•Ni3Al, Ni3Al:B and Ni ̶ Al ̶ Cr alloys were prepared by Bridgman-Stockburger technique.•Crystal structures confirmed by XRD and Electron microscopy…”
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The role of terminal oxide structure and properties in nanothermite reactions by Mily, E.J., Oni, A., LeBeau, J.M., Liu, Y., Brown-Shaklee, H.J., Ihlefeld, J.F., Maria, J.-P.

“…In this report, thin films of copper oxide, a common thermite oxidant, and varying metallic species (Al, Zr, and Mg) were deposited in an alternating layered…”
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Phase coexistence in Ti6Sn5 intermetallics by Oni, A.A., Hook, D., Maria, J.P., LeBeau, J.M.

“…Here we report the structural characterization of a complex Ti–Sn intermetallic compound, Ti6Sn5. From X-ray diffraction, the resulting compound was observed…”
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Thermal diffuse scattering in transmission electron microscopy by Forbes, B.D., D'Alfonso, A.J., Findlay, S.D., Van Dyck, D., LeBeau, J.M., Stemmer, S., Allen, L.J.

“…In conventional transmission electron microscopy, thermal scattering significantly affects the image contrast. It has been suggested that not accounting for…”
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Image contrast in atomic resolution high-angle annular dark-field images by Stemmer, S., LeBeau, J.M., Findlay, S.D., Allen, L.J.

“…Abstract only…”
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Applications of advanced transmission electron microscopy techniques in gate stack scaling by Stemmer, S., LeBeau, J.M., Cagnon, J., Yoontae Hwang, Engel-Herbert, R.

“…Advanced gate dielectric stacks are comprised of multiple layers of different materials, including high-k gate dielectrics, high-mobility semiconductor…”
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