Search Results - "Kwon, Daewon"

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  1. 1
    A System for Determining Braking Distance by Predicting Weight Using Image Processing to Predict Illegal Red Light Running Events

    A System for Determining Braking Distance by Predicting Weight Using Image Processing to Predict Illegal Red Light Running Events by Kwon, Daewon, Hyun, Dohun, Kim, Miji, Ko, Youlim, McNally, Helen A, Smith, Anthony H

    “…In today's society, we see a constant struggle with intersections that bring in constant crimes. This has become a problem in our society, especially because…”
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  2. 2
    Identification of the dominant electron deep trap in amorphous silicon from ESR and modulated photocurrent measurements: implications for defect models

    Identification of the dominant electron deep trap in amorphous silicon from ESR and modulated photocurrent measurements: implications for defect models by David Cohen, J, Kwon, Daewon

    Published in Journal of non-crystalline solids (01-05-1998)
    “…Modulated photocurrent (MPC) measurements in intrinsic a-Si:H reveal a prominent band of electron traps with a thermal emission energy near 0.6 eV. We have…”
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  3. 3
    Fundamental nature of deep defects in hydrogenated amorphous silicon revealed by electron spin resonance and modulated photocurrent measurements

    Fundamental nature of deep defects in hydrogenated amorphous silicon revealed by electron spin resonance and modulated photocurrent measurements by Kwon, Daewon

    Published 01-01-1997
    “…Modulated photocurrent (MPC) measurements in intrinsic hydrogenated amorphous silicon (a-Si:H) have revealed a dominant deep band of electron traps with a…”
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    Dissertation
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  4. 4
    Identification of the dominant electron deep trap in amorphous silicon from ESR and modulated photocurrent measurements : implications for defect models

    Identification of the dominant electron deep trap in amorphous silicon from ESR and modulated photocurrent measurements : implications for defect models by COHEN, J. D, DAEWON KWON

    Published in Journal of non-crystalline solids (1998)
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  5. 5
    New results using capacitance transient studies to investigate deep defect relaxation in hydrogenated amorphous silicon

    New results using capacitance transient studies to investigate deep defect relaxation in hydrogenated amorphous silicon by Kwon, Daewon, Gardner, Adam, Cohen, J.David

    Published in Journal of non-crystalline solids (1996)
    “…Recent studies of deep defect relaxation processes in a-Si:H using capacitance transient measurements are reported. First, to disprove any significant role of…”
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  6. 6
    Optical spectra of crystalline silicon particles embedded in an amorphous silicon matrix

    Optical spectra of crystalline silicon particles embedded in an amorphous silicon matrix by Kwon, Daewon, Lee, Hao, Cohen, J.David, Jin, Hyun-Chul, Abelson, John R.

    Published in Journal of non-crystalline solids (01-01-1998)
    “…Deuterated amorphous silicon films deposited by DC reactive magnetron sputtering were measured by Raman spectroscopy and TEM imaging. The films were found to…”
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  7. 7
    Visible electroluminescence from porous silicon/hydrogenated amorphous silicon pn -heterojunction devices

    Visible electroluminescence from porous silicon/hydrogenated amorphous silicon pn -heterojunction devices by Sercel, Peter C., Kwon, Daewon, Vilbrandt, Teha, Yang, Weidong, Hautala, John, Cohen, J. David, Lee, Hao

    Published in Applied physics letters (29-01-1996)
    “…We report the fabrication and characterization of a p-type porous silicon/ n-type hydrogenated amorphous silicon (a-Si:H) pn-heterojunction electroluminescent…”
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  8. 8
    Optical spectra of crystalline silicon particles embedded in an amorphous silicon matrix

    Optical spectra of crystalline silicon particles embedded in an amorphous silicon matrix by DAEWON KWON, HAO LEE, COHEN, J. D, JIN, H.-C, ABELSON, J. R

    Published in Journal of non-crystalline solids (1998)
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