Search Results - "Kwapil, W"

Taking monocrystalline silicon to the ultimate lifetime limit by Niewelt, T., Richter, A., Kho, T.C., Grant, N.E., Bonilla, R.S., Steinhauser, B., Polzin, J.-I., Feldmann, F., Hermle, M., Murphy, J.D., Phang, S.P., Kwapil, W., Schubert, M.C.

“…A central quantity to assess the high quality of monocrystalline silicon (on scales beyond mere purity) is the minority charge carrier lifetime. We demonstrate…”
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Luminescence imaging for the detection of shunts on silicon solar cells by Kasemann, M., Grote, D., Walter, B., Kwapil, W., Trupke, T., Augarten, Y., Bardos, R.A., Pink, E., Abbott, M.D., Warta, W.

“…Luminescence imaging is a non‐destructive, fast, and versatile imaging method for spatially resolved solar cell and material characterization. In this paper,…”
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Analysis of performance limiting material properties of multicrystalline silicon by Schubert, M.C., Kwapil, W., Schön, J., Habenicht, H., Kasemann, M., Gundel, P., Blazek, M., Warta, W.

“…We present progress of the analysis of multicrystalline silicon and of improvements of our understanding of material related performance limits of solar cells…”
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Physical mechanisms of breakdown in multicrystalline silicon solar cells by Breitenstein, O., Bauer, J., Wagner, J.-M., Blumtritt, H., Lotnyk, A., Kasemann, M., Kwapil, W., Warta, W.

“…We have identified at least five different local breakdown mechanisms according to the temperature coefficient (TC) and slope of their characteristics and…”
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Stability of industrial gallium-doped Czochralski silicon PERC cells and wafers by Niewelt, T., Maischner, F., Kwapil, W., Khorani, E., Pain, S.L., Jung, Y., Hopkins, E.C.B., Frosch, M., Altermatt, P.P., Guo, H., Wang, Y.C., Grant, N.E., Murphy, J.D.

“…The carrier lifetime stability of gallium-doped silicon wafers and performance stability of industrial PERC solar cells produced from sister wafers were…”
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Identification of the most relevant metal impurities in mc n-type silicon for solar cells by Schön, J., Schindler, F., Kwapil, W., Knörlein, M., Krenckel, P., Riepe, S., Warta, W., Schubert, M.C.

“…In general, the charge carrier lifetime in n-type silicon is less sensitive to common dissolved metals compared to p-type silicon. However, in experiments it…”
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Erratum to Carrier Recombination at Metallic Precipitates in p- and n-Type Silicon [Sep 15 1285-1292] by Kwapil, W., Schon, J., Warta, W., Schubert, M. C.

“…Corrections to equations and a table for the above named paper (ibid., vol. 5, no. 5, pp. 1285-1292, Sep. 2015) are presented here…”
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Can Luminescence Imaging Replace Lock-in Thermography on Solar Cells? by Breitenstein, O., Bauer, J., Bothe, K., Hinken, D., Müller, J., Kwapil, W., Schubert, M. C., Warta, W.

“…The purpose of this paper is a detailed comparison of selected luminescence and lock-in thermography (LIT) results on one exemplary sample and the drawing of…”
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Comments on the paper “Detection and analysis of hot-spot formation in solar cells” published by M. Simon and E.L. Meyer in Solar Energy Materials & Solar Cells 94 (2010) 106–113 by Bauer, J., Kwapil, W., Lausch, D., Schubert, M.C., Warta, W., Bothe, K., Breitenstein, O.

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Defect-Induced Breakdown in Multicrystalline Silicon Solar Cells by Breitenstein, O, Bauer, J, Wagner, J.-M, Zakharov, N, Blumtritt, H, Lotnyk, A, Kasemann, M, Kwapil, W, Warta, W

“…We have identified at least five different kinds of local breakdown according to the temperature coefficient (TC) and slope of their characteristics and…”
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Influence of trench structures induced by texturization on the breakdown voltage of multicrystalline silicon solar cells by Nievendick, J., Kwapil, W., Rentsch, J.

“…Preferred grain boundary etching during acidic texturization of mc-Si wafers causes the formation of deep and sharp trench structures. This paper shows that…”
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Can luminescence imaging replace lock-in thermography on solar cells and wafers? by Breitenstein, O., Bauer, J., Bothe, K., Hinken, D., Muller, J., Kwapil, W., Schubert, M. C., Warta, W.

“…Since 15 years lock-in thermography (LIT) is used to investigate solar cells and modules. While LIT was used at the beginning only for shunt detection,…”
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Cause of increased currents under reverse-bias conditions of upgraded metallurgical grade multicrystalline silicon solar cells by Kwapil, W, Wagner, M, Schubert, M C, Warta, W

“…Solar cells made of upgraded metallurgical grade (UMG) silicon in general suffer from increased reverse currents at relatively low reverse bias easily…”
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Spatially resolved silicon solar cell characterization using infrared imaging methods by Kasemann, M., Kwapil, W., Schubert, M.C., Habenicht, H., Walter, B., The, M., Kontermann, S., Rein, S., Breitenstein, O., Bauer, J., Lotnyk, A., Michl, B., Nagel, H., Schutt, A., Carstensen, J., Foll, H., Trupke, T., Augarten, Y., Kampwerth, H., Bardos, R.A., Pingel, S., Berghold, J., Warta, W., Glunz, S.W.

“…We present a comprehensive overview over infrared imaging techniques for (electrical) silicon solar cell characterization. Recent method development in local…”
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Coping with a Shady Past: Wickliffe Mounds changes its image from pothunter's dream to viable research center by KWAPIL, BRYAN W.

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