Role of Inherent Radiation-Induced Self-Trapped Holes in Pulsed-Radiation Effect on Pure-Silica-Core Optical Fibers

Role of Inherent Radiation-Induced Self-Trapped Holes in Pulsed-Radiation Effect on Pure-Silica-Core Optical Fibers

Radiation-induced attenuation (RIA) is investigated in pure-silica-core optical fibers (PSFs) upon their pulsed-X-ray irradiation. RIA at small post-pulse times (t ≤ 0.001-0.1 s) is argued to be mainly due to inherent self-trapped holes (STHs), whereas at large times, due to strain-assisted STHs, as...

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Bibliographic Details
Published in:Journal of lightwave technology Vol. 37; no. 3; pp. 956 - 963
Main Authors: Tomashuk, Alexander L., Filippov, Alexey V., Kashaykin, Pavel F., Bychkova, Ekaterina A., Galanova, Sofiya V., Tatsenko, Olga M., Kuzyakina, Natalya S., Zverev, Oleg V., Salgansky, Mikhail Y., Abramov, Alexey N., Guryanov, Alexey N., Dianov, Evgeny M.
Format: Journal Article
Language:English
Published: New York IEEE 01-02-2019
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects:
Atomic measurements
Attenuation
Charge carrier processes
Optical fiber radiation resistance
Optical fibers
Preforms
pulsed radiation
Radiation dosage
Radiation effects
Radiation hardening
radiation-induced attenuation (RIA)
Silicon compounds
Silicon dioxide
Steady-state
X ray irradiation
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Summary:Radiation-induced attenuation (RIA) is investigated in pure-silica-core optical fibers (PSFs) upon their pulsed-X-ray irradiation. RIA at small post-pulse times (t ≤ 0.001-0.1 s) is argued to be mainly due to inherent self-trapped holes (STHs), whereas at large times, due to strain-assisted STHs, as shown by Girard et al . Significant suppression of inherent STHs is found to occur in PSFs upon pulsed pre-irradiation with a dose of just ∼100-200 Gy. Thus, a radiation-hardening effect is revealed for the first time, which is of practical value for PSFs to be exposed to pulsed irradiation. Fiber drawing temperature T d is found to have an essential effect on RIA upon pulsed irradiation. The optimal T d -values are estimated for PSF applications at small (t < 0.01 s) and large (t > 0.01 s) post-pulse times.
ISSN:0733-8724
1558-2213
DOI:10.1109/JLT.2018.2884078