Search Results - "Kushida, Takuya"

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    Mapping of minority carrier lifetime distributions in multicrystalline silicon using transient electron-beam-induced current by Kushida, Takuya, Tanaka, Shigeyasu, Morita, Chiaki, Tanji, Takayoshi, Ohshita, Yoshio

    Published in Journal of electron microscopy (01-10-2012)
    “…We have used transient electron-beam-induced current (EBIC) to map minority carrier lifetime distributions in multicrystalline Silicon (mc-Si). In this…”
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    Journal Article