Search Results - "Kurmashev, Sh. D."

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  1. 1

    Degradation of the parameters of transistor temperature sensors under the effect of ionizing radiation by Vikulin, I. M., Gorbachev, V. E., Kurmashev, Sh. D.

    Published in Semiconductors (Woodbury, N.Y.) (01-10-2017)
    “…The influence of the effective concentration of an impurity specifying the conduction type of the base region and the base thickness on the radiation…”
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    Journal Article
  2. 2

    Frequency-output sensors-transducers based on unijunction transistors by Vikulin, I. M., Kurmashev, Sh. D., Vikulina, L. F., Stafeev, V. I.

    “…The experimental characteristics of sensors of nonelectrical quantities (temperature, magnetic field, light, and pressure) based on a unijunction transistor…”
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    Journal Article
  3. 3

    Increasing the radiation resistance of single-crystal silicon epitaxial layers by Kurmashev, Sh. D., Kulinich, O. A., Brusenskaya, G. I., Verem’eva, A. V.

    “…The authors investigate the possibility of increasing the radiation resistance of silicon epitaxial layers by creating radiation defects sinks in the form of…”
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    Journal Article
  4. 4

    Injection-based photodetectors by Vikulin, I. M., Kurmashev, Sh. D., Stafeev, V. I.

    Published in Semiconductors (Woodbury, N.Y.) (2008)
    “…Physical principles of the operation of injection-based photodiodes are generalized. The unified approach to studying the photoelectric phenomena with the…”
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    Journal Article
  5. 5

    Method of defence of solder surface from oxidization by Kurmashev Sh. D., Lavrenova T. I., Bugajova T. N.

    “…Compositions are developed for defence of fusion solder from oxidization on the basis of mixture of glycerin, urea and powders of refractory oxides, carbides…”
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    Journal Article
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