Semiconductor and Thermoluminescent Dosimetry of Pulsed Soft X Ray Plasma Sources

Semiconductor and Thermoluminescent Dosimetry of Pulsed Soft X Ray Plasma Sources

A multichannel detection system having a dynamic range of "1 x 10-9 Gy - 20 Gy was developed with the use of commercially produced Si-photodiodes and TLDs for accurate measurement of X ray energy emitted from plasma-focus facility and from laser-produced plasmas. The proof of linearity of the e...

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Bibliographic Details
Published in:Radiation protection dosimetry Vol. 100; no. 1-4; pp. 429 - 432
Main Authors: Krása, J., Cejnarová, A., Juha, L., Ry, L., Scholz, M., Kubeè, P.
Format: Journal Article Conference Proceeding
Language:English
Published: Oxford Oxford University Press 01-01-2002
Subjects:
Biological and medical sciences
Hot Temperature
Lasers
Luminescent Measurements
Medical sciences
Photochemistry
Radiochemistry
Semiconductors
Silicon - chemistry
Silicon - radiation effects
Thermoluminescent Dosimetry - methods
X-Rays
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Summary:A multichannel detection system having a dynamic range of "1 x 10-9 Gy - 20 Gy was developed with the use of commercially produced Si-photodiodes and TLDs for accurate measurement of X ray energy emitted from plasma-focus facility and from laser-produced plasmas. The proof of linearity of the employed detectors accomplished by a comparison of their responses to a broad band spectrum of X rays emitted from plasmas, is reported. It is demonstrated that TLDs irradiated with no protective filter show an incorrect response due to overloading in the sub-keV range and repopulation of dosimetric peaks induced by the UV radiation. The measurement of the power of undesirable secondary X ray sources driven by the primary plasma inside the interaction chamber was performed on the basis of analysis of space dependence of X ray intensity with respect to the assumed r-2 decrease in the intensity far away from the plasma.
Bibliography:PII:0144-8420
ark:/67375/HXZ-96K1VB5B-3
local:1000429
istex:85F40C5006FBEB3C5E062A0A5018B52B4DEB981D
ISSN:0144-8420
1742-3406
DOI:10.1093/oxfordjournals.rpd.a005906