Search Results - "Kruchinin, V N"

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  1. 1

    The Use of Spectral Ellipsometry and Raman Spectroscopy in Screening Diagnostics of Colorectal Cancer by Kruchinin, V. N., Kruchinina, M. V., Prudnikova, Ya. I., Spesivtsev, E. V., Rykhlitskii, S. V., Volodin, V. A., Shekhovtsov, S. V., Pel’tek, S. E.

    Published in Optics and spectroscopy (01-07-2019)
    “…Diagnostic pilot monitoring of the groups of healthy patients and patients with colorectal cancer (CRC) at different stages of the disease was carried out…”
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  2. 2

    Charge transport mechanism in the metal–nitride–oxide–silicon forming-free memristor structure by Gismatulin, A. A., Orlov, Oleg M., Gritsenko, V. A., Kruchinin, V. N., Mizginov, D. S., Krasnikov, G. Ya

    Published in Applied physics letters (18-05-2020)
    “…Silicon oxide and silicon nitride are two key dielectrics in silicon devices. The advantage of Si3N4 over other dielectrics is that silicon nitride is…”
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  3. 3

    Electronic Structure and Optical Quality of Nanocrystalline Y2O3 Film Surfaces and Interfaces on Silicon by Rubio, E. J, Atuchin, V. V, Kruchinin, V. N, Pokrovsky, L. D, Prosvirin, I. P, Ramana, C. V

    Published in Journal of physical chemistry. C (26-06-2014)
    “…Nanocrystalline yttrium oxide (Y2O3) thin films were made by sputter deposition onto silicon (100) substrates keeping the deposition temperature fixed at 300…”
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  4. 4

    Structure, morphology and optical properties of nanocrystalline yttrium oxide (Y2O3) thin films by Mudavakkat, V.H., Atuchin, V.V., Kruchinin, V.N., Kayani, A., Ramana, C.V.

    Published in Optical materials (01-03-2012)
    “…► Growth, structure and optical properties of nanocrystalline Y2O3 films are described. ► A correlation between microstructure and optical properties is found…”
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  5. 5

    Charge transport mechanism of high-resistive state in RRAM based on SiOx by Gismatulin, A. A., Kruchinin, V. N., Gritsenko, V. A., Prosvirin, I. P., Yen, T.-J., Chin, A.

    Published in Applied physics letters (21-01-2019)
    “…Nonstoichiometric silicon oxide SiOx is a promising material for developing a new generation of high-speed, reliable flash memory based on the resistive…”
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  6. 6

    Composition-sensitive growth kinetics and dispersive optical properties of thin HfxTi1−xO2 (0 ≤ x ≤ 1) films prepared by the ALD method by Atuchin, V. V., Lebedev, M. S., Korolkov, I. V., Kruchinin, V. N., Maksimovskii, E. A., Trubin, S. V.

    “…The optical quality Hf x Ti 1−x O 2 films with a wide range of the Hf/Ti ratio were prepared on Si (100) substrates by the ALD method with the use of…”
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  7. 7

    Formation of Inert Bi2Se3(0001) Cleaved Surface by Atuchin, V. V, Golyashov, V. A, Kokh, K. A, Korolkov, I. V, Kozhukhov, A. S, Kruchinin, V. N, Makarenko, S. V, Pokrovsky, L. D, Prosvirin, I. P, Romanyuk, K. N, Tereshchenko, O. E

    Published in Crystal growth & design (07-12-2011)
    “…A high quality inclusion-free Bi2Se3 crystal has been grown by the Bridgman method with the use of a rotating heat field. A large-area atomically flat…”
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  8. 8

    Optical Properties of TiO2 Films Deposited by Reactive Electron Beam Sputtering by Kruchinin, V. N., Perevalov, T. V., Atuchin, V. V., Gritsenko, V. A., Komonov, A. I., Korolkov, I. V., Pokrovsky, L. D., Shih, Cheng Wei, Chin, Albert

    Published in Journal of electronic materials (01-10-2017)
    “…Titanium dioxide (anatase, a-TiO 2 ) films have been prepared by electron beam sputtering of a TiO 2 target in reactive atmosphere and their structural,…”
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  9. 9

    Physical and dispersive optical characteristics of ZrON/Si thin-film system by Wong, Yew Hoong, Atuchin, V. V., Kruchinin, V. N., Cheong, Kuan Yew

    “…To date, the complex evaluation of physical and dispersive optical characteristics of the ZrON/Si film system has yet been reported. Hence, ZrON thin films…”
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  10. 10

    Optical Properties of Ferroelectric Films HfxZryO2 and La:HfxZryO2 according to Ellipsometry Data by Kruchinin, V. N., Spesivtsev, E. V., Rykhlitsky, C. V., Gritsenko, V. A., Mehmood, F., Mikolajick, T., Schroeder, U.

    Published in Optics and spectroscopy (01-07-2023)
    “…Recently ferroelectric properties have been found in hafnia-based nanosized films. Such films are of the utmost interest for development of a universal memory,…”
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  11. 11

    Atomic and Electronic Structures of a-SiN x :H by Gritsenko, V A, Kruchinin, V N, Prosvirin, I P, Novikov, Yu N, Chin, A, Volodin, V A

    “…The atomic structure and the electronic spectrum of a-SiNx:H films, which are grown by plasmachemical deposition with varied ammonia and monosilane flow rates,…”
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  12. 12

    Atomic Structure and Optical Properties of Plasma Enhanced Chemical Vapor Deposited SiCOH Low-k Dielectric Film by Kruchinin, V. N., Volodin, V. A., Rykhlitskii, S. V., Gritsenko, V. A., Posvirin, I. P., Shi, Xiaoping, Baklanov, M. R.

    Published in Optics and spectroscopy (01-06-2021)
    “…The SiCOH low- k dielectric film was grown on Si substrate using plasma-enhanced chemical vapor deposition method. Atomic structure and optical properties of…”
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  13. 13

    Dispersion of the refractive index in high-k dielectrics by Shvets, V. A., Kruchinin, V. N., Gritsenko, V. A.

    Published in Optics and spectroscopy (01-11-2017)
    “…A brief review of the optical properties of oxide materials that are used at present as dielectrics in modern microelectronics is presented. Using spectral…”
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  14. 14

    Microstructural and optical properties of ZrON/Si thin films by Atuchin, V.V., Kruchinin, V.N., Hoong Wong, Yew, Yew Cheong, Kuan

    Published in Materials letters (15-08-2013)
    “…ZrON/Si(100) layer structure formation has been produced by oxidation/nitridation of sputtered Zr metal in N2O/Ar ambient at 500–900°C. Micromorphology and…”
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  15. 15

    Optical Properties of (ZrO2)1 – x(Y2O3)х (х = 0–0.037) Crystals Grown by Directional Crystallization of the Melt by Perevalov, T. V., Kruchinin, V. N., Rykhlitskii, S. V., Gritsenko, V. A., Eliseev, A. P., Lomonova, E. E.

    Published in Optics and spectroscopy (01-12-2020)
    “…The luminescent and optical properties of materials based on zirconium(IV) oxide grown by crystallization of ZrO 2 melts with 0, 2.0, 2.5, 2.8, and 3.7 mol %…”
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  16. 16

    Charge Transport in Nonstoichiometric SiOx Obtained by Treatment of Thermal SiO2 in Hydrogen Plasma of Electronic-Cyclotron Resonance by Iskhakzay, R. M. Kh, Kruchinin, V. N., Aliev, V. Sh, Gritsenko, V. A., Dementieva, E. V., Zamoryanskaya, M. V.

    Published in Russian microelectronics (2022)
    “…Currently, a new generation of high-speed, information-intensive resistive memory based on nonstoichiometric dielectrics is being developed. The electron…”
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  17. 17

    Nuclear Magnetic Resonance and Infrared Spectroscopy Examination of Blood for Diagnosis of the Diffuse Hepatopathy State by Kruchinina, M. V., Kruchinin, V. N., Shuvalov, G. V., Minin, I. V., Minin, O. V.

    Published in Optics and spectroscopy (01-06-2020)
    “…67 middle-aged (48 ± 1 years) patients with diffuse liver disease of various origins have been examined. It has been established that an increase in the degree…”
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  18. 18

    Optical Properties of Thin Films of Zinc Phthalocyanines Determined by Spectroscopic Ellipsometry by Kruchinin, V. N., Klyamer, D. D., Spesivtsev, E. V., Rykhlitskii, S. V., Basova, T. V.

    Published in Optics and spectroscopy (01-12-2018)
    “…The optical properties of thin films based on unsubstituted and tetrafluoro-substituted zinc phthalocyanines synthesized by physical vapor deposition are…”
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  19. 19

    Optical Properties of the SiOx (x < 2) Thin Films Obtained by Hydrogen Plasma Processing of Thermal Silicon Dioxide by Kruchinin, V. N., Perevalov, T. V., Aliev, V. Sh, Iskhakzai, R. M. Kh, Spesivtsev, E. V., Gritsenko, V. A., Pustovarov, V. A.

    Published in Optics and spectroscopy (01-10-2020)
    “…The optical properties and composition of thermal silicon oxide thin films processed in a hydrogen electron cyclotron resonance plasma have been studied by…”
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