Search Results - "Krivec, Stefan"
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Acquisition of artifact free alkali metal distributions in SiO2 by ToF‐SIMS Cs+ depth profiling at low temperatures
Published in Surface and interface analysis (01-08-2021)“…Artifact‐free depth profiles of alkali ions in SiO2 were obtained using a time‐of‐flight secondary ion mass spectrometer (ToF‐SIMS) equipped with a Cs+ beam as…”
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Acquisition of artifact free alkali metal distributions in SiO 2 by ToF‐SIMS Cs + depth profiling at low temperatures
Published in Surface and interface analysis (01-08-2021)“…Artifact‐free depth profiles of alkali ions in SiO 2 were obtained using a time‐of‐flight secondary ion mass spectrometer (ToF‐SIMS) equipped with a Cs + beam…”
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Large O2 Cluster Ions as Sputter Beam for ToF-SIMS Depth Profiling of Alkali Metals in Thin SiO2 Films
Published in Analytical chemistry (Washington) (21-02-2017)“…A sputter beam, consisting of large O2 clusters, was used to record depth profiles of alkali metal ions (Me+) within thin SiO2 layers. The O2 gas cluster ion…”
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Large O^sub 2^ Cluster Ions as Sputter Beam for ToF-SIMS Depth Profiling of Alkali Metals in Thin SiO^sub 2^ Films
Published in Analytical chemistry (Washington) (21-02-2017)“…A sputter beam, consisting of large O2 clusters, was used to record depth profiles of alkali metal ions (Me+) within thin SiO2 layers. The O2 gas cluster ion…”
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Large O 2 Cluster Ions as Sputter Beam for ToF-SIMS Depth Profiling of Alkali Metals in Thin SiO 2 Films
Published in Analytical chemistry (Washington) (21-02-2017)“…A sputter beam, consisting of large O clusters, was used to record depth profiles of alkali metal ions (Me ) within thin SiO layers. The O gas cluster ion beam…”
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Large O sub( 2) Cluster Ions as Sputter Beam for ToF-SIMS Depth Profiling of Alkali Metals in Thin SiO sub( 2) Films
Published in Analytical chemistry (Washington) (01-02-2017)“…A sputter beam, consisting of large O2 clusters, was used to record depth profiles of alkali metal ions (Me+) within thin SiO2 layers. The O2 gas cluster ion…”
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Digital holographic reflectometry
Published in Optics express (15-02-2010)“…Digital holographic microscopy (DHM) is an interferometric technique that allows real-time imaging of the entire complex optical wavefront (amplitude and…”
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On the temperature dependence of Na migration in thin SiO 2 films during ToF-SIMS O 2 + depth profiling
Published in Applied surface science (15-10-2010)“…The detection of Na in insulating samples by means of time of flight-secondary ion mass spectrometry (ToF-SIMS) depth profiling has always been a challenge. In…”
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The effect of bias-temperature stress on Na+ incorporation into thin insulating films
Published in Analytical and bioanalytical chemistry (01-05-2011)“…The action of Na + incorporation into thin insulating films and transport therein under influence of a bias voltage and temperature (BT stress) is the subject…”
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On the temperature dependence of Na migration in thin SiO2 films during ToF-SIMS O2+ depth profiling
Published in Applied surface science (01-10-2010)Get full text
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On the temperature dependence of Na migration in thin Si02 films during ToF-SIMS O2+ depth profiling
Published in Applied surface science (2010)Get full text
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Erratum to: The effect of bias-temperature stress on Na+ incorporation into thin insulating films
Published in Analytical and bioanalytical chemistry (01-07-2011)Get full text
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Erratum to: The effect of bias-temperature stress on [Na.sup.+] incorporation into thin insulating films
Published in Analytical and bioanalytical chemistry (01-07-2011)Get full text
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The effect of bias-temperature stress on N[a.sup.+] incorporation into thin insulating films
Published in Analytical and bioanalytical chemistry (01-05-2011)“…The action of N[a.sup.+] incorporation into thin insulating films and transport therein under influence of a bias voltage and temperature (BT stress) is the…”
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Silica-Based, Organically Modified Host Material for Waveguide Structuring by Two-Photon-Induced Photopolymerization
Published in Advanced functional materials (09-03-2010)“…The three‐dimensional fabrication of optical waveguides has gained increasing interest in recent years to establish interconnections between electrical…”
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