Search Results - "Kreiser, U."

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  1. 1

    Challenges and current status in 300 mm rapid thermal processing by Glück, M, Lerch, W, Löffelmacher, D, Hauf, M, Kreiser, U

    Published in Microelectronic engineering (01-07-1999)
    “…Rapid Thermal Processing (RTP) will be indispensable to meet the process requirements of future device and integrated circuit (IC) generations. The paper…”
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    Journal Article
  2. 2

    Transient thermal behavior in a new RTP chamber by Tillmann, A., Kreiser, U., Munzinger, P., Frigge, S., Buschbaum, S., Schmid, P., Loeffelmacher, D., Merkwitz, M., Theilig, T.

    Published in Journal of electronic materials (01-12-1998)
    “…The transient thermal behavior of 200 and 300 mm wafers in a new rapid thermal processing (RTP) chamber is investigated. The AST3000 is a new RTP tool to meet…”
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    Journal Article