Search Results - "Kräußlich, J."

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    Growth and defect structure of seeded solution grown Sc-substituted barium hexaferrite crystals using different seed orientation by Dubs, C., Kräußlich, J., Görnert, P.

    Published in Journal of crystal growth (01-03-2011)
    “…Large Sc-substituted barium hexaferrite crystals were grown by submerged-seeded solution growth (SSSG) and top-seeded solution growth (TSSG) techniques using…”
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    Journal Article Conference Proceeding
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    Hexagonal AlN films grown on nominal and off-axis Si(0 0 1) substrates by Lebedev, V., Jinschek, J., Kräußlich, J., Kaiser, U., Schröter, B., Richter, W.

    Published in Journal of crystal growth (01-09-2001)
    “…Nucleation and growth of wurtzite AlN layers on nominal and off-axis Si(0 0 1) substrates by plasma-assisted molecular beam epitaxy is reported. The nucleation…”
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    Journal Article Conference Proceeding
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    Hetero-epitaxial growth of Cu(In,Ga)S 2 on Si substrates by Metzner, H, Reislöhner, U, Cieslak, J, Witthuhn, W, Hahn, T, Kräußlich, J

    Published in Thin solid films (01-02-2002)
    “…On the way to perfectly lattice-matched Cu(In,Ga)S 2, we present the first CuGaS 2 films epitaxially grown on Si substrates and compare their structural…”
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    Journal Article
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    Epitaxial Cu(In,Ga)S 2 thin film solar cells by Hahn, Th, Metzner, H., Cieslak, J., Eberhardt, J., Reislöhner, U., Kräußlich, J., Wunderlich, F., Siebentritt, S., Witthuhn, W.

    “…Epitaxial layers of the quaternary compound Cu(In,Ga)S 2 and the ternary compound CuInS 2 were grown on Si(111) substrates via Molecular Beam Epitaxy. The…”
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    Journal Article
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    Epitaxial growth of CuGaS2 on Si(111) by Metzner, H., Hahn, Th, Cieslak, J., Grossner, U., Reislöhner, U., Witthuhn, W., Goldhahn, R., Eberhardt, J., Gobsch, G., Kräußlich, J.

    Published in Applied physics letters (01-07-2002)
    “…We demonstrate the direct heteroepitaxial growth of the ternary semiconductor CuGaS2 on Si(111) substrates by means of molecular beam epitaxy. X-ray…”
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    Journal Article
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    MBE-growth of heteropolytypic low-dimensional structures of SiC by Fissel, A, Kaiser, U, Schröter, B, Kräußlich, J, Richter, W

    Published in Thin solid films (22-12-2000)
    “…The controlled growth of SiC heteropolytypic structures consisting of hexagonal (α-) and cubic (3C-) polytypes has been performed by solid-source molecular…”
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    Journal Article Conference Proceeding
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    Si/Ge-nanocrystals on SiC(0001) by Heß, G, Bauer, A, Kräußlich, J, Fissel, A, Schröter, B, Richter, W, Schell, N, Matz, W, Goetz, K

    Published in Thin solid films (22-12-2000)
    “…The growth and structure of Si- and Ge-nanocrystals was investigated using high resolution X-ray diffraction (HRXRD) and atomic force microscopy (AFM)…”
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    Journal Article Conference Proceeding
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    Characterisation of interfacial properties in sputtered Co/Cu multilayers: X-ray reflectometry compared with TEM and AFM by Langer, J, Kräußlich, J, Mattheis, R, Senz, St, Hesse, D

    “…Combining localised and global structural information we suggest that differences in the magnetoresistive effect in the first maximum of antiferromagnetic…”
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    Journal Article Conference Proceeding
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    Structural and optical properties of epitaxial CuGaS2 films on Si substrates by Metzner, H., Cieslak, J., Grossner, U., Hahn, Th, Kaiser, U., Kräußlich, J., Reislöhner, U., Witthuhn, W., Goldhahn, R., Eberhardt, J.

    Published in Thin solid films (01-05-2003)
    “…Epitaxial thin films of the wide-band-gap chalcopyrite semiconductor CuGaS2 have directly been grown on single crystalline Si substrates of (111) orientation…”
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    Journal Article
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    Microstructure of epitaxial CuGaS2 on Si(111) by CIESLAK, J, METZNER, H, HAHN, Th, REISLÖHNER, U, KAISER, U, KRÄUSSLICH, J, WITTHUHN, W

    “…CuGaS2 has been grown epitaxially on Si(111) substrates by three-source molecular beam epitaxy. The structural properties of these layers have been…”
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    Conference Proceeding Journal Article
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    Structural properties of MBE grown Cu(In,Ga)S 2 layers on Si by Metzner, H., Hahn, Th, Cieslak, J., Eberhardt, J., Müller, M., Reislöhner, U., Kaiser, U., Chuvilin, A., Kräußlich, J., Witthuhn, W.

    “…The epitaxial growth of the quaternary CuIn (1− x) Ga x S 2 system with 0≤ x≤1 on silicon substrates is investigated. Using molecular beam epitaxy, the layers…”
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    Journal Article
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    Growth of atomically smooth AlN films with a 5:4 coincidence interface on Si(111) by MBE by Schenk, H.P.D., Kaiser, U., Kipshidze, G.D., Fissel, A., Kräußlich, J., Hobert, H., Schulze, J., Richter, Wo

    “…Epitaxial aluminum nitride AlN(0001) thin films have been grown by plasma-assisted molecular beam epitaxy (PA-MBE) on Si(111). The influence of the composition…”
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    Journal Article
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    Structural properties of MBE grown Cu(In, Ga)S2 layers on Si by METZNER, H, HAHN, Th, CIESLAK, J, EBERHARDT, J, MÜLLER, M, REISLÖHNER, U, KAISER, U, CHUVILIN, A, KRÄUSSLICH, J, WITTHUHN, W

    “…The epitaxial growth of the quaternary CuIn(1-x)GaxS2 system with 0 less than or equal to x less than or equal to 1 on silicon substrates is investigated…”
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    Conference Proceeding Journal Article
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    X-ray investigations of MBE-grown heteroepitaxial SiC layers on 6H–SiC substrates by Bauer, A, Kräusslich, J, Köcher, B, Goetz, K, Fissel, A, Richter, W

    “…3C–SiC thin films have been investigated by means of high resolution X-ray diffraction techniques ( ω/2Θ-scan, ω-scan) and X-ray topography. The SiC films were…”
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    Journal Article Conference Proceeding
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    Epitaxial growth of SiC-heterostructures on α-SiC(0001) by solid-source MBE by Fissel, A., Kaiser, U., Kräußlich, J., Pfennighaus, K., Schröter, B., Schulz, J., Richter, W.

    “…Epitaxial growth of SiC on α-SiC(0001) has been performed by means of solid-source molecular beam epitaxy (MBE). Low temperature ( T<1200°C) deposition on…”
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    Journal Article Conference Proceeding
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    Structure refinement of the silicon carbide polytypes 4H and 6H: unambiguous determination of the refinement parameters by Bauer, A., Reischauer, Ph, Kräusslich, J., Schell, N., Matz, W., Goetz, K.

    “…The atomic positions of the silicon carbide (SiC) polytypes 6 and 4 differ slightly from an ideal tetrahedron. These small deviations can be investigated by…”
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    Journal Article
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