Search Results - "Kozole, Joseph"
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1
Complement membrane attack complex is an immunometabolic regulator of NLRP3 activation and IL-18 secretion in human macrophages
Published in Frontiers in immunology (27-09-2022)“…The complement system is an ancient and critical part of innate immunity. Recent studies have highlighted novel roles of complement beyond lysis of invading…”
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Journal Article -
2
Direct comparison of Au3+ and C60+ cluster projectiles in SIMS molecular depth profiling
Published in Journal of the American Society for Mass Spectrometry (01-03-2007)“…The sputtering properties of two representative cluster ion beams in secondary ion mass spectrometry (SIMS), C^sub 60^^sup +^ and Au^sub 3^^sup +^, have been…”
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Journal Article -
3
Sputtering Yields for C60 and Au3 Bombardment of Water Ice as a Function of Incident Kinetic Energy
Published in Analytical chemistry (Washington) (15-06-2007)“…The total sputtering yields for water ice due to kiloelectronvolt cluster bombardment have been measured and compared to the predictions made by the mesoscale…”
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Journal Article -
4
Energy Deposition during Molecular Depth Profiling Experiments with Cluster Ion Beams
Published in Analytical chemistry (Washington) (15-07-2008)“…The role of the location of energy deposition during cluster ion bombardment on the quality of molecular depth profiling was examined by varying the incident…”
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Journal Article -
5
Gas phase ion chemistry of an ion mobility spectrometry based explosive trace detector elucidated by tandem mass spectrometry
Published in Talanta (Oxford) (01-08-2015)“…The gas phase ion chemistry for an ion mobility spectrometer (IMS) based explosive detector has been elucidated using tandem mass spectrometry. The IMS system,…”
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Journal Article -
6
Controlling energy deposition during the C 60 + bombardment of silicon: The effect of incident angle geometry
Published in Applied surface science (15-12-2008)“…The profile of the energy deposition footprint is controlled during the C 60 + erosion of Si surfaces by varying the incident energy and/or incident angle…”
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Journal Article -
7
C 60 Secondary Ion Mass Spectrometry with a Hybrid-Quadrupole Orthogonal Time-of-Flight Mass Spectrometer
Published in Analytical chemistry (Washington) (01-11-2008)Get full text
Journal Article -
8
Characterization of TATP gas phase product ion chemistry via isotope labeling experiments using ion mobility spectrometry interfaced with a triple quadrupole mass spectrometer
Published in Talanta (Oxford) (01-09-2014)“…Identification of the fragment ion species associated with the ion reaction mechanism of triacetone triperoxide (TATP), a homemade peroxide-based explosive, is…”
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9
Acoustic Mist Ionization-Mass Spectrometry: A Comparison to Conventional High-Throughput Screening and Compound Profiling Platforms
Published in Analytical chemistry (Washington) (20-10-2020)“…Drug discovery usually begins with a high-throughput screen (HTS) of thousands to millions of molecules to identify starting points for medicinal chemistry…”
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Journal Article -
10
The effect of incident angle on the C 60 + bombardment of molecular solids
Published in Applied surface science (15-12-2008)“…The effect of incident angle on the quality of SIMS molecular depth profiling using C 60 + was investigated. Cholesterol films of ∼300 nm thickness on Si were…”
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Journal Article -
11
C60 Secondary Ion Mass Spectrometry with a Hybrid-Quadrupole Orthogonal Time-of-Flight Mass Spectrometer
Published in Analytical chemistry (Washington) (01-11-2008)“…A hybrid quadrupole orthogonal time-of-flight mass spectrometer optimized for matrix-assisted laser desorption ionization (MALDI) and electrospray ionization…”
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Journal Article -
12
Controlling energy deposition during the C60+ bombardment of silicon: The effect of incident angle geometry
Published in Applied surface science (15-12-2008)“…The profile of the energy deposition footprint is controlled during the C60+ erosion of Si surfaces by varying the incident energy and/or incident angle…”
Get full text
Journal Article -
13
Direct Comparison of Au 3 + and C 60 + Cluster Projectiles in SIMS Molecular Depth Profiling
Published in Journal of the American Society for Mass Spectrometry (01-03-2007)“…The sputtering properties of two representative cluster ion beams in secondary ion mass spectrometry (SIMS), C 60 + and Au 3 +, have been directly compared…”
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Journal Article -
14
Sputtering Yields for C 60 and Au 3 Bombardment of Water Ice as a Function of Incident Kinetic Energy
Published in Analytical chemistry (Washington) (15-06-2007)Get full text
Journal Article -
15
Characterizing the gas phase ion chemistry of an ion trap mobility spectrometry based explosive trace detector using a tandem mass spectrometer
Published in Talanta (Oxford) (15-09-2012)“…A commercial-off-the-shelf (COTS) ion trap mobility spectrometry (ITMS) based explosive trace detector (ETD) has been interfaced to a triple quadrupole mass…”
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Journal Article -
16
Interfacing an Ion Mobility Spectrometry Based Explosive Trace Detector to a Triple Quadrupole Mass Spectrometer
Published in Analytical chemistry (Washington) (15-11-2011)“…Hardware from a commercial-off-the-shelf (COTS) ion mobility spectrometry (IMS) based explosive trace detector (ETD) has been interfaced to an AB/SCIEX API…”
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Journal Article -
17
Improvements in SIMS continue Is the end in sight?
Published in Applied surface science (30-07-2006)Get full text
Conference Proceeding -
18
Fundamental studies of the cluster ion bombardment of water ice
Published in Applied surface science (30-07-2006)“…The fundamental sputtering properties of water ice are of interest for molecular depth profiling of biological samples in their native environment. We report…”
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Journal Article Conference Proceeding -
19
The effect of incident angle on the C(60) bombardment of molecular solids
Published in Applied surface science (15-12-2008)“…The effect of incident angle on the quality of SIMS molecular depth profiling using C(60) (+) was investigated. Cholesterol films of ~300 nm thickness on Si…”
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Journal Article -
20
The effect of incident angle on the C60+ bombardment of molecular solids
Published in Applied surface science (15-12-2008)“…The effect of incident angle on the quality of SIMS molecular depth profiling using C60+ was investigated. Cholesterol films of 300 nm thickness on Si were…”
Get full text
Journal Article