Search Results - "Kozole, Joseph"

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    Direct comparison of Au3+ and C60+ cluster projectiles in SIMS molecular depth profiling by Cheng, Juan, Kozole, Joseph, Hengstebeck, Robert, Winograd, Nicholas

    “…The sputtering properties of two representative cluster ion beams in secondary ion mass spectrometry (SIMS), C^sub 60^^sup +^ and Au^sub 3^^sup +^, have been…”
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    Journal Article
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    Sputtering Yields for C60 and Au3 Bombardment of Water Ice as a Function of Incident Kinetic Energy by Russo, Michael F, Szakal, Christopher, Kozole, Joseph, Winograd, Nicholas, Garrison, Barbara J

    Published in Analytical chemistry (Washington) (15-06-2007)
    “…The total sputtering yields for water ice due to kiloelectronvolt cluster bombardment have been measured and compared to the predictions made by the mesoscale…”
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    Journal Article
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    Energy Deposition during Molecular Depth Profiling Experiments with Cluster Ion Beams by Kozole, Joseph, Wucher, Andreas, Winograd, Nicholas

    Published in Analytical chemistry (Washington) (15-07-2008)
    “…The role of the location of energy deposition during cluster ion bombardment on the quality of molecular depth profiling was examined by varying the incident…”
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    Journal Article
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    Gas phase ion chemistry of an ion mobility spectrometry based explosive trace detector elucidated by tandem mass spectrometry by Kozole, Joseph, Levine, Lauren A., Tomlinson-Phillips, Jill, Stairs, Jason R.

    Published in Talanta (Oxford) (01-08-2015)
    “…The gas phase ion chemistry for an ion mobility spectrometer (IMS) based explosive detector has been elucidated using tandem mass spectrometry. The IMS system,…”
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    Journal Article
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    Controlling energy deposition during the C 60 + bombardment of silicon: The effect of incident angle geometry by Kozole, Joseph, Winograd, Nicholas

    Published in Applied surface science (15-12-2008)
    “…The profile of the energy deposition footprint is controlled during the C 60 + erosion of Si surfaces by varying the incident energy and/or incident angle…”
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    Journal Article
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    Characterization of TATP gas phase product ion chemistry via isotope labeling experiments using ion mobility spectrometry interfaced with a triple quadrupole mass spectrometer by Tomlinson-Phillips, Jill, Wooten, Alfred, Kozole, Joseph, Deline, James, Beresford, Pamela, Stairs, Jason

    Published in Talanta (Oxford) (01-09-2014)
    “…Identification of the fragment ion species associated with the ion reaction mechanism of triacetone triperoxide (TATP), a homemade peroxide-based explosive, is…”
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    Journal Article
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    Acoustic Mist Ionization-Mass Spectrometry: A Comparison to Conventional High-Throughput Screening and Compound Profiling Platforms by Belov, Arseniy M, Kozole, Joseph, Bean, Mark F, Machutta, Carl A, Zhang, Guofeng, Gao, Enoch N, Ghislain, Luke, Datwani, Sammy S, Leveridge, Melanie, Annan, Roland S

    Published in Analytical chemistry (Washington) (20-10-2020)
    “…Drug discovery usually begins with a high-throughput screen (HTS) of thousands to millions of molecules to identify starting points for medicinal chemistry…”
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    Journal Article
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    The effect of incident angle on the C 60 + bombardment of molecular solids by Kozole, Joseph, Willingham, David, Winograd, Nicholas

    Published in Applied surface science (15-12-2008)
    “…The effect of incident angle on the quality of SIMS molecular depth profiling using C 60 + was investigated. Cholesterol films of ∼300 nm thickness on Si were…”
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    Journal Article
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    C60 Secondary Ion Mass Spectrometry with a Hybrid-Quadrupole Orthogonal Time-of-Flight Mass Spectrometer by Carado, Anthony, Passarelli, M. K, Kozole, Joseph, Wingate, J. E, Winograd, Nicholas, Loboda, A. V

    Published in Analytical chemistry (Washington) (01-11-2008)
    “…A hybrid quadrupole orthogonal time-of-flight mass spectrometer optimized for matrix-assisted laser desorption ionization (MALDI) and electrospray ionization…”
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    Journal Article
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    Controlling energy deposition during the C60+ bombardment of silicon: The effect of incident angle geometry by Kozole, Joseph, Winograd, Nicholas

    Published in Applied surface science (15-12-2008)
    “…The profile of the energy deposition footprint is controlled during the C60+ erosion of Si surfaces by varying the incident energy and/or incident angle…”
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    Journal Article
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    Direct Comparison of Au 3 + and C 60 + Cluster Projectiles in SIMS Molecular Depth Profiling by Cheng, Juan, Kozole, Joseph, Hengstebeck, Robert, Winograd, Nicholas

    “…The sputtering properties of two representative cluster ion beams in secondary ion mass spectrometry (SIMS), C 60 + and Au 3 +, have been directly compared…”
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    Journal Article
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    Characterizing the gas phase ion chemistry of an ion trap mobility spectrometry based explosive trace detector using a tandem mass spectrometer by Kozole, Joseph, Tomlinson-Phillips, Jill, Stairs, Jason R., Harper, Jason D., Lukow, Stefan R., Lareau, Richard T., Boudries, Hacene, Lai, Hanh, Brauer, Carolyn S.

    Published in Talanta (Oxford) (15-09-2012)
    “…A commercial-off-the-shelf (COTS) ion trap mobility spectrometry (ITMS) based explosive trace detector (ETD) has been interfaced to a triple quadrupole mass…”
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    Journal Article
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    Interfacing an Ion Mobility Spectrometry Based Explosive Trace Detector to a Triple Quadrupole Mass Spectrometer by Kozole, Joseph, Stairs, Jason R, Cho, Inho, Harper, Jason D, Lukow, Stefan R, Lareau, Richard T, DeBono, Reno, Kuja, Frank

    Published in Analytical chemistry (Washington) (15-11-2011)
    “…Hardware from a commercial-off-the-shelf (COTS) ion mobility spectrometry (IMS) based explosive trace detector (ETD) has been interfaced to an AB/SCIEX API…”
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    Journal Article
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    Fundamental studies of the cluster ion bombardment of water ice by Szakal, Christopher, Kozole, Joseph, Winograd, Nicholas

    Published in Applied surface science (30-07-2006)
    “…The fundamental sputtering properties of water ice are of interest for molecular depth profiling of biological samples in their native environment. We report…”
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    Journal Article Conference Proceeding
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    The effect of incident angle on the C(60) bombardment of molecular solids by Kozole, Joseph, Willingham, David, Winograd, Nicholas

    Published in Applied surface science (15-12-2008)
    “…The effect of incident angle on the quality of SIMS molecular depth profiling using C(60) (+) was investigated. Cholesterol films of ~300 nm thickness on Si…”
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    Journal Article
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    The effect of incident angle on the C60+ bombardment of molecular solids by Kozole, Joseph, Willingham, David, Winograd, Nicholas

    Published in Applied surface science (15-12-2008)
    “…The effect of incident angle on the quality of SIMS molecular depth profiling using C60+ was investigated. Cholesterol films of 300 nm thickness on Si were…”
    Get full text
    Journal Article