Search Results - "Kouda, M"

Refine Results
  1. 1
  2. 2

    Enhancement of Extraordinary Size Effect on CaRuO3 Ultrathin Films by Sakoda, M., Kouda, M., Shinya, K., Shimoda, S.

    Published in Advanced electronic materials (01-06-2023)
    “…In a previous report, 25 Å periodic metal–insulator transitions dependent on the thickness of CaRuO3 ultrathin films were discovered. Compared to the…”
    Get full text
    Journal Article
  3. 3

    Effect of ursodeoxycholic acid supplementation on growth, carcass characteristics, and meat quality of Wagyu heifers (Japanese Black cattle) by Irie, M, Kouda, M, Matono, H

    Published in Journal of animal science (01-12-2011)
    “…Ursodeoxycholic acid (UDCA), which is used as a hepatic and digestive medicine in humans and domestic animals, was added to the diet of Wagyu beef cattle to…”
    Get full text
    Journal Article
  4. 4

    The effect of Assertive Community Treatment in Japan by Ito, J., Oshima, I., Nishio, M., Sono, T., Suzuki, Y., Horiuchi, K., Niekawa, N., Ogawa, M., Setoya, Y., Hisanaga, F., Kouda, M., Tsukada, K.

    Published in Acta psychiatrica Scandinavica (01-05-2011)
    “…Ito J, Oshima I, Nishio M, Sono T, Suzuki Y, Horiuchi K, Niekawa N, Ogawa M, Setoya Y, Hisanaga F, Kouda M, Tsukada K. The effect of Assertive Community…”
    Get full text
    Journal Article
  5. 5

    Grain boundary assisted degradation and breakdown study in cerium oxide gate dielectric using scanning tunneling microscopy by Shubhakar, K., Pey, K. L., Kushvaha, S. S., O'Shea, S. J., Raghavan, N., Bosman, M., Kouda, M., Kakushima, K., Iwai, H.

    Published in Applied physics letters (14-02-2011)
    “…The presence of grain boundaries (GBs) in polycrystalline high- κ (HK) gate dielectric materials affects the electrical performance and reliability of advanced…”
    Get full text
    Journal Article
  6. 6

    Valence number transition and silicate formation of cerium oxide films on Si(100) by Mamatrishat, M., Kouda, M., Kakushima, K., Nohira, H., Ahmet, P., Kataoka, Y., Nishiyama, A., Tsutsui, K., Sugii, N., Natori, K., Hattori, T., Iwai, H.

    Published in Vacuum (27-04-2012)
    “…Interface reactions of a Ce-oxide layer with Si(100) wafers have been characterized by X-ray photoelectron spectroscopy. The ratio of Ce atoms in Ce3+ states…”
    Get full text
    Journal Article
  7. 7

    High-resolution Schottky CdTe diode detector by Takahashi, T., Mitani, T., Kobayashi, Y., Kouda, M., Sato, G., Watanabe, S., Nakazawa, K., Okada, Y., Funaki, M., Ohno, R., Mori, K.

    Published in IEEE transactions on nuclear science (01-06-2002)
    “…We describe recent progress on the use of Schottky CdTe diode detectors for spectrometry. The low leakage current of the CdTe diode allows us to apply a much…”
    Get full text
    Journal Article
  8. 8

    Selection of rare earth silicates for highly scaled gate dielectrics by Kakushima, K., Okamoto, K., Koyanagi, T., Kouda, M., Tachi, K., Kawanago, T., Song, J., Ahmet, P., Tsutsui, K., Sugii, N., Hattori, T., Iwai, H.

    Published in Microelectronic engineering (01-10-2010)
    “…An aggressive equivalent oxide thickness (EOT) scaling with high-k gate dielectrics has been demonstrated by ultra-thin La 2O 3 gate dielectric with a proper…”
    Get full text
    Journal Article
  9. 9

    High-resolution CdTe detector and applications to imaging devices by Takahashi, T., Watanabe, S., Kouda, M., Sato, G., Okada, Y., Kubo, S., Kuroda, Y., Onishi, M., Ohno, R.

    Published in IEEE transactions on nuclear science (01-06-2001)
    “…Using a high quality Cadmium Telluride (CdTe) wafer, we formed a Schottky junction and operated the detector as a diode (CdTe diode). The low leakage current…”
    Get full text
    Journal Article
  10. 10
  11. 11

    Characterization of CdTe/CdZnTe detectors by Sato, G., Takahashi, T., Sugiho, M., Kouda, M., Mitani, T., Nakazawa, K., Okada, Y., Watanabe, S.

    Published in IEEE transactions on nuclear science (01-06-2002)
    “…In order to characterize CdTe/CdZnTe detectors in a planar configuration, we have developed a new method to extract /spl mu//spl tau/ products. In this method,…”
    Get full text
    Journal Article
  12. 12

    Activation properties of Schottky CdTe diodes irradiated by 150 MeV protons by Murakami, M.M., Kobayashi, Y., Kokubun, M., Takahashi, I., Okada, Y., Kawaharada, M., Nakazawa, K., Watanabe, S., Sato, G., Kouda, M., Mitani, T., Takahashi, T., Suzuki, M., Tashiro, M., Kawasoe, S., Nomachi, M., Makishima, K.

    Published in IEEE transactions on nuclear science (01-08-2003)
    “…Cadmium Telluride (CdTe), with its high photon absorption efficiency, has been regarded as a promising semiconductor material for the next generation X//spl…”
    Get full text
    Journal Article
  13. 13

    Direct contact of high-k/Si gate stack for EOT below 0.7 nm using LaCe-silicate Layer with Vfb controllability by Kakushima, K, Koyanagi, T, Kitayama, D, Kouda, M, Song, J, Kawanago, T, Mamatrishat, M, Tachi, K, Bera, M K, Ahmet, P, Nohira, H, Tsutsui, K, Nishiyama, A, Sugii, N, Natori, K, Hattori, T, Yamada, K, Iwai, H

    Published in 2010 Symposium on VLSI Technology (01-06-2010)
    “…A direct high-k/Si gate stack has been proposed for gate oxide scaling. With LaCe-silicate, an EOT of 0.64 nm with an average dielectric constant (k av ) of…”
    Get full text
    Conference Proceeding
  14. 14

    Nanoscale electrical and physical study of polycrystalline high-κ dielectrics and proposed reliability enhancement techniques by Shubhakar, K, Pey, K L, Kushvaha, S S, Bosman, M, O'Shea, S J, Raghavan, N, Kouda, M, Kakushima, K, Wang, Z R, Yu, H Y, Iwai, H

    “…Grain boundaries (GBs) in polycrystalline high-κ (HK) dielectric materials affect the electrical performance and reliability of advanced HK-based…”
    Get full text
    Conference Proceeding
  15. 15

    Large-area CdTe diode detector for space application by Nakazawa, K., Takahashi, T., Watanabe, S., Sato, G., Kouda, M., Okada, Y., Mitani, T., Kobayashi, Y., Kuroda, Y., Onishi, M., Ohno, R., Kitajima, H.

    “…The current status of Schottky CdTe diode detectors, especially in view of their space application for hard X-ray and gamma-ray astronomy, are reported. For…”
    Get full text
    Journal Article
  16. 16

    Enhancement of Extraordinary Size Effect on CaRuO 3 Ultrathin Films by Sakoda, M., Kouda, M., Shinya, K., Shimoda, S.

    Published in Advanced electronic materials (01-06-2023)
    “…In a previous report, 25 Å periodic metal–insulator transitions dependent on the thickness of CaRuO 3 ultrathin films were discovered. Compared to the…”
    Get full text
    Journal Article
  17. 17

    CdTe stacked detectors for gamma-ray detection by Watanabe, S., Takahashi, T., Okada, Y., Sato, G., Kouda, M., Mitani, T., Kobayashi, Y., Nakazawa, K., Kuroda, Y., Onishi, M.

    Published in IEEE transactions on nuclear science (01-06-2002)
    “…We describe a stacked detector made of thin cadmium telluride (CdTe) diode detectors. By using a thin CdTe device, we can overcome the charge loss problem due…”
    Get full text
    Journal Article
  18. 18
  19. 19

    A counting CdTe pixel detector for hard X-ray and gamma-ray imaging by Fischer, P, Kouda, M, Kruger, H, Lindner, A, Sato, G, Takahashi, T, Watanabe, S, Wermes, N

    Published in IEEE transactions on nuclear science (01-12-2001)
    “…A 0.5-mm-thick Cadmium Telluride (CdTe) semiconductor pixel sensor with 1024 pixels has been bump-bonded onto a two-dimensional (2-D) single photon counting…”
    Get full text
    Journal Article
  20. 20

    A counting CdTe pixel detector for hard X-ray and /spl gamma/-ray imaging by Fischer, P., Kouda, M., Kruger, H., Lindner, A., Sato, G., Takahashi, T., Watanabe, S., Wermes, N.

    Published in IEEE transactions on nuclear science (01-12-2001)
    “…A 0.5-mm-thick cadmium telluride (CdTe) semiconductor pixel sensor with 1024 pixels has been bump-bonded onto a two-dimensional (2-D) single photon counting…”
    Get full text
    Journal Article